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Simulation of Si/SiGe micro-cooler by thermal quadrupoles method

 Y. Ezzahri , S. Dilhaire , Stéphane Grauby , L. D. Patino-Lopez , W. Claeys , et al.
24th International Conference on Thermoelectrics (ICT), Jun 2005, Clemson, SC, United States. pp.241-245, ⟨10.1109/ICT.2005.1519932⟩
Communication dans un congrès hal-01552747v1

Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions

 S. Dilhaire , Stéphane Grauby , W. Claeys
Applied Physics Letters, 2004, 84 (5), pp.822-824. ⟨10.1063/1.1645326⟩
Article dans une revue hal-01551923v1

ElectroStatic Discharge fault localization by laser probing

 Stéphane Grauby , A. Salhi , W. Claeys , D. Trias , S. Dilhaire
Microelectronics Reliability, 2005, Proceedings of the 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2005), 45 (9-11), pp.1482-1486. ⟨10.1016/j.microrel.2005.07.038⟩
Article dans une revue istex hal-01552716v1
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Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy

 M. Muñoz Rojo , Stéphane Grauby , Jean-Michel Rampnoux , O. Caballero-Calero , M. Martin-Gonzalez , et al.
Journal of Applied Physics, 2013, 113 (5), pp.054308 (1-7). ⟨10.1063/1.4790363⟩
Article dans une revue hal-00805572v1

Joule expansion imaging techniques on microlectronic devices

 Stéphane Grauby , Luis-David Patino Lopez , Amine Salhi , Etienne Puyoo , Jean-Michel Rampnoux , et al.
Microelectronics Journal, 2009, 40 (9), pp.1367-1372. ⟨10.1016/j.mejo.2008.04.016⟩
Article dans une revue hal-00670328v1

Laser diode COFD analysis by thermoreflectance microscopy

 S. Dilhaire , Stéphane Grauby , S. Jorez , L. D. P. Lopez , E. Schaub , et al.
Microelectronics Reliability, 2001, 41 (9-10), pp.1597-1601. ⟨10.1016/S0026-2714(01)00196-2⟩
Article dans une revue istex hal-01550687v1

Ultimate-resolution thermal spectroscopy in time domain thermoreflectance (TDTR)

 A. Zenji , Jean-Michel Rampnoux , S. Grauby , S. Dilhaire
Journal of Applied Physics, 2020, 128 (6), pp.065106. ⟨10.1063/5.0015391⟩
Article dans une revue hal-03005610v1
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Joule Expansion Imaging Techniques on Microlectronic Devices

 S. Grauby , L.-D. Patino Lopez, , A. Salhi , E. Puyoo , J.-M. Rampnoux , et al.
THERMINIC 2007, Sep 2007, Budapest, Hungary. pp.174-179
Communication dans un congrès hal-00202556v1
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Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials

 Miguel Muñoz Rojo , Jaime Mart'In , Stéphane Grauby , Theodorian Borca-Tasciuc , Stefan Dilhaire , et al.
Nanoscale, 2014, 6 (14), pp.7858-7865. ⟨10.1039/C4NR00107A⟩
Article dans une revue hal-01025464v1

Dynamical behavior and cut-off frequency of Si/SiGe microcoolers

 Y. Ezzahri , S. Dilhaire , L. D. Patino-Lopez , S. Grauby , W. Claeys , et al.
Superlattices and Microstructures, 2007, 41 (1), pp.7-16. ⟨10.1016/j.spmi.2006.08.006⟩
Article dans une revue istex hal-01553053v1

Nonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring

 Josep Altet , Diego Mateo , Xavier Perpinya , Stéphane Grauby , Stefan Dilhaire , et al.
Review of Scientific Instruments, 2011, 82, pp.094902 (4). ⟨10.1063/1.3633957⟩
Article dans une revue hal-00635099v1

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

 Eduardo Aldrete-Vidrio , Diego Mateo , Josep Altet , M. Amine Salhi , Stéphane Grauby , et al.
Measurement Science and Technology, 2010, 21 (7), pp.075104 (10). ⟨10.1088/0957-0233/21/7/075104⟩
Article dans une revue hal-00609286v1

Time gating imaging through thick silicon substrate: a new step towards backside characterisation

 Jean-Michel Rampnoux , H. Michel , M. A. Salhi , Stéphane Grauby , W. Claeys , et al.
Microelectronics Reliability, 2006, 46 (9-11), pp.1520-1524. ⟨10.1016/j.microrel.2006.07.029⟩
Article dans une revue istex hal-01552888v1

Nanoscale Thermal Transport Studied With Heterodyne Picosecond Thermoreflectance

 S. Dilhaire , Jean-Michel Rampnoux , Stéphane Grauby , G. Pernot , G. Calbris
ASME 2009 Second International Conference on Micro/Nanoscale Heat and Mass Transfer, Dec 2009, Shanghai, China. pp.451-456, ⟨10.1115/MNHMT2009-18338⟩
Communication dans un congrès hal-01554476v1

Study of thermomechanical properties of Si/SiGe superlattices using femtosecond transient thermoreflectance technique

 Y. Ezzahri , S. Dilhaire , Stéphane Grauby , Jean-Michel Rampnoux , W. Claeys , et al.
Applied Physics Letters, 2005, 87 (10), pp.103506 (1-3). ⟨10.1063/1.2009069⟩
Article dans une revue hal-01552727v1
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Nanoscale Block Copolymer Ordering Induced by Visible Interferometric Micropatterning: A Route towards Large Scale Block Copolymer 2D Crystals

 Karim Aissou , Jonah Shaver , Guillaume Fleury , Gilles Pécastaings , Cyril Brochon , et al.
Advanced Materials, 2013, 25 (2), pp.213-217. ⟨10.1002/adma.201203254⟩
Article dans une revue hal-00817443v1

Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis

 S. Dilhaire , Stéphane Grauby , W. Claeys
IEEE Electron Device Letters, 2005, 26 (7), pp.461-463. ⟨10.1109/led.2005.851090⟩
Article dans une revue hal-01552734v1

Application of picosecond ultrasonics to non-destructive analysis in VLSI circuits

 G. Andriamonje , V. Pouget , Y. Ousten , D. Lewis , Y. Danto , et al.
Microelectronics Reliability, 2003, 43 (9-11), pp.1803-1807. ⟨10.1016/s0026-2714(03)00307-x⟩
Article dans une revue istex hal-01550917v1

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods

 S. Dilhaire , A. Salhi , Stéphane Grauby , W. Claeys
Microelectronics Reliability, 2003, 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2003), 43 (9-11), pp.1609-1613. ⟨10.1016/s0026-2714(03)00282-8⟩
Article dans une revue istex hal-01550922v1
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Correction: Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials

 Miguel Muñoz Rojo , Jaime Martín , Stéphane Grauby , Theodorian Borca-Tasciuc , Stefan Dilhaire , et al.
Nanoscale, 2015, 7 (9), pp.4256-4257. ⟨10.1039/C5NR90020D⟩
Article dans une revue hal-01407516v1
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Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction

 Aymen Ben Amor , Doriane Djomani , Mariam Fakhfakh , Stefan Dilhaire , Laetitia Vincent , et al.
Nanotechnology, 2019, 30 (37), pp.375704. ⟨10.1088/1361-6528/ab29a6⟩
Article dans une revue hal-02174973v1

Effect of Nanostructuration on the Thermal Conductivity of Thermoelectric Materials

 Stéphane Grauby , E. Puyoo , M. M. Rojo , M. Martin-Gonzalez , W. Claeys , et al.
19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Sep 2013, Berlin, Germany. pp.73-78, ⟨10.1109/THERMINIC.2013.6675191⟩
Communication dans un congrès hal-01555675v1

Mise en place d'une pédagogie d'apprentissage par problèmes au département GEII de l'IUT Bordeaux

 Hélène Fremont , S. Moutault , I. Bord , B. Caillard , Francois Demontoux , et al.
8ème Colloque sur l'enseignement des Technologies et des Sciences de l'Information et des Systèmes, Mar 2010, Grenoble, France. Papier N° 58
Communication dans un congrès hal-00467949v1

Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging

 Stéphane Grauby , S. Dilhaire , S. Jorez , W. Claeys
IEEE Electron Device Letters, 2005, 26 (2), pp.78-80. ⟨10.1109/led.2004.841468⟩
Article dans une revue hal-01552717v1

Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices

 S. Grauby , A. Salhi , Jean-Michel Rampnoux , Hélène Michel , W. Claeys , et al.
Review of Scientific Instruments, 2007, 78 (7), pp.074902 (1-8). ⟨10.1063/1.2757473⟩
Article dans une revue hal-01553046v1

Cross-plan Si/SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics

 Y. Ezzahri , S. Grauby , S. Dilhaire , Jean-Michel Rampnoux , W. Claeys
Journal of Applied Physics, 2007, 101 (1), pp.7. ⟨10.1063/1.2403236⟩
Article dans une revue hal-01553054v1

Laser Scanning Thermomechanical Imaging of Microelectronic Devices

 S. Grauby , A. Salhi , Jean-Michel Rampnoux , W. Claeys , S. Dilhaire
Thermal Inveatigation of ICs and Systems, 2008. THERMINIC 2008. 14th International Workshop on, Sep 2008, Rome, Italy. pp.183-189, ⟨10.1109/THERMINIC.2008.4669905⟩
Communication dans un congrès hal-01553682v1

Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique

 Stéphane Grauby , S. Dilhaire , S. Jorez , L. D. P. Lopez , Jean-Michel Rampnoux , et al.
Applied optics, 2003, 42 (10), pp.1763-1768. ⟨10.1364/ao.42.001763⟩
Article dans une revue hal-01550902v1

Using temperature as observable of the frequency response of RF CMOS amplifiers

 E. Aldrete-Vidrio , M. A. Salhi , J. Altet , Stéphane Grauby , D. Mateo , et al.
2008 13th European Test Symposium, May 2008, Verbania, Italy. pp.47-52, ⟨10.1109/ets.2008.15⟩
Communication dans un congrès hal-01840908v1
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Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment

 J. Michaud , G. Pedroza , L. Béchou , L.S. How , O. Gilard , et al.
Microelectronics Reliability, 2015, 55 (9-10), pp.1746-1749. ⟨10.1016/j.microrel.2015.06.068⟩
Article dans une revue hal-01256856v1
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