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TESTING OF THE QUALITY OF SOLDER JOINTS THROUGH THE ANALYSIS OF THEIR THERMAL-BEHAVIOR WITH AN INTERFEROMETRIC LASER PROBE

 W. Claeys , V. Quintard , S. Dilhaire , D. Lewis , Y. Danto
Quality and Reliability Engineering International, 1994, 10 (3), pp.237-242
Article dans une revue hal-01549896v1

Laser beam thermography of circuits in the particular case of passivated semiconductors

 V. Quintard , G. Deboy , S. Dilhaire , D. Lewis , T. Phan , et al.
Microelectronic Engineering, 1996, 31 (1-4), pp.291-298. ⟨10.1016/0167-9317(95)00351-7⟩
Article dans une revue istex hal-01549970v1

Simulation of Si/SiGe micro-cooler by thermal quadrupoles method

 Y. Ezzahri , S. Dilhaire , Stéphane Grauby , L. D. Patino-Lopez , W. Claeys , et al.
24th International Conference on Thermoelectrics (ICT), Jun 2005, Clemson, SC, United States. pp.241-245, ⟨10.1109/ICT.2005.1519932⟩
Communication dans un congrès hal-01552747v1

Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions

 S. Dilhaire , Stéphane Grauby , W. Claeys
Applied Physics Letters, 2004, 84 (5), pp.822-824. ⟨10.1063/1.1645326⟩
Article dans une revue hal-01551923v1

High sensitivity and high resolution differential interferometer: Micrometric polariscope for thermomechanical studies in microelectronics

 S. Dilhaire , T. Phan , E. Schaub , W. Claeys
Microelectronics Reliability, 1997, 37 (10-11), pp.1587-1590. ⟨10.1016/S0026-2714(97)00116-9⟩
Article dans une revue istex hal-01550179v1

ElectroStatic Discharge fault localization by laser probing

 Stéphane Grauby , A. Salhi , W. Claeys , D. Trias , S. Dilhaire
Microelectronics Reliability, 2005, Proceedings of the 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2005), 45 (9-11), pp.1482-1486. ⟨10.1016/j.microrel.2005.07.038⟩
Article dans une revue istex hal-01552716v1
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Frequency-Dependent Thermal Conductivity in Time Domain Thermoreflectance Analysis of Thin Films

 Gilles Pernot , Hélène Michel , Bjorn Vermeersch , Peter Burke , Hong Lu , et al.
Material Research Society Spring Meeting 2011, Apr 2011, San Francisco, CA, United States. pp.mrss11-1347-bb07-07, ⟨10.1557/opl.2011.1277⟩
Communication dans un congrès hal-01537850v1

Estimation of the transverse coefficient of thermal expansion on carbon fibers at very high temperature

 Christophe Pradere , J. Batsale , J. Goyheneche , R. Pailler , S. Dilhaire
Inverse Problems in Science and Engineering, 2007, 15 (1), pp.77-89. ⟨10.1080/17415970600574047⟩
Article dans une revue hal-02369743v1

Thermal diffusivity measurements on a single fiber with microscale diameter at very high temperature

 Christophe Pradere , J.M. Goyhénèche , J.C. Batsale , S. Dilhaire , R. Pailler
International Journal of Thermal Sciences, 2006, 45 (5), pp.443-451. ⟨10.1016/j.ijthermalsci.2005.05.010⟩
Article dans une revue istex hal-02369746v1

Thermal coupling in integrated circuits: Application to thermal testing

 J. Altet , A. Rubio , Emmanuel Schaub , S. Dilhaire , W. Claeys
IEEE Journal of Solid-State Circuits, 2001, 36 (1), pp.81-91. ⟨10.1109/4.896232⟩
Article dans une revue hal-01550679v1

Dynamic surface temperature measurements in ICs

 J. Altet , W. Claeys , S. Dilhaire , A. Rubio
Proceedings of the IEEE, 2006, 94 (8), pp.1519-1533. ⟨10.1109/jproc.2006.879793⟩
Article dans une revue hal-01552902v1

Differential thermal testing: An approach to its feasibility

 J. Altet , A. Rubio , W. Claeys , S. Dilhaire , E. Schaub , et al.
Journal of Electronic Testing: : Theory and Applications, 1999, 14 (1-2), pp.57-66. ⟨10.1023/a:1008397205559⟩
Article dans une revue istex hal-01550415v1
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Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy

 M. Muñoz Rojo , Stéphane Grauby , Jean-Michel Rampnoux , O. Caballero-Calero , M. Martin-Gonzalez , et al.
Journal of Applied Physics, 2013, 113 (5), pp.054308 (1-7). ⟨10.1063/1.4790363⟩
Article dans une revue hal-00805572v1

Heterodyne method with an infrared camera for the thermal diffusivity estimation with periodic local heating in a large range of frequencies (25 Hz to upper than 1 kHz)

 Lilian Clerjaud , Christophe Pradère , Stefan Dilhaire , Jean-Christophe Batsale
Quantitative InfraRed Thermography Journal, 2010, 7 (1), pp.115-128. ⟨10.3166/qirt.7.115-128⟩
Article dans une revue hal-00609455v1

Laser probes for the thermal and thermomechanical characterisation of microelectronic devices

 W. Claeys , S. Dilhaire , S. Jorez , L. D. Patino-Lopez
Microelectronics Journal, 2001, 32 (10-11), pp.891-898. ⟨10.1016/S0026-2692(01)00078-7⟩
Article dans une revue istex hal-01550702v1

Estimation of the transverse coefficient of thermal expansion on carbon fibers at very high temperature

 C. Pradere , J. C. Batsale , J. M. Goyheneche , R. Pailler , S. Dilhaire
Symposium on Inverse Problems, Design and Optimization, 2004, Unknown, Unknown Region. pp.77-89, ⟨10.1080/17415970600574047⟩
Communication dans un congrès hal-01551891v1

Thermal diffusivity measurements on a single fiber with microscale diameter at very high temperature

 C. Pradere , J. M. Goyheneche , J. C. Batsale , S. Dilhaire , R. Pailler
International Journal of Thermal Sciences, 2006, 45 (5), pp.443-451. ⟨10.1016/j.ijthermalsci.2005.05.010⟩
Article dans une revue istex hal-01552886v1

Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis

 S. Dilhaire , Stéphane Grauby , W. Claeys
IEEE Electron Device Letters, 2005, 26 (7), pp.461-463. ⟨10.1109/led.2005.851090⟩
Article dans une revue hal-01552734v1

Application of picosecond ultrasonics to non-destructive analysis in VLSI circuits

 G. Andriamonje , V. Pouget , Y. Ousten , D. Lewis , Y. Danto , et al.
Microelectronics Reliability, 2003, 43 (9-11), pp.1803-1807. ⟨10.1016/s0026-2714(03)00307-x⟩
Article dans une revue istex hal-01550917v1

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods

 S. Dilhaire , A. Salhi , Stéphane Grauby , W. Claeys
Microelectronics Reliability, 2003, 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2003), 43 (9-11), pp.1609-1613. ⟨10.1016/s0026-2714(03)00282-8⟩
Article dans une revue istex hal-01550922v1

Determination of passive SiO2-Au microstructure resonant frequencies

 G. Marinier , S. Dilhaire , L. D. P. Lopez , M. Benzohra
14th European Symposium on Raliability of Electron Devices, Failure Physics and Analysis, 2003, Unknown, Unknown Region. pp.1951-1955, ⟨10.1016/s0026-2714(03)00333-0⟩
Communication dans un congrès istex hal-01550874v1

Surface acoustic waves at the vacuum-thermoviscoelastic solid interface

 M. Deschamps , O. Poncelet , S. Dilhaire , W. Claeys
Ultrasonics, 2000, 37 (10), pp.677-680. ⟨10.1016/S0041-624X(00)00017-2⟩
Article dans une revue istex hal-01550428v1

Optical method for the measurement of the thermomechanical behaviour of electronic devices

 S. Dilhaire , S. Jorez , A. Cornet , Emmanuel Schaub , W. Claeys
Microelectronics Reliability, 1999, 39 (6-7), pp.981-985. ⟨10.1016/S0026-2714(99)00134-1⟩
Article dans une revue istex hal-01550431v1

Generation and detection of shear acoustic waves in metal submicrometric films with ultrashort laser pulses

 C. Rossignol , Jean-Michel Rampnoux , M. Perton , Bertrand Audoin , S. Dilhaire
Physical Review Letters, 2005, 94 (16), pp.4. ⟨10.1103/PhysRevLett.94.166106⟩
Article dans une revue hal-01552715v1

Femtosecond laser generation and detection of longitudinal and shear acoustic waves in a sub-micrometric film

 C. Rossignol , H. Meri , M. Perton , Bertrand Audoin , Jean-Michel Rampnoux , et al.
Kaplyanskii, A. and Akimov, A. and Bursian, V. Physica Status Solidi C: Current Topics in Solid State Physics, Vol. 1, No. 11, 1, pp.2745-2748, 2004, Physica Status Solidi C-Current Topics in Solid State Physics, 3-527-40588-7. ⟨10.1002/pssc.200405367⟩
Chapitre d'ouvrage istex hal-01840911v1
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Correction: Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials

 Miguel Muñoz Rojo , Jaime Martín , Stéphane Grauby , Theodorian Borca-Tasciuc , Stefan Dilhaire , et al.
Nanoscale, 2015, 7 (9), pp.4256-4257. ⟨10.1039/C5NR90020D⟩
Article dans une revue hal-01407516v1
Image document

Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction

 Aymen Ben Amor , Doriane Djomani , Mariam Fakhfakh , Stefan Dilhaire , Laetitia Vincent , et al.
Nanotechnology, 2019, 30 (37), pp.375704. ⟨10.1088/1361-6528/ab29a6⟩
Article dans une revue hal-02174973v1

Asynchronous ultrafast pump-probe experiments: Towards high speed ultrafast imaging with ultrahigh spectral resolution

 Allaoua Abbas , Y. Guillet , Jean-Michel Rampnoux , J. Curlier , P. Rigail , et al.
2013 Conference on Lasers and Electro-Optics - International Quantum Electronics Conference, May 2013, Munich, Germany. 2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference CLEO EUROPE/IQEC, 2013, 2013 Conference on and International Quantum Electronics Conference Lasers and Electro-Optics Europe. ⟨10.1109/CLEOE-IQEC.2013.6801107⟩
Poster de conférence hal-01840905v1

Effect of Nanostructuration on the Thermal Conductivity of Thermoelectric Materials

 Stéphane Grauby , E. Puyoo , M. M. Rojo , M. Martin-Gonzalez , W. Claeys , et al.
19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Sep 2013, Berlin, Germany. pp.73-78, ⟨10.1109/THERMINIC.2013.6675191⟩
Communication dans un congrès hal-01555675v1

Sensing temperature in CMOS circuits for thermal testing

 J. Altet , A. Rubio , A. Salhi , J. L. Galvez , Stefan A Dilhaire , et al.
22nd Ieee Vlsi Test Symposium, Proceedings, pp.179-184, 2004, IEEE VLSI Test Symposium, 0-7695-2134-7. ⟨10.1109/vtest.2004.1299241⟩
Chapitre d'ouvrage hal-01840910v1
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