Accéder directement au contenu

Sophie Eliet

7
Documents

Publications

gilles-dambrine
Image document

Near-field scanning millimeter-wave microscope operating inside a scanning electron microscope: towards quantitative electrical nanocharacterization

 Petr Polovodov , Didier Theron , Clément Lenoir , D. Deresmes , Sophie Eliet
Applied Sciences, 2021, 11 (6), pp.2788. ⟨10.3390/app11062788⟩
Article dans une revue hal-03320954v2
Image document

Operation of near-field scanning millimeter-wave microscopy up to 67 GHz under scanning electron microscopy vision

 P Polovodov , Didier Theron , S. Eliet , Vanessa Avramovic , Christophe Boyaval
IEEE MTT International Microwave Symposium, IMS 2020, Jun 2020, Los Angeles (On-line event), United States. pp.95-98, ⟨10.1109/IMS30576.2020.9224090⟩
Communication dans un congrès hal-03022574v1
Image document

Building a near-field scanning millimeter-wave microscope integrated in a scanning electron microscope

 Petr Polovodov , Olaf Haenssler , Didier Theron , Christophe Boyaval , Sophie Eliet
International Conference on Manipulation, Automation, and Robotics at Small Scales, MARSS 2019, Jul 2019, Helsinki, Finland. 3 p
Communication dans un congrès hal-02281097v1
Image document

Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions

 Petr Polovodov , Charlene Brillard , Olaf C Haenssler , Christophe Boyaval , D. Deresmes
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Aug 2018, Reykjavik, Iceland. pp.1-4, ⟨10.1109/NEMO.2018.8503487⟩
Communication dans un congrès hal-02155769v1
Image document

Nano-probing station incorporating MEMS probes for 1D device RF on-wafer characterization

 K. Daffe , J. Marzouk , A. El El Fellahi , T. Xu , Christophe Boyaval
2017 47th European Microwave Conference (EuMC), Oct 2017, Nuremberg, Germany. ⟨10.23919/EuMC.2017.8230973⟩
Communication dans un congrès hal-01726555v1

Combined scanning microwave and electron microscopy: a novel toolbox for hybrid nanoscale material analysis

 Kamel Haddadi , O. C. Haenssler , K. Daffe , S. Eliet , Christophe Boyaval
IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes, IMWS-AMP 2017, Sep 2017, Pavia, Italy. 3 p., ⟨10.1109/IMWS-AMP.2017.8247419⟩
Communication dans un congrès hal-03224651v1
Image document

A near-field scanning microwave microscope in a scanning electron microscope: design and challenges

 P. Polovodov , Sophie Eliet , O. Haenssler , Gilles Dambrine , Kamel Haddadi
21st International Scanning Probe Microscopy, May 2019, Louvain la Neuve, France
Poster de conférence hal-02278736v1