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Near-field scanning millimeter-wave microscope operating inside a scanning electron microscope: towards quantitative electrical nanocharacterizationApplied Sciences, 2021, 11 (6), pp.2788. ⟨10.3390/app11062788⟩
Article dans une revue
hal-03320954v2
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Operation of near-field scanning millimeter-wave microscopy up to 67 GHz under scanning electron microscopy visionIEEE MTT International Microwave Symposium, IMS 2020, Jun 2020, Los Angeles (On-line event), United States. pp.95-98, ⟨10.1109/IMS30576.2020.9224090⟩
Communication dans un congrès
hal-03022574v1
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Building a near-field scanning millimeter-wave microscope integrated in a scanning electron microscopeInternational Conference on Manipulation, Automation, and Robotics at Small Scales, MARSS 2019, Jul 2019, Helsinki, Finland. 3 p
Communication dans un congrès
hal-02281097v1
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Combined scanning microwave and electron microscopy: a novel toolbox for hybrid nanoscale material analysisIEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes, IMWS-AMP 2017, Sep 2017, Pavia, Italy. 3 p., ⟨10.1109/IMWS-AMP.2017.8247419⟩
Communication dans un congrès
hal-03224651v1
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