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Effective Teaching of the Physical Design of Integrated Circuits Using Educational Tools

 Syed Mahfuzul Aziz , Etienne Sicard , Sonia Ben Dhia
IEEE Transactions on Education, 2010, 53 (4), pp.517 - 531. ⟨10.1109/TE.2009.2031842⟩
Article dans une revue hal-01816182v1
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Susceptibility Analysis of an Operational Amplifier Using On-Chip Measurement

 He Huang , Alexandre Boyer , Sonia Ben Dhia , Bertrand Vrignon
EMC Europe 2014, Sep 2014, Goteborg, Sweden. pp.1-5
Communication dans un congrès hal-01068127v1
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Construction of an Integrated Circuit Emission Model of a FPGA

 Chaimae Ghfiri , André Durier , Alexandre Boyer , Sonia Ben Dhia , Christian Marot
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.402-405, ⟨10.1109/APEMC.2016.7522751⟩
Communication dans un congrès hal-01663667v2
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Optimized algorithm to reduce the near-field measurement time on FPGA device

 Sebastien Serpaud , Alexandre Boyer , Sonia Ben Dhia
12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2019), Oct 2019, Haining, China
Communication dans un congrès hal-02319472v1

Study of the coupling of wide band Near Field Scan probe dedicated to the investigation of the radiated immunity of Printed Circuit Boards

 André Durier , Sonia Ben Dhia , Tristan Dubois
2019 IEEE 23rd Workshop on Signal and Power Integrity (SPI), Jun 2019, Chambéry, France. pp.1-4, ⟨10.1109/SaPIW.2019.8781661⟩
Communication dans un congrès hal-02522183v1
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On the Susceptibility of Micro-controller to Radio Frequency Interference

 S. Baffreau , Sonia Ben Dhia , Mohamed Ramdani , Etienne Sicard
3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp.130-131
Communication dans un congrès hal-00526247v1
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Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits

 Alexandre Boyer , Sonia Ben Dhia
Journal of Low Power Electronics, 2014, 10 (1), pp.165-172
Article dans une revue hal-00938358v1
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Construction d'un modèle ICEM pour prédire l'émission électromagnétique d'un FPGA

 Chaimae Ghfiri , Alexandre Boyer , André Durier , Sonia Ben Dhia , C Marot
18e Colloque International et Exposition sur la Compatibilité Electromagnétique (CEM2016), Jul 2016, Rennes, France. 5p
Communication dans un congrès hal-01403883v1
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UNE NOUVELLE SONDE DE MESURE DE TENSION INDUITE POUR L'INVESTIGATION EN IMMUNITE RAYONNEE

 Alexandre Boyer , André Durier , Sonia Ben Dhia
20e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2021, Apr 2021, Lyon (Virtuel), France
Communication dans un congrès hal-03201536v1
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Efficiency of Sequential Spatial Adaptive Sampling Algorithm to Accelerate Multi-Frequency Near-Field Scanning Measurement

 Sébastien Serpaud , Alexandre Boyer , Sonia Ben Dhia , Fabio Coccetti
IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (3), pp.816 - 826. ⟨10.1109/TEMC.2021.3136096⟩
Article dans une revue hal-03543405v1
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A Simple Analytical Approximation to evaluate Noise Levels and Maximum Coupling Frequencies During DPI Simulations on BMS IC

 Badr Guendouz , Philippe Perruchoud , Kamel Abouda , Alexandre Boyer , Sonia Ben Dhia
Asia Pacific International Conference on EMC (APEMC) 2022, Sep 2022, Beijing, China. ⟨10.1109/APEMC53576.2022.9888479⟩
Communication dans un congrès hal-03773319v1
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Electronic counterfeit detection based on the measurement of electromagnetic fingerprint

 He Huang , Alexandre Boyer , Sonia Ben Dhia
Microelectronics Reliability, 2015, 55 (9-10), pp.2050-2054. ⟨10.1016/j.microrel.2015.07.008⟩
Article dans une revue hal-01225338v1

ANALYSIS AND MODELING OF PASSIVE DEVICE DEGRADATION FOR THE LONG-TERM ELECTROMAGNETIC EMISSION PREDICTION OF A DC-DC CONVERTER

 Alexandre Boyer , He Huang , Sonia Ben Dhia
10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom
Communication dans un congrès hal-01225377v1

REGINA test mask: research on EMC guidelines for integrated automotive circuits

 C. Lochot , S. Calvet , Sonia Ben Dhia , E. Sicard
Microelectronics Journal, 2004, 35 (6), pp.509-523. ⟨10.1016/j.mejo.2003.11.007⟩
Article dans une revue istex hal-02523699v1
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Activité pédagogique sur la création d'un jeu d'évasion

 Guillaume Auriol , Sonia Ben Dhia , Elodie Chanthery , Pierre-Emmanuel Hladik , Didier Le Botlan , et al.
6ème Colloque Pédagogie & Formation - groupe INSA, May 2019, Bourges, France
Communication dans un congrès hal-02307883v1
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A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior

 Raul Fernandez-Garcia , Ignacio Gil , Alexandre Boyer , Sonia Ben Dhia , Bertrand Vrignon
IEICE Transactions on Electronics, 2011, E94-C (12), pp.1906
Article dans une revue hal-00669506v1
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A new methodology to build the Internal Activity Block of ICEM-CE for complex Integrated Circuits

 Chaimae Ghfiri , Alexandre Boyer , André Durier , Sonia Ben Dhia
IEEE Transactions on Electromagnetic Compatibility, 2018, 60 (5), pp.1500-1509. ⟨10.1109/TEMC.2017.2767084⟩
Article dans une revue hal-01659770v1

Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan

 A. Boyer , Sonia Ben Dhia , Etienne Sicard
Electronics Letters, 2007, 43 (1), pp.15. ⟨10.1049/el:20073130⟩
Article dans une revue hal-02523686v1

The challenge of signal integrity in deep-submicrometer CMOS technology

 Fabrice Caignet , Sonia Ben Dhia , Etienne Sicard
Proceedings of the IEEE, 2001, 89 (4), pp.556-573. ⟨10.1109/5.920583⟩
Article dans une revue hal-02523701v1
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Development of an On-Chip Sensor for Substrate Coupling Study in Smart Power Mixed ICs

 Marc Veljko Thomas Tomasevic , Alexandre Boyer , Sonia Ben Dhia
Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. 4p
Communication dans un congrès hal-01159221v1
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Coupling study in smart power mixed ICs with a dedicated on-chip sensor

 Marc Veljko Thomas Tomasevic , Alexandre Boyer , Sonia Ben Dhia , Alexander Steinmar , Weiss B. , et al.
EMC Europe 2015, Aug 2015, Dresden, Germany. ⟨10.1109/ISEMC.2015.7256236⟩
Communication dans un congrès hal-01225345v1

Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model

 Cécile Labussière-Dorgan , Sonia Ben Dhia , Etienne Sicard , Junwu Tao , Henrique Jorge Quaresma , et al.
IEEE Transactions on Electromagnetic Compatibility, 2008, 50 (1), pp.22-34. ⟨10.1109/TEMC.2007.911918⟩
Article dans une revue hal-02523684v1
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Characterization of Changes in LDO Susceptibility after Electrical Stress

 Jianfei Wu , Alexandre Boyer , Jiancheng Li , Sonia Ben Dhia , Rongjun Shen
IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (5), pp.883-890. ⟨10.1109/TEMC.2013.2242471⟩
Article dans une revue hal-00937780v1
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Conception de cellules nano-CMOS -Perspectives à dix ans

 Etienne Sicard , Sonia Ben Dhia , Lionel Trojman
7èmes Journées Pédagogiques - JPCNFM 2023, INSA Toulouse, Nov 2023, Toulouse, France
Communication dans un congrès hal-04502940v1
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Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences

 Binhong Li , Nestor Berbel , Alexandre Boyer , Sonia Ben Dhia , Raul Fernandez-Garcia
European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2011), Oct 2011, Bordeaux, France. pp.1557
Communication dans un congrès hal-00669726v1
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Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences

 Binhong Li , Nestor Berbel , Alexandre Boyer , Sonia Ben Dhia , Raul Fernandez-Garcia
Microelectronics Reliability, 2011, 51, pp.1557-1560. ⟨10.1016/j.microrel.2011.06.010⟩
Article dans une revue hal-00936069v1
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Impact of place and route strategy on FPGA electromagnetic emission

 Estevan L Lara , Allan A Constante , Juliano Benfica , Fabian Vargas , Alexandre Boyer , et al.
Microelectronics Reliability, 2021, 126, pp.114333. ⟨10.1016/j.microrel.2021.114333⟩
Article dans une revue hal-03466580v1
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Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing

 Sonia Ben Dhia , Alexandre Boyer
Test Workshop - LATW, 2014 15th Latin American, Mar 2014, Fortaleza, Brazil. pp.1-6
Communication dans un congrès hal-01017384v1
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Characterization of the Electromagnetic Susceptibility of Integrated Circuits using a Near Field Scan

 Alexandre Boyer , Sonia Ben Dhia , Etienne Sicard
Electronics Letters, 2007, 43 (1), pp.15
Article dans une revue hal-00669747v1
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Alimentation de capteurs communicants par systèmes de récupération et de stockage d’énergies ambiantes à bas coût

 Amirouche Oumaziz , Florian Huet , Sonia Ben Dhia
TELECOM’2019 & 11èmes JFMMA, Jun 2019, Saïdia, Maroc
Communication dans un congrès hal-02138449v1
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