REGINA test mask: research on EMC guidelines for integrated automotive circuits
C. Lochot
,
S. Calvet
,
Sonia Ben Dhia
,
E. Sicard
Article dans une revue
istex
hal-02523699v1
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Activité pédagogique sur la création d'un jeu d'évasion
Guillaume Auriol
,
Sonia Ben Dhia
,
Elodie Chanthery
,
Pierre-Emmanuel Hladik
,
Didier Le Botlan
,
et al.
6ème Colloque Pédagogie & Formation - groupe INSA , May 2019, Bourges, France
Communication dans un congrès
hal-02307883v1
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Construction d'un modèle ICEM pour prédire l'émission électromagnétique d'un FPGA
Chaimae Ghfiri
,
Alexandre Boyer
,
André Durier
,
Sonia Ben Dhia
,
C Marot
18e Colloque International et Exposition sur la Compatibilité Electromagnétique (CEM2016) , Jul 2016, Rennes, France. 5p
Communication dans un congrès
hal-01403883v1
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UNE NOUVELLE SONDE DE MESURE DE TENSION INDUITE POUR L'INVESTIGATION EN IMMUNITE RAYONNEE
Alexandre Boyer
,
André Durier
,
Sonia Ben Dhia
20e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2021 , Apr 2021, Lyon (Virtuel), France
Communication dans un congrès
hal-03201536v1
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Efficiency of Sequential Spatial Adaptive Sampling Algorithm to Accelerate Multi-Frequency Near-Field Scanning Measurement
Sébastien Serpaud
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Fabio Coccetti
Article dans une revue
hal-03543405v1
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A Simple Analytical Approximation to evaluate Noise Levels and Maximum Coupling Frequencies During DPI Simulations on BMS IC
Badr Guendouz
,
Philippe Perruchoud
,
Kamel Abouda
,
Alexandre Boyer
,
Sonia Ben Dhia
Communication dans un congrès
hal-03773319v1
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Electronic counterfeit detection based on the measurement of electromagnetic fingerprint
He Huang
,
Alexandre Boyer
,
Sonia Ben Dhia
Article dans une revue
hal-01225338v1
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ANALYSIS AND MODELING OF PASSIVE DEVICE DEGRADATION FOR THE LONG-TERM ELECTROMAGNETIC EMISSION PREDICTION OF A DC-DC CONVERTER
Alexandre Boyer
,
He Huang
,
Sonia Ben Dhia
10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015) , Nov 2015, Edimburgh, United Kingdom
Communication dans un congrès
hal-01225377v1
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Effective Teaching of the Physical Design of Integrated Circuits Using Educational Tools
Syed Mahfuzul Aziz
,
Etienne Sicard
,
Sonia Ben Dhia
Article dans une revue
hal-01816182v1
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Susceptibility Analysis of an Operational Amplifier Using On-Chip Measurement
He Huang
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Bertrand Vrignon
EMC Europe 2014 , Sep 2014, Goteborg, Sweden. pp.1-5
Communication dans un congrès
hal-01068127v1
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Construction of an Integrated Circuit Emission Model of a FPGA
Chaimae Ghfiri
,
André Durier
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Christian Marot
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016) , May 2016, Shenzhen, China. pp.402-405,
⟨10.1109/APEMC.2016.7522751⟩
Communication dans un congrès
hal-01663667v2
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Optimized algorithm to reduce the near-field measurement time on FPGA device
Sebastien Serpaud
,
Alexandre Boyer
,
Sonia Ben Dhia
12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2019) , Oct 2019, Haining, China
Communication dans un congrès
hal-02319472v1
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Study of the coupling of wide band Near Field Scan probe dedicated to the investigation of the radiated immunity of Printed Circuit Boards
André Durier
,
Sonia Ben Dhia
,
Tristan Dubois
Communication dans un congrès
hal-02522183v1
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Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits
Alexandre Boyer
,
Sonia Ben Dhia
Journal of Low Power Electronics , 2014, 10 (1), pp.165-172
Article dans une revue
hal-00938358v1
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On the Susceptibility of Micro-controller to Radio Frequency Interference
S. Baffreau
,
Sonia Ben Dhia
,
Mohamed Ramdani
,
Etienne Sicard
3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits , Nov 2002, Toulouse, France. pp.130-131
Communication dans un congrès
hal-00526247v1
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Impact of place and route strategy on FPGA electromagnetic emission
Estevan L Lara
,
Allan A Constante
,
Juliano Benfica
,
Fabian Vargas
,
Alexandre Boyer
,
et al.
Article dans une revue
hal-03466580v1
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Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing
Sonia Ben Dhia
,
Alexandre Boyer
Test Workshop - LATW, 2014 15th Latin American , Mar 2014, Fortaleza, Brazil. pp.1-6
Communication dans un congrès
hal-01017384v1
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Characterization of the Electromagnetic Susceptibility of Integrated Circuits using a Near Field Scan
Alexandre Boyer
,
Sonia Ben Dhia
,
Etienne Sicard
Electronics Letters , 2007, 43 (1), pp.15
Article dans une revue
hal-00669747v1
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Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences
Binhong Li
,
Nestor Berbel
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Raul Fernandez-Garcia
Article dans une revue
hal-00936069v1
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Alimentation de capteurs communicants par systèmes de récupération et de stockage d’énergies ambiantes à bas coût
Amirouche Oumaziz
,
Florian Huet
,
Sonia Ben Dhia
TELECOM’2019 & 11èmes JFMMA , Jun 2019, Saïdia, Maroc
Communication dans un congrès
hal-02138449v1
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Construction and Evaluation of the Susceptibility Model of an Integrated Phase-Locked Loop
Alexandre Boyer
,
Sonia Ben Dhia
,
Christophe Lemoine
,
Bertrand Vrignon
8th Workshop on Electromagnetic Compatibility of Itnegrated Circuits , Nov 2011, Dubrovnik, Croatia. pp.7
Communication dans un congrès
hal-00669716v1
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Bandgap Failure Study Due To Parasitic Bipolar Substrate Coupling In Smart Power Mixed ICs
Marc Veljko Thomas Tomasevic
,
Alexandre Boyer
,
Sonia Ben Dhia
10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015) , Nov 2015, Edimburgh, United Kingdom. 5p
Communication dans un congrès
hal-01225358v1
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A new methodology for EMC prediction of integrated circuits after aging
Chaimae Ghfiri
,
Alexandre Boyer
,
Alain Bensoussan
,
André Durier
,
Sonia Ben Dhia
Article dans une revue
hal-01951615v1
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On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II
Alexandre Boyer
,
Nicolas Nolhier
,
Fabrice Caignet
,
Sonia Ben Dhia
Article dans une revue
hal-03681022v1
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UNE ETUDE COMPARATIVE DES NIVEAUX DPI SUR UN CI BMS AVEC UN MODELE ANALYTIQUE DES RESONANCES
Badr Guendouz
,
Kamel Abouda
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Hiba Mediouni
,
et al.
21ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2023) , Jun 2023, Toulouse, France
Communication dans un congrès
hal-04203247v1
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The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future
Mohamed Ramdani
,
Etienne Sicard
,
Alexandre Boyer
,
Sonia Ben Dhia
,
James Whalen
,
et al.
Article dans une revue
hal-02523680v1
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An alternative approach to model the Internal Activity of integrated circuits
Nestor Berbel
,
Raul Fernandez-Garcia
,
Ignacio Gil
,
Binhong Li
,
Sonia Ben Dhia
,
et al.
8th Workshop on Electromagnetic Compatibility of Integrated Circuits , Nov 2011, Dubrovnik, Croatia. pp.88
Communication dans un congrès
hal-00669719v1
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Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors
Jian-Fei Wu
,
Etienne Sicard
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Jiancheng Li
,
et al.
Article dans une revue
hal-00709287v1
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Fast and efficient approach to predict EMC immunity of complex equipment after a component change
Saliha Chetouani
,
Sébastien Serpaud
,
Alexandre Boyer
,
Sonia Ben Dhia
EMC Europe 2020 , Sep 2020, Rome (online), Italy
Communication dans un congrès
hal-02951845v1
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A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change
Saliha Chetouani
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Sébastien Serpaud
,
André Durier
Communication dans un congrès
hal-03654075v1
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