Serge Bernard
72
Documents
Présentation
**RESEARCH**
============
Analog and Mixed-Signal Testing
===============================
- Design-for-Testability (DfT),
- 'Built-In-Self-Test (BIST),
- Analog-to-Digital Converter Testing,
- System-in-Package (SiP) Testing.
- Built-in-Self Repair (BISR)
Integrated Circuit Design for Medical Applications
==================================================
- Neural Stimulator for Functional Electrical Stimulation (FES),
- Physiological Signal Recording (ElectroNeuroGram: ENG).
- Medical devices development in the field of ophtalmology and vision based equipments.
Dependability
=============
- Dependability at system level
- Dependability for Analog and mixed signal circuits
Professional Status
===================
- 2014-... : Head of the micorlectronic department - LIRMM
- 2010-2014 : Deputy Head of the micorlectronic department - LIRMM
- 2006-… : Head & Scientific Co-director of [ISyTest](http://www.lirmm.fr/isytest): Institute for System Testing (joint institute [LIRMM](http://www.lirmm.fr/)/[NXP](http://www.nxp.com/))
- 2001-... : CNRS Researcher in the Microelectronics department of LIRMM.
Education
=========
- 2010 – HDR “Habilitation à Diriger les Recherches”. in Microelectronics, University of Montpellier, France.
- 2001 - Ph.D. in Microelectronics, University of Montpellier, France.
- 1999 - Master in Microelectronics, University of Montpellier, France.
- 1998 - “Agrégation de Génie Electrique” high-level competitive examination for recruiting teachers
- 1997 - M.S. in Electrical Engineering, University of Paris VI(Orsay), France.
-
**ACTIVITIES**
--------------
-
**General chair**
-----------------
- Design of Circuits and Integrated System (DCIS’2012), à Avignon.
**Program chair**
-----------------
- IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (DTIS’11), Athènes, Grèce, 4-7 avril 2011.
**Organization of Special sessions**
------------------------------------
- “biomedical circuits and systems”, basée sur des papiers invités, à IEEE International Symposium of Electronic Design, Test & Applications, (DELTA’10), Ho Chi Minh City, Vietnam, 13-15 janvier 2010.
**Local Chair**
---------------
- IEEE International Workshop on Silicon Debug and Diagnosis, (SDD’04) Ajaccio, France, 26-27 mai 2004.
**Organization commitee**
-------------------------
- IEEE International Mixed-Signal, Sensor and System Test Workshop (IMS3TW’10), La Grande Motte, France, juin 2010,
- IEEE European Test Symposium (ETS’04), Ajaccio, France, 23-26 mai 2004,
- IEEE International Workshop on Silicon Debug and Diagnosis (SDD’04) Ajaccio, France, 26-27 mai 2004,
- International Conference on Field Programmable Logic and Application (FPL’02), Montpellier (La Grande-Motte), France 2-4 septembre 2002,
- IFIP International Conference on Very Large Scale Integration The Global System on Chip Design & CAD Conference (VLSI-SOC’01), Montpellier, France, 3-5 décembre 2001,
- IEEE International Mixed-Signal Test Workshop (IMSTW’00), Montpellier (La Grande- Motte), France, 15-17 juin 2000.
-
**RESEARCH**
============
Analog and Mixed-Signal Testing
===============================
- Design-for-Testability (DfT),
- 'Built-In-Self-Test (BIST),
- Analog-to-Digital Converter Testing,
- System-in-Package (SiP) Testing.
- Built-in-Self Repair (BISR)
Integrated Circuit Design for Medical Applications
==================================================
- Neural Stimulator for Functional Electrical Stimulation (FES),
- Physiological Signal Recording (ElectroNeuroGram: ENG).
- Medical devices development in the field of ophtalmology and vision based equipments.
Dependability
=============
- Dependability at system level
- Dependability for Analog and mixed signal circuits
Professional Status
===================
- 2014-... : Head of the micorlectronic department - LIRMM
- 2010-2014 : Deputy Head of the micorlectronic department - LIRMM
- 2006-… : Head & Scientific Co-director of [ISyTest](http://www.lirmm.fr/isytest): Institute for System Testing (joint institute [LIRMM](http://www.lirmm.fr/)/[NXP](http://www.nxp.com/))
- 2001-... : CNRS Researcher in the Microelectronics department of LIRMM.
Education
=========
- 2010 – HDR “Habilitation à Diriger les Recherches”. in Microelectronics, University of Montpellier, France.
- 2001 - Ph.D. in Microelectronics, University of Montpellier, France.
- 1999 - Master in Microelectronics, University of Montpellier, France.
- 1998 - “Agrégation de Génie Electrique” high-level competitive examination for recruiting teachers
- 1997 - M.S. in Electrical Engineering, University of Paris VI(Orsay), France.
-
**ACTIVITIES**
--------------
-
**General chair**
-----------------
- Design of Circuits and Integrated System (DCIS’2012), à Avignon.
**Program chair**
-----------------
- IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (DTIS’11), Athènes, Grèce, 4-7 avril 2011.
**Organization of Special sessions**
------------------------------------
- “biomedical circuits and systems”, basée sur des papiers invités, à IEEE International Symposium of Electronic Design, Test & Applications, (DELTA’10), Ho Chi Minh City, Vietnam, 13-15 janvier 2010.
**Local Chair**
---------------
- IEEE International Workshop on Silicon Debug and Diagnosis, (SDD’04) Ajaccio, France, 26-27 mai 2004.
**Organization commitee**
-------------------------
- IEEE International Mixed-Signal, Sensor and System Test Workshop (IMS3TW’10), La Grande Motte, France, juin 2010,
- IEEE European Test Symposium (ETS’04), Ajaccio, France, 23-26 mai 2004,
- IEEE International Workshop on Silicon Debug and Diagnosis (SDD’04) Ajaccio, France, 26-27 mai 2004,
- International Conference on Field Programmable Logic and Application (FPL’02), Montpellier (La Grande-Motte), France 2-4 septembre 2002,
- IFIP International Conference on Very Large Scale Integration The Global System on Chip Design & CAD Conference (VLSI-SOC’01), Montpellier, France, 3-5 décembre 2001,
- IEEE International Mixed-Signal Test Workshop (IMSTW’00), Montpellier (La Grande- Motte), France, 15-17 juin 2000.
-
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First Step Towards a Fully-Miniaturized Intra-Body Communication Transceiver Based on Galvanic CouplingFICC 2023 - Future of Information and Communication Conference, Mar 2023, San Francisco (Virtual), United States. pp.107-119, ⟨10.1007/978-3-031-28076-4_11⟩
Communication dans un congrès
lirmm-03866901v1
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Implanted Bioimpedance Spectroscopy for In-Vivo Physiological Monitoring: Influence of Fish Activity on Measurement AccuracyICBF 2022 - 14th International Congress on the Biology of Fish, Jun 2022, Montpellier, France
Communication dans un congrès
lirmm-03866893v1
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Exploring on-line RF performance monitoring based on the indirect test strategyLATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este (virtual), Uruguay. pp.1-7, ⟨10.1109/LATS53581.2021.9651743⟩
Communication dans un congrès
lirmm-03426373v1
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Implementing indirect test of RF circuits without compromising test quality: a practical case studyLATS 2020 - 21st IEEE Latin American Test Symposium, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093666⟩
Communication dans un congrès
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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICsIOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩
Communication dans un congrès
lirmm-02993384v1
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Indirect test of RF circuits using ensemble methodsETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Communication dans un congrès
lirmm-03001530v1
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Which metrics to use for RF indirect test strategy?SMACD 2019 - 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jul 2019, Lausanne, Switzerland. pp.73-76, ⟨10.1109/SMACD.2019.8795302⟩
Communication dans un congrès
lirmm-02338027v1
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The use of ensemble methods for indirect test of RF circuits13e Colloque National du GDR SOC², Jun 2019, Montpellier, France
Communication dans un congrès
lirmm-02375900v1
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Use of ensemble methods for indirect test of RF circuits: can it bring benefits?LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. pp.1-6, ⟨10.1109/LATW.2019.8704641⟩
Communication dans un congrès
lirmm-02338047v1
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The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated CircuitsSETS 2019 - South European Test Seminar, 2019, Pitztal, Austria
Communication dans un congrès
lirmm-02375866v1
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Oversea Radio Measurements and Channel Characterization with LoRa TechnologyIEEE Radio and Antenna Days of the Indian Ocean (RADIO 2018), Oct 2018, Wolmar, Mauritius. pp.1-2, ⟨10.23919/RADIO.2018.8572461⟩
Communication dans un congrès
lirmm-03132132v1
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Improvement of Active-Input Current Mirrors Using Adaptive Biasing TechniqueDCIS 2018 - 33rd Conference on Design of Circuits and Integrated Systems, Nov 2018, Lyon, France. ⟨10.1109/DCIS.2018.8681474⟩
Communication dans un congrès
lirmm-02287704v1
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Wideband Fully Differential Current Driver with Optimized Output Impedance for Bioimpedance MeasurementsISCAS: International Symposium on Circuits and Systems, May 2018, Florence, Italy. ⟨10.1109/ISCAS.2018.8351464⟩
Communication dans un congrès
lirmm-01874027v1
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A Hybrid Bioimpedance Spectroscopy Architecture for a Wide Frequency Exploration of Tissue Electrical PropertiesIFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), Oct 2018, Verona, Italy. pp.168-171, ⟨10.1109/VLSI-SoC.2018.8644829⟩
Communication dans un congrès
hal-02280742v1
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A multitone analysis for bioimpedance spectroscopy using minimal digital ressourceICST: International Conference on Sensing Technology, Dec 2018, Limerick, Ireland. ⟨10.1109/ICSensT.2018.8603607⟩
Communication dans un congrès
lirmm-01954549v1
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Formal analysis of bandwidth enhancement for high-performance active-input current mirrorDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2017, Palma de Mallorca, Spain. ⟨10.1109/DTIS.2017.7930162⟩
Communication dans un congrès
lirmm-01710201v1
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Analytical Study of On-chip Generations of Analog Sine-wave Based on Combined Digital SignalsIMSTW: International Mixed Signals Testing Workshop, Jul 2017, Thessaloniki, Greece. ⟨10.1109/IMS3TW.2017.7995205⟩
Communication dans un congrès
lirmm-01699387v1
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Formal analysis of high-performance stabilized active-input current mirrorISCAS: International Symposium on Circuits and Systems, May 2017, Baltimore, MD, United States. ⟨10.1109/ISCAS.2017.8051012⟩
Communication dans un congrès
lirmm-01710205v1
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Improving artisanal and semi-industrial fisheries data: a pilot experience on gillnet fishery in AbidjanMeeting of the ICCAT Working Group on stock Assessment Methods (WGSAM), May 2017, Madrid, Spain
Communication dans un congrès
lirmm-02363509v1
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A Simple Conditioner for Resonant Intraocular Pressure SensorEUROSENSORS, Sep 2016, Budapest, Hungary. pp.67-70, ⟨10.1016/j.proeng.2016.11.149⟩
Communication dans un congrès
lirmm-01426019v1
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Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systemsIWIS: International Workshop on Impedance Spectroscopy, Sep 2016, Chemnitz, Germany
Communication dans un congrès
lirmm-01457544v1
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Efficient calibration of contact-less resonant bio-sensor affected by operating conditionsIMSTW: International Mixed-Signal Testing Workshop, Jul 2016, Sant Feliu de Guixols, Spain. pp.1-6, ⟨10.1109/IMS3TW.2016.7524219⟩
Communication dans un congrès
lirmm-01430618v1
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A generic methodology for building efficient prediction models in the context of alternate testingIMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177873⟩
Communication dans un congrès
lirmm-01233150v1
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A framework for efficient implementation of analog/RF alternate test with model redundancyISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626, ⟨10.1109/ISVLSI.2015.30⟩
Communication dans un congrès
lirmm-01233104v1
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Toward adaptation of ADCs to operating conditions through on-chip correctionISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩
Communication dans un congrès
lirmm-01233117v1
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Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter moduleIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. ⟨10.1109/IMS3TW.2014.6997401⟩
Communication dans un congrès
lirmm-01119365v1
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Methodology for Self-Adaptation of Electronic Medical Devices: Application to an Intraocular Pressure SensorIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain
Communication dans un congrès
lirmm-01084361v1
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Solutions for the self-adaptation of communicating systems in operationIOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. pp.234-239, ⟨10.1109/IOLTS.2014.6873705⟩
Communication dans un congrès
hal-01118068v1
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Self-Adaptive NFC SystemsIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain
Communication dans un congrès
lirmm-01084355v1
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Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testingLATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. ⟨10.1109/LATW.2014.6841930⟩
Communication dans un congrès
lirmm-01119361v1
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Investigations on alternate analog/RF test with model redundancySTEM Workshop, May 2014, Paderborn, Germany
Communication dans un congrès
lirmm-01119374v1
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New implementions of predictive alternate analog/RF test with augmented model redundancyDATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.144⟩
Communication dans un congrès
lirmm-00994714v1
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Accurate and Efficient Analytical Electrical Model of Antenna for NFC ApplicationsNEWCAS: New Circuits and Systems, Jun 2013, Paris, France. pp.137-141, ⟨10.1109/NEWCAS.2013.6573657⟩
Communication dans un congrès
lirmm-00839190v1
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A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States
Communication dans un congrès
lirmm-00985422v1
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On the use of redundancy to reduce prediction error in alternate analog/RF testIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩
Communication dans un congrès
lirmm-00803556v1
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Smart selection of indirect parameters for DC-based alternate RF IC testingVTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩
Communication dans un congrès
lirmm-00803453v1
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Making predictive analog/RF alternate test strategy independent of training set sizeITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.9, ⟨10.1109/TEST.2012.6401560⟩
Communication dans un congrès
lirmm-00803564v1
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ANC-Based Method for Testing Converters with Random-Phase HarmonicsIMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494578v1
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Adaptive LUT-Based System for In Situ ADC Auto-correctionIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494424v1
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A Multi-Converter DFT Technique for Complex SIP: Concepts and ValidationECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750
Communication dans un congrès
lirmm-00448863v1
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Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave GeneratorsIMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201
Communication dans un congrès
lirmm-00161708v1
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"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOCETS: European Test Symposium, May 2007, Freiburg, Germany. pp.211-216, ⟨10.1109/ETS.2007.1⟩
Communication dans un congrès
lirmm-00158527v1
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Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoCIEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88
Communication dans un congrès
lirmm-00119266v1
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“Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOCETS: European Test Symposium, May 2006, Southampton, United Kingdom. pp.159-164
Communication dans un congrès
lirmm-00115676v1
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Comparison between Spectral-based Methods for INL Estimation and feasibility of their implantationIMSTW: International Mixed-Signals Testing Workshop, Jun 2005, Cannes, France. pp.270-275
Communication dans un congrès
hal-00092461v1
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Implementing model redundancy in predictive alternate test to improve test confidenceETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, ⟨10.1109/ETS.2013.6569386⟩
Poster de conférence
lirmm-00820077v1
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Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systemsKanoun, Olfa. Impedance Spectroscopy
Chapitre d'ouvrage
lirmm-02007013v1
Advanced Applications: Battery Research, Bioimpedance, System Design, Walter de Gruyter, pp.71-80, 2018, 9783110558920. ⟨10.1515/9783110558920-008⟩ |