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Serge Bernard


Analog and Mixed-Signal Testing

  • Design-for-Testability (DfT),
  • 'Built-In-Self-Test (BIST),
  • Analog-to-Digital Converter Testing,
  • System-in-Package (SiP) Testing.
  • Built-in-Self Repair (BISR)

Integrated Circuit Design for Medical Applications

  • Neural Stimulator for Functional Electrical Stimulation (FES),
  • Physiological Signal Recording (ElectroNeuroGram: ENG).
  • Medical devices development in the field of ophtalmology and vision based equipments.


  • Dependability at system level
  • Dependability for Analog and mixed signal circuits



Professional Status

  • 2014-...     : Head of the micorlectronic department - LIRMM
  • 2010-2014 : Deputy Head of the micorlectronic department - LIRMM
  • 2006-…     : Head & Scientific Co-director of ISyTest: Institute for System Testing (joint institute LIRMM/NXP)
  • 2001-...    : CNRS Researcher in the Microelectronics department of LIRMM.


  • 2010 – HDR “Habilitation à Diriger les Recherches”. in Microelectronics, University of Montpellier, France.
  • 2001 - Ph.D. in Microelectronics, University of Montpellier, France.
  • 1999 - Master in Microelectronics, University of Montpellier, France.
  • 1998 - “Agrégation de Génie Electrique” high-level competitive examination for recruiting teachers
  • 1997 - M.S. in Electrical Engineering, University of Paris VI(Orsay), France.




General chair

  • Design of Circuits and Integrated System (DCIS’2012), à Avignon.

Program chair

  • IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (DTIS’11), Athènes, Grèce, 4-7 avril 2011.

Organization of Special sessions

  • “biomedical circuits and systems”, basée sur des papiers invités, à IEEE International Symposium of Electronic Design, Test & Applications, (DELTA’10), Ho Chi Minh City, Vietnam, 13-15 janvier 2010.

Local Chair

  • IEEE International Workshop on Silicon Debug and Diagnosis, (SDD’04) Ajaccio, France, 26-27 mai 2004.

Organization commitee

  • IEEE International Mixed-Signal, Sensor and System Test Workshop (IMS3TW’10), La Grande Motte, France, juin 2010,
  • IEEE European Test Symposium (ETS’04), Ajaccio, France, 23-26 mai 2004,
  • IEEE International Workshop on Silicon Debug and Diagnosis (SDD’04) Ajaccio, France, 26-27 mai 2004,
  • International Conference on Field Programmable Logic and Application (FPL’02), Montpellier (La Grande-Motte), France 2-4 septembre 2002,
  • IFIP International Conference on Very Large Scale Integration The Global System on Chip Design & CAD Conference (VLSI-SOC’01), Montpellier, France, 3-5 décembre 2001,
  • IEEE International Mixed-Signal Test Workshop (IMSTW’00), Montpellier (La Grande- Motte), France, 15-17 juin 2000.

Patrick Poulichet   

Conference papers1 document

  • Gaelle Lissorgues, Lionel Rousseau, Patrick Poulichet, Laurie Valbin, Serge Picaud, et al.. Continuous Intra Ocular Pressure Measurement Sensor for Glaucoma Diagnostic. 6th World Congress of Biomechanics (WCB), Aug 2010, Singapore, Singapore. pp.1282-1285, ⟨10.1007/978-3-642-14515-5_325⟩. ⟨lirmm-00808458⟩