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Serge Bernard


Analog and Mixed-Signal Testing

  • Design-for-Testability (DfT),
  • 'Built-In-Self-Test (BIST),
  • Analog-to-Digital Converter Testing,
  • System-in-Package (SiP) Testing.
  • Built-in-Self Repair (BISR)

Integrated Circuit Design for Medical Applications

  • Neural Stimulator for Functional Electrical Stimulation (FES),
  • Physiological Signal Recording (ElectroNeuroGram: ENG).
  • Medical devices development in the field of ophtalmology and vision based equipments.


  • Dependability at system level
  • Dependability for Analog and mixed signal circuits



Professional Status

  • 2014-...     : Head of the micorlectronic department - LIRMM
  • 2010-2014 : Deputy Head of the micorlectronic department - LIRMM
  • 2006-…     : Head & Scientific Co-director of ISyTest: Institute for System Testing (joint institute LIRMM/NXP)
  • 2001-...    : CNRS Researcher in the Microelectronics department of LIRMM.


  • 2010 – HDR “Habilitation à Diriger les Recherches”. in Microelectronics, University of Montpellier, France.
  • 2001 - Ph.D. in Microelectronics, University of Montpellier, France.
  • 1999 - Master in Microelectronics, University of Montpellier, France.
  • 1998 - “Agrégation de Génie Electrique” high-level competitive examination for recruiting teachers
  • 1997 - M.S. in Electrical Engineering, University of Paris VI(Orsay), France.




General chair

  • Design of Circuits and Integrated System (DCIS’2012), à Avignon.

Program chair

  • IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (DTIS’11), Athènes, Grèce, 4-7 avril 2011.

Organization of Special sessions

  • “biomedical circuits and systems”, basée sur des papiers invités, à IEEE International Symposium of Electronic Design, Test & Applications, (DELTA’10), Ho Chi Minh City, Vietnam, 13-15 janvier 2010.

Local Chair

  • IEEE International Workshop on Silicon Debug and Diagnosis, (SDD’04) Ajaccio, France, 26-27 mai 2004.

Organization commitee

  • IEEE International Mixed-Signal, Sensor and System Test Workshop (IMS3TW’10), La Grande Motte, France, juin 2010,
  • IEEE European Test Symposium (ETS’04), Ajaccio, France, 23-26 mai 2004,
  • IEEE International Workshop on Silicon Debug and Diagnosis (SDD’04) Ajaccio, France, 26-27 mai 2004,
  • International Conference on Field Programmable Logic and Application (FPL’02), Montpellier (La Grande-Motte), France 2-4 septembre 2002,
  • IFIP International Conference on Very Large Scale Integration The Global System on Chip Design & CAD Conference (VLSI-SOC’01), Montpellier, France, 3-5 décembre 2001,
  • IEEE International Mixed-Signal Test Workshop (IMSTW’00), Montpellier (La Grande- Motte), France, 15-17 juin 2000.

Manuel J. Barragan   

Directions of work or proceedings1 document

  • Serge Bernard, Manuel J. Barragan, William R. Eisenstadt, Ke Huang. Proceedings of IEEE 21st International Mixed-Signals Test Workshop (IMSTW 2016). IMSTW: International Mixed-Signals Test Workshop, Jul 2016, Sant Feliu de Guíxols, Spain. IEEE, 2016, ⟨10.1109/IMS3TW.2016.7524214⟩. ⟨lirmm-01433610⟩