Serge Bernard
9
Documents
Présentation
**RESEARCH**
============
Analog and Mixed-Signal Testing
===============================
- Design-for-Testability (DfT),
- 'Built-In-Self-Test (BIST),
- Analog-to-Digital Converter Testing,
- System-in-Package (SiP) Testing.
- Built-in-Self Repair (BISR)
Integrated Circuit Design for Medical Applications
==================================================
- Neural Stimulator for Functional Electrical Stimulation (FES),
- Physiological Signal Recording (ElectroNeuroGram: ENG).
- Medical devices development in the field of ophtalmology and vision based equipments.
Dependability
=============
- Dependability at system level
- Dependability for Analog and mixed signal circuits
Professional Status
===================
- 2014-... : Head of the micorlectronic department - LIRMM
- 2010-2014 : Deputy Head of the micorlectronic department - LIRMM
- 2006-… : Head & Scientific Co-director of [ISyTest](http://www.lirmm.fr/isytest): Institute for System Testing (joint institute [LIRMM](http://www.lirmm.fr/)/[NXP](http://www.nxp.com/))
- 2001-... : CNRS Researcher in the Microelectronics department of LIRMM.
Education
=========
- 2010 – HDR “Habilitation à Diriger les Recherches”. in Microelectronics, University of Montpellier, France.
- 2001 - Ph.D. in Microelectronics, University of Montpellier, France.
- 1999 - Master in Microelectronics, University of Montpellier, France.
- 1998 - “Agrégation de Génie Electrique” high-level competitive examination for recruiting teachers
- 1997 - M.S. in Electrical Engineering, University of Paris VI(Orsay), France.
-
**ACTIVITIES**
--------------
-
**General chair**
-----------------
- Design of Circuits and Integrated System (DCIS’2012), à Avignon.
**Program chair**
-----------------
- IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (DTIS’11), Athènes, Grèce, 4-7 avril 2011.
**Organization of Special sessions**
------------------------------------
- “biomedical circuits and systems”, basée sur des papiers invités, à IEEE International Symposium of Electronic Design, Test & Applications, (DELTA’10), Ho Chi Minh City, Vietnam, 13-15 janvier 2010.
**Local Chair**
---------------
- IEEE International Workshop on Silicon Debug and Diagnosis, (SDD’04) Ajaccio, France, 26-27 mai 2004.
**Organization commitee**
-------------------------
- IEEE International Mixed-Signal, Sensor and System Test Workshop (IMS3TW’10), La Grande Motte, France, juin 2010,
- IEEE European Test Symposium (ETS’04), Ajaccio, France, 23-26 mai 2004,
- IEEE International Workshop on Silicon Debug and Diagnosis (SDD’04) Ajaccio, France, 26-27 mai 2004,
- International Conference on Field Programmable Logic and Application (FPL’02), Montpellier (La Grande-Motte), France 2-4 septembre 2002,
- IFIP International Conference on Very Large Scale Integration The Global System on Chip Design & CAD Conference (VLSI-SOC’01), Montpellier, France, 3-5 décembre 2001,
- IEEE International Mixed-Signal Test Workshop (IMSTW’00), Montpellier (La Grande- Motte), France, 15-17 juin 2000.
-
**RESEARCH**
============
Analog and Mixed-Signal Testing
===============================
- Design-for-Testability (DfT),
- 'Built-In-Self-Test (BIST),
- Analog-to-Digital Converter Testing,
- System-in-Package (SiP) Testing.
- Built-in-Self Repair (BISR)
Integrated Circuit Design for Medical Applications
==================================================
- Neural Stimulator for Functional Electrical Stimulation (FES),
- Physiological Signal Recording (ElectroNeuroGram: ENG).
- Medical devices development in the field of ophtalmology and vision based equipments.
Dependability
=============
- Dependability at system level
- Dependability for Analog and mixed signal circuits
Professional Status
===================
- 2014-... : Head of the micorlectronic department - LIRMM
- 2010-2014 : Deputy Head of the micorlectronic department - LIRMM
- 2006-… : Head & Scientific Co-director of [ISyTest](http://www.lirmm.fr/isytest): Institute for System Testing (joint institute [LIRMM](http://www.lirmm.fr/)/[NXP](http://www.nxp.com/))
- 2001-... : CNRS Researcher in the Microelectronics department of LIRMM.
Education
=========
- 2010 – HDR “Habilitation à Diriger les Recherches”. in Microelectronics, University of Montpellier, France.
- 2001 - Ph.D. in Microelectronics, University of Montpellier, France.
- 1999 - Master in Microelectronics, University of Montpellier, France.
- 1998 - “Agrégation de Génie Electrique” high-level competitive examination for recruiting teachers
- 1997 - M.S. in Electrical Engineering, University of Paris VI(Orsay), France.
-
**ACTIVITIES**
--------------
-
**General chair**
-----------------
- Design of Circuits and Integrated System (DCIS’2012), à Avignon.
**Program chair**
-----------------
- IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (DTIS’11), Athènes, Grèce, 4-7 avril 2011.
**Organization of Special sessions**
------------------------------------
- “biomedical circuits and systems”, basée sur des papiers invités, à IEEE International Symposium of Electronic Design, Test & Applications, (DELTA’10), Ho Chi Minh City, Vietnam, 13-15 janvier 2010.
**Local Chair**
---------------
- IEEE International Workshop on Silicon Debug and Diagnosis, (SDD’04) Ajaccio, France, 26-27 mai 2004.
**Organization commitee**
-------------------------
- IEEE International Mixed-Signal, Sensor and System Test Workshop (IMS3TW’10), La Grande Motte, France, juin 2010,
- IEEE European Test Symposium (ETS’04), Ajaccio, France, 23-26 mai 2004,
- IEEE International Workshop on Silicon Debug and Diagnosis (SDD’04) Ajaccio, France, 26-27 mai 2004,
- International Conference on Field Programmable Logic and Application (FPL’02), Montpellier (La Grande-Motte), France 2-4 septembre 2002,
- IFIP International Conference on Very Large Scale Integration The Global System on Chip Design & CAD Conference (VLSI-SOC’01), Montpellier, France, 3-5 décembre 2001,
- IEEE International Mixed-Signal Test Workshop (IMSTW’00), Montpellier (La Grande- Motte), France, 15-17 juin 2000.
-
Publications
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 9
- 6
- 6
- 5
- 3
- 2
- 2
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 3
- 2
- 1
- 1
Power Supply Investigation for Wireless Wafer TestLATW'08: 9th Latin-American Test Workshop, Mar 2008, Puebla, Mexico. pp.165-170
Communication dans un congrès
lirmm-00260205v1
|
|
|
Testing System-In-Package WirelesslyDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Sep 2006, Tunis, Tunisia. pp.222-226
Communication dans un congrès
lirmm-00094916v1
|
|
TOETS: Work Package 1Poster de conférence lirmm-00653039v1 |
Wireless Wafer Test for Iterative Testing During System Assembly3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Nov 2010, Austin, Texas, United States. , 1st IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits, 2010
Poster de conférence
lirmm-00537849v1
|
|
Wireless Test Structure for Integrated SystemsITC'2008: International Test Conference, Oct 2008, Santa Clara, CA, United States. pp.N/A, 2008, ⟨10.1109/TEST.2008.4700704⟩
Poster de conférence
lirmm-00375077v1
|
Principe de la stimulation électrique fonctionnelle. Exemples d'application thérapeuthique.Techniques de l'Ingénieur, RE127, pp.12, 2009
Chapitre d'ouvrage
lirmm-00395562v1
|
System and Method for Wirelessly Testing Integrated CircuitsSpain, Patent n° : EP 08290891 WO 2010031879 (A1). 2008, pp.N/A
Brevet
lirmm-00767777v1
|
|
Device for Distributing Power between Cathodes of a Multipolar Electrode, in Particular of an ImplantFrance, Patent n° : WO2006027473 A1. 2006, pp.1-70
Brevet
lirmm-00389558v1
|
|
Dispositif de répartition de courant entre des cathodes d'une électrode multipolaire, notamment d'un implantFrance, N° de brevet: N°04 09351. 2004
Brevet
lirmm-00108588v1
|