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Analytical Study of Performances of Bilayer and Monolayer Graphene FETs based on Physical Mechanisms

 J.D. Aguirre-Morales , C. Mukherjee , Sebastien Fregonese , C. Maneux , T. Zimmer
Graphene week, May 2014, Toulouse, France. pp.1-3
Communication dans un congrès hal-01002504v1

TCAD Calibration of High-Speed Si/SiGe HBTs in 55-nm BiCMOS

 T. Vu , D. Celi , T. Zimmer , S. Fregonese , P. Chevalier
PriMe 2016, Oct 2016, Honolulu, United States. pp.113 - 119, ⟨10.1149/07508.0113ecst⟩
Communication dans un congrès hal-01399104v1
Image document

SiGe-based Nanowire HBT for THz Applications

 Soumya Ranjan Panda , Sebastien Fregonese , Anjan Chakravorty , Thomas Zimmer
IEEE Electron Devices Technology and Manufacturing (IEEE EDTM) Conference 2023, Mar 2023, SEOUL, South Korea
Communication dans un congrès hal-04037313v1

Collector-substrate modeling of SiGe HBTs up to THz range

 Bishwadeep Saha , Sébastien Frégonèse , Soumya Ranjan Panda , Anjan Chakravorty , Didier Celi , et al.
2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), Nov 2019, Nashville, France. pp.1-4, ⟨10.1109/BCICTS45179.2019.8972745⟩
Communication dans un congrès hal-02532693v1
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Characterization of Sub-THz and THz Transistors

 Abhishek Kumar Upadhyay , Marco Cabbia , Sebastien Fregonese , Marina Deng , Magali de Matos , et al.
IEEE BEE WEEK 2019, Dec 2019, Bordeaux, France. 2019
Poster de conférence hal-02396565v1
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Static Thermal Coupling Factors in Multi-Finger Bipolar Transistors: Part I—Model Development

 Aakashdeep Gupta , K Nidhin , Suresh Balanethiram , Shon Yadav , Anjan Chakravorty , et al.
Electronics, 2020, 9 (9), pp.1333. ⟨10.3390/electronics9091333⟩
Article dans une revue hal-02920341v1
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Guideline for test-structures placement for on-Wafer calibration in sub-THz Si device characterization

 Chandan Yadav , Marco Cabbia , Sebastien Fregonese , Marina Deng , Magali de Matos , et al.
2021 IEEE/MTT-S International Microwave Symposium - IMS 2021, Jun 2021, Atlanta, United States. pp.511-514, ⟨10.1109/IMS19712.2021.9574928⟩
Communication dans un congrès hal-03851109v1

Optically-Gated CNTFET compact model including source and drain Schottky barrier

 Si-Yu Liao , Montassar Najari , Cristell Maneux , Sebastien Fregonese , Thomas Zimmer , et al.
5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, Mar 2010, Hammamet, Tunisia. pp.1
Communication dans un congrès hal-00584845v1

Limitations of on-wafer calibration and de-embedding methods in the sub-THz range

 M. Potereau , C. Raya , Magali de Matos , Sébastien Fregonese , Arnaud Curutchet , et al.
ECC 2013 conference, Nov 2013, Sanya, China
Communication dans un congrès hal-00909399v1

A Scalable Model for Temperature Dependent Thermal Resistance of SiGe HBTs

 Kumar Sahoo Amit , Sebastien Fregonese , Mario Weib , Cristell Maneux , Thomas Zimmer
IEEE Bipolar / BiCMOS Circuits and Technology Meeting, Sep 2013, Bordeaux, France
Communication dans un congrès hal-00905673v1

Graphene Transistor-Based Active Balun Architectures

 Thomas Zimmer , Sebastien Fregonese
IEEE Transactions on Electron Devices, 2015, 62 (9), ⟨10.1109/TED.2015.2457496⟩
Article dans une revue hal-01235955v1

Qualitative Assessment of Epitaxial Graphene FETs on SiC Substrates via Pulsed Measurements and Temperature Variation

 Mukherjee Chhandak , Sebastien Fregonese , Thomas Zimmer , H. Happy , David Mele , et al.
Solid State Device Research Conference (ESSDERC), 2014, 44th European, Sep 2014, Venise, Italy. ⟨10.1109/ESSDERC.2014.6948821⟩
Communication dans un congrès hal-01090864v1

2.5GHz integrated graphene RF power amplifier on SiC substrate

 T. Hanna , N. Deltimple , S. Khenissa , E. Pallecchi , H. Happy , et al.
Solid-State Electronics, 2016, ⟨10.1016/j.sse.2016.10.002⟩
Article dans une revue hal-01399069v1

Prospects for Complementary SiGeC BiCMOS on Thin-Film SOI

 Alain Chantre , Laurence Boissonnet , Gregory Avenier , Gael Borot , Pierre Bouillon , et al.
ECS Transactions, Oct 2006, Cancun, Mexico. pp. 355-363
Communication dans un congrès hal-00181206v1

Modélisation thermique des TBH SiGe destinés à des applications radiofréquences

 Hassene Mnif , Thomas Zimmer , Jean Luc Battaglia , Sébastien Fregonese
Conférence Internationale Sciences Electroniques, Technologies de l'Information et des Télécommunications, 2003, Tunisie. pp.1
Communication dans un congrès hal-00181988v1

A Hicum SOI extension

 Sébastien Fregonese , Gregory Avenier , Cristell Maneux , A. Chantre , Thomas Zimmer
5th European HICUM Workshop, 2005, France
Communication dans un congrès hal-00181989v1

Analytic Estimation of Thermal Resistance in HBTs

 Anjan Chakravorty , Rosario d'Esposito , Suresh Balanethiram , Sebastien Fregonese , Thomas Zimmer
IEEE Transactions on Electron Devices, 2016, 63 (8), pp.2994 - 2998. ⟨10.1109/TED.2016.2572959⟩
Article dans une revue hal-01399079v1

Compact Model of a Dual Gate CNTFET: Description and Circuit Application

 Johnny Goguet , Sebastien Fregonese , Cristell Maneux , Thomas Zimmer
8th IEEE Conference on Nanotechnology, Aug 2008, Arlington, TEXAS, USA, United States. pp.Page(s):388 - 389, ⟨10.1109/TED.2007.902719⟩
Communication dans un congrès hal-00319955v1

CNTFET modeling and reconfigurable logic circuit design

 Ian O'Connor , Junchen Liu , Frédéric Gaffiot , Fabien Prégaldiny , Cristell Maneux , et al.
IEEE Transactions on Circuits and Systems, 2007, 54 (11), pp.2365-2379. ⟨10.1109/TCSI.2007.907835⟩
Article dans une revue hal-00187137v1

Challenges and potential of new approaches for reliability assessment of nanotechnologies

 L. Bechou , Y. Danto , J.Y. Deletage , F. Verdier , Y. Deshayes , et al.
Comptes Rendus de l'Academie des Sciences. Série IV, Physique, Astronomie, 2008, pp.95-109
Article dans une revue hal-00266387v1

TCAD modeling of NPN-SI-BJT electrical performance improvement through SiGe extrinsic stress layer

 Al-Sadi Mahmoud , Sébastien Fregonese , Cristell Maneux , Thomas Zimmer
Materials Science in Semiconductor Processing, 2010, 13 (5-6), pp. 344-348. ⟨10.1016/j.mssp.2011.03.002⟩
Article dans une revue istex hal-00671678v1

Characterization of self-heating in Si-Ge HBTs with pulse, DC and AC measurements

 Amit Kumar Sahoo , Sébastien Fregonese , Mario Weiss , Brice Grandchamp , Nathalie Malbert , et al.
Solid-State Electronics, 2012, 76, pp.13-18. ⟨10.1016/j.sse.2012.04.039⟩
Article dans une revue istex hal-00978797v1

A compact model for SiGe HBT on thin film SOI

 Sébastien Fregonese , Gregory Avenier , Cristell Maneux , A. Chantre , Thomas Zimmer
IEEE Transactions on Electron Devices, 2006, 53 (2), pp.296-303
Article dans une revue hal-00181969v1

Toward compact model of Optical-Gated Carbon Nanotube Field Effect Transistor (OG-CNTFET)

 Si-Yu Liao , Cristell Maneux , Sébastien Fregonese , Thomas Zimmer
JNTE 08, French Symposium on Emerging Technologies for micro-nanofabrication, Nov 2008, Toulouse, France
Communication dans un congrès hal-00337487v1

Implementation of Electron–Phonon Scattering in a CNTFET Compact Model

 Sebastien Fregonese , Johnny Goguet , Cristell Maneux , Thomas Zimmer
IEEE Transactions on Electron Devices, 2009, 56 (6), pp.1184-1190
Article dans une revue hal-00388046v1

Pulsed radio frequency characterisation on 28 nm complementary metal–oxide semiconductor technology

 A.K. Sahoo , S. Fregonese , P. Scheer , D. Celi , A. Juge , et al.
Electronics Letters, 2015, 51 (1), pp.2. ⟨10.1049/el.2014.3634⟩
Article dans une revue hal-01100656v1

Nouvelles structures 3D pour calibrage TRL sur puces adaptées à la mesure de paramètres S très hautes fréquences

 Manuel Potereau , Sebastien Fregonese , Arnaud Curutchet , Peter Baureis , Thomas Zimmer
Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM2015), May 2015, Talence, France
Communication dans un congrès hal-01163604v1

Schottky barrier carbon nanotube transistor: Compact modeling, scaling study, and circuit design applications

 Montassar Najari , Sebastien Fregonese , Cristell Maneux , H. Mnif , N. Masmoudi , et al.
IEEE Transactions on Electron Devices, 2011, pp.195-205. ⟨10.1109/TED.2010.2084351⟩
Article dans une revue hal-00584876v1

Extracting the temperature dependence of thermal resistance from temperature-controlled DC measurements of sige HBTs

 Suresh Balanethiram , Rosario d'Esposito , Sebastien Fregonese , Thomas Zimmer , Jorg Berkner , et al.
2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Oct 2017, Miami, France. ⟨10.1109/BCTM.2017.8112919⟩
Communication dans un congrès hal-01695326v1

A Test Structure Set for on-wafer 3D-TRL calibration

 Manuel Potéreau , Arnaud Curutchet , Rosario d'Esposito , Magali de Matos , Sebastien Fregonese , et al.
2016 International Conference on Microelectronic Test Structures (ICMTS), Mar 2016, Yokohama, Japan
Communication dans un congrès hal-01399900v1
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