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366 résultats
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A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADCIEEE Transactions on Circuits and Systems I: Regular Papers, 2016, ⟨10.1109/TCSI.2016.2602387⟩
Article dans une revue
hal-01447789v1
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Interpretation of 28 nm FD-SOI quantum dot transport data taken at 1.4 K using 3D Quantum TCAD simulations8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS 2022), May 2022, Udine, Italy. ⟨10.1016/j.sse.2022.108355⟩
Communication dans un congrès
hal-03765899v1
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Technologies and fabrication processes for microsystemsForum and exhibition on microtechnologies: from Microsystems to measurements of micro- and nano-mechanical properties of materials, May 1998, Liège, Belgium
Communication dans un congrès
hal-01400079v1
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A brief on analogue on-line checkersElectronic Devices and Systems Conference (EDS'94), Nov 1994, Brno, Czech Republic. pp.198-201
Communication dans un congrès
hal-01400000v1
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Reduced code linearity testing of pipeline ADCsIEEE Design & Test, 2013, 30 (6), pp.80-88. ⟨10.1109/MDAT.2013.2267957⟩
Article dans une revue
hal-01137870v1
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Analogue on-line/off-line test unification for fully differential circuitsIEEE International Mixed Signal Testing Workshop, Jun 1995, Villard-de-Lans, France. pp.56-61
Communication dans un congrès
hal-01215554v1
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Analog/RF test techniques14th European Test Symposium, Test Spring School, May 2014, Paderborn, Germany
Communication dans un congrès
hal-01131375v1
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Output parameter reduction for an efficient evaluation of alternative test techniques28th International Conference on Design of Circuits and Integrated Systems (DCIS'13), San Sebastian, Spain, Nov 2013, San Sebastian, Spain
Communication dans un congrès
hal-01017501v1
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Static linearity BIST for Vcm-based switching SAR ADCs using a reduced-code measurement technique18th IEEE International NEWCAS Conference (NEWCAS 2020), Jun 2020, Montreal, Canada. ⟨10.1109/NEWCAS49341.2020.9159839⟩
Communication dans un congrès
hal-02958196v1
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Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuitsInternational Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Jul 2019, Lausanne, Switzerland. pp.17-20, ⟨10.1109/SMACD.2019.8795238⟩
Communication dans un congrès
hal-02166246v1
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On-chip reduced-code static linearity test of Vcm -based switching SAR ADCs using an incremental analog-to-digital converterIEEE European Test Symposium (ETS 2020), May 2020, Tallinn, Estonia. ⟨10.1109/ETS48528.2020.9131588⟩
Communication dans un congrès
hal-02899891v1
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Evaluation of low-cost mixed-signal test techniques for circuits with long simulation timesIEEE International Test Conference (ITC'15), Oct 2015, Anaheim, CA, United States
Communication dans un congrès
hal-01393838v1
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Circuit and method for on-chip testing of a pixel arrayFrance, Patent n° : 14/60121. 2014
Brevet
hal-01922635v1
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Study of a 3D MEMS-based tactile vibration sensor for the use in the middle ear surgeryInternational Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'10), May 2010, Sevilla, Spain. pp.266-271
Communication dans un congrès
hal-00560467v1
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Optimal ATPG for analogue built-in self-test and fault diagnosisIEEE International Mixed Signal Testing Workshop (IMSTW'95), Jun 1995, Villard-de-Lans, France. pp.80-85
Communication dans un congrès
hal-01215560v1
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Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value ModelIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2020, 39 (5), pp.966-976. ⟨10.1109/TCAD.2019.2907923⟩
Article dans une revue
hal-02089332v1
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A sub-picosecond resolution jitter instrument for GHz frequencies based on a sub-sampling TDA21st IEEE Interregional NEWCAS Conference (NEWCAS 2023), Jun 2023, Edinburgh, United Kingdom. ⟨10.1109/NEWCAS57931.2023.10198132⟩
Communication dans un congrès
hal-04188302v1
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Reduced-code static linearity test of split-capacitor SAR ADCs using an embedded incremental Sigma-Delta converterIEEE Transactions on Device and Materials Reliability, 2019, ⟨10.1109/TDMR.2019.2891298⟩
Article dans une revue
hal-01989117v1
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On-Chip pseudorandom testing for linear and non-linear MEMSReis, Ricardo; Osseiran, Adam; Pfleiderer, Hans-Joerg. VLSI-SOC: From Systems to Silicon, Springer, pp.245-266, Vol. 240, 2007, Collection :: IFIP International Federation for Information Processing, ⟨10.1007/978-0-387-73661-7⟩
Chapitre d'ouvrage
hal-00185934v1
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RF transceiver parameter identification using regressive modelsConference on Design and Technology of Integrated Systems (DTIS'08), Mar 2008, Tozeur, Tunisia. pp.166, ⟨10.1109/DTIS.2008.4540208⟩
Communication dans un congrès
hal-00346692v1
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Current-based testing for high-frequency CMOS operational amplifiersXIII International Conference on Design of Circuits and Integrated Systems (DCIS'98), Nov 1998, Madrid, Spain. pp.438-443
Communication dans un congrès
hal-01384742v1
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Outils de monitoring per-opératoire de la biomécanique ossiculaire par micro-capteur en chirurgie otologique - Etude de faisabilité115eme Congres de la SFORL, Oct 2008, Paris, France
Communication dans un congrès
hal-00367166v1
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Re-engineering hardware specifications by exploiting design semanticsProceedings of EURO-DAC European Design Automation Conference, 1994, Grenoble, France. pp.336-41
Communication dans un congrès
hal-00013314v1
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Design and test of next generation integrated systems embedding MEMSECS'99.-Proceedings-of-the-2nd-Electronics-Circuits-and-Systems-Conference, 1999, Bratislava, Slovakia. pp.301-10
Communication dans un congrès
hal-00013021v1
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Réduction de tests fonctionnels par modélisation statistique des circuits analogiques10th Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM'07), May 2007, France. pp.0
Communication dans un congrès
hal-00521996v1
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Behavioral modeling and simulation of a chemical sensor with its microelectronics front-end interface3rd IEEE International Workshop on Advances in Sensors and Interfaces (IWASI'09), Jun 2009, Trani, Italy. pp.92-97, ⟨10.1109/IWASI.2009.5184776⟩
Communication dans un congrès
hal-00418919v1
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Experimental validation of a BIST technique for CMOS active pixel sensors27th IEEE VLSI Test Symposium (VTS'09), May 2009, Santa Cruz, California, United States. pp.189-194, ⟨10.1109/VTS.2009.30⟩
Communication dans un congrès
hal-00419048v1
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Density Estimation for Analog/RF Test Problem SolvingVLSI Test Symposium (VTS), Apr 2010, 000000, United States
Communication dans un congrès
hal-00490709v1
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Current-testable high-frequency CMOS operational amplifiersProceedings-Eleventh-Annual-IEEE-International-ASIC-Conference-Cat.-No.98TH8372., 1998, Rochester, NY, United States. pp.95-9, ⟨10.1109/ASIC.1998.722810⟩
Communication dans un congrès
hal-00013827v1
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Fault simulation of MEMS using HDLsJournal of Modeling and Simulation of Microsystems, 2001, 2(1), pp.35-42
Article dans une revue
hal-00012870v1
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