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98

Rodrigo POSSAMAI BASTOS


 

  • Doctoral thesis supervisions
    • (8) Tarso Kraemer Sarzi Sartori (2020-2023):
      • Mitigation of radiation effects on the attitude estimation processing of autonomous things
    • (7) Matheus Garay Trindade (2018-2021):
      • Assessment of edge machine-learning systems under radiation-induced effects
    • (6) Ricardo Aquino Guazzelli (2017-2020):
      • Test and side-channel analysis of asynchronous circuits
    • (5) Otto Aureliano Rolloff (2015-2019):
      • Distributed body-bias micro-generators for an activity-driven power management in FD-SOI technologies
    • (4) Thiago Ferreira de Paiva Leite (2015-2018):
      • Energy efficiency opportunities of FD-SOI technology for asynchronous circuits
    • (3) Raphael Andreoni Camponogara Viera (2015-2018):
      • Modeling and simulating the effects of laser fault injection on integrated circuits
    • (2) Jean Simatic (2014-2017):
      • Design flow for ultra-low power: nonuniform sampling and asynchronous circuits
    • (1) Leonel Acunha Guimarães (2014-2017):
      • Testing techniques for detection of hardware Trojans in integrated circuits of trusted systems
  • Master-level thesis supervisions
    • (12) Luiz Henrique Laurini (2022):
      • Assessment of tiny machine-learning computing systems under neutron radiation effects
    • (11) Guilherme Akira Alves dos Santos (2022):
      • Development and calibration of platform for testing computing system under neutron radiation
    • (10) Marti Gorchs Picas (2021-2022):
      • Analysis of medium-earth orbit radiation effects in spacecraft digital systems
    • (9) Marcelo Correa Cueto (2020-2021):
      • Analysis of medium-earth orbit radiation effects in multicore system for spacecraft
    • (8) Joao Sales Brum (2020-2021):
      • Soft error evaluation of attitude estimation algorithm in multicore computing system
    • (7) Jiaru Lin (2020-2021):
      • Test and analysis of multicore computing system under radiation effects
    • (6) Djeson Pascal-Valette (2020-2021):
      • Calibration board for radiation tests of electronic components under neutron beam instrument
    • (5) Matheus Garay Trindade (2017-2018):
      • Qualification of supervised learning models under radiation-induced effects
    • (4) Raphael Andreoni Camponogara Viera (2015):
      • Evaluation of new FD-SOI standard cells under the effects of malicious laser-induced transient faults
    • (3) Thiago Ferreira de Paiva Leite (2015):
      • Design of new digital signal processing subsystems by using FD-SOI technology and asynchronous features
    • (2) Otto Aureliano Rolloff (2014):
      • Design and evaluation of standard cells for asynchronous integrated circuits in low-power nanotechnology
    • (1) Ahmad Al Youssef (2013):
      • Evaluating the effectiveness of techniques for detection of transient faults
  • Publications


Books1 document

Habilitation à diriger des recherches1 document

  • Rodrigo Possamai Bastos. Exploiting Body Terminals of Transistors for Performing Post-Fabrication Tests, Run-Time Tests, and Self-Adaptive Bias in Integrated Circuits. Micro and nanotechnologies/Microelectronics. Université de Grenoble, 2018. ⟨tel-02989324⟩

Theses1 document

  • Rodrigo Possamai Bastos. Transient-Fault Robust Systems Exploiting Quasi-Delay Insensitive Asynchronous Circuits. Micro and nanotechnologies/Microelectronics. Institut National Polytechnique de Grenoble - INPG, 2010. English. ⟨tel-00541344⟩

Journal articles23 documents

  • Tarso Kraemer Sarzi Sartori, Hassen Fourati, Manon Létiche, Rodrigo Possamai Bastos. Assessment of Radiation Effects on Attitude Estimation Processing for Autonomous Things. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2022, 69 (7), pp.1610-1617. ⟨10.1109/TNS.2022.3176676⟩. ⟨hal-03675920⟩
  • Rodrigo Possamai Bastos, Matheus Garay Trindade, Rafael Garibotti, Jonas Gava, Ricardo Reis, et al.. Assessment of Tiny Machine-Learning Computing Systems under Neutron-Induced Radiation Effects. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2022, pp.1-1. ⟨10.1109/TNS.2022.3176485⟩. ⟨hal-03676824⟩
  • Vitor Bandeira, Jack Sampford, Rafael Garibotti, Matheus Garay Trindade, Rodrigo Possamai Bastos, et al.. Impact of radiation-induced soft error on embedded cryptography algorithms. Microelectronics Reliability, Elsevier, 2021. ⟨hal-03375914⟩
  • Matheus Garay Trindade, Fabio Benevenuti, M. Letiche, J. Beaucour, F. Kastensmidt, et al.. Effects of thermal neutron radiation on a hardware-implemented machine learning algorithm. Microelectronics Reliability, Elsevier, 2021, 116 (114022), ⟨10.1016/j.microrel.2020.114022⟩. ⟨hal-03094007⟩
  • Raphael Andreoni Camponogara-Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos. Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault-Injection. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2020, 39 (6), pp.1231-1244. ⟨10.1109/TCAD.2019.2928972⟩. ⟨hal-02299068⟩
  • Rodrigo Possamai Bastos, Jean-Max Dutertre, Matheus Garay Trindade, Raphael Andreoni Camponogara-Viera, Olivier Potin, et al.. Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron Induced Transients. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1404-1411. ⟨10.1109/tns.2020.2975923⟩. ⟨hal-02482517⟩
  • R. Aquino Guazzelli, Matheus Garay Trindade, L. Acunha Guimaraes, Thiago Ferreira de Paiva Leite, Laurent Fesquet, et al.. Trojan Detection Test for Clockless Circuits. Journal of Electronic Testing: : Theory and Applications, Springer Verlag, 2020. ⟨hal-02472910⟩
  • R. Aquino Guazzelli, Matheus Garay Trindade, Laurent Fesquet, Rodrigo Possamai Bastos. Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits. Microelectronics Reliability, Elsevier, 2019, 100, ⟨10.1016/j.microrel.2019.06.057⟩. ⟨hal-03080316⟩
  • Matheus Garay Trindade, A. Coelho, C. Valadares, Raphael Andreoni Camponogara-Viera, Solenne Rey, et al.. Assessment of a Hardware-Implemented Machine Learning Technique under Neutron Irradiation. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2019, 66 (7), pp.1441-1448. ⟨10.1109/TNS.2019.2920747⟩. ⟨hal-02193158⟩
  • Erik Kerstel, Arnaud Gardelein, Mathieu Barthelemy, Yves Gilot, Etienne Lecoarer, et al.. Nanobob: a CubeSat mission concept for quantum communication experiments in an uplink configuration. European physical journal quantum technology, Springer, 2018, 5 (6), pp.1-30. ⟨10.1140/epjqt/s40507-018-0070-7⟩. ⟨hal-01929079⟩
  • Raphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, et al.. Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults. Microelectronics Reliability, Elsevier, 2018, 88-90, pp.128-134. ⟨10.1016/j.microrel.2018.07.111⟩. ⟨hal-01893676⟩
  • Thiago Ferreira de Paiva Leite, Laurent Fesquet, Rodrigo Possamai Bastos. A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems. Microelectronics Reliability, Elsevier, 2018, 88-90, pp.122-127. ⟨hal-01893707⟩
  • Raphael Andreoni Camponogara-Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe Maurine, Rodrigo Iga Jadue. Method for evaluation of transient-fault detection techniques. Microelectronics Reliability, Elsevier, 2017, 76-77, pp.68-74. ⟨10.1016/j.microrel.2017.07.007⟩. ⟨lirmm-01690185⟩
  • Rodrigo Possamai Bastos, Leonel Acunha Guimaraes, Frank Sill Torres, Laurent Fesquet. Architectures of Bulk Built-In Current Sensors for Detection of Transient Faults in Integrated Circuits. Microelectronics Journal, Elsevier, 2017, 71, pp.70-79. ⟨10.1016/j.mejo.2017.11.006⟩. ⟨hal-01721110⟩
  • R. O. Rocha, F.S. Torres, Rodrigo Possamai Bastos. Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors. Microelectronics Reliability, Elsevier, 2017. ⟨hal-01721108⟩
  • O. Rolloff, Rodrigo Possamai Bastos, Laurent Fesquet. Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology. Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.1302-1306. ⟨10.1016/j.microrel.2015.07.028⟩. ⟨hal-01334697⟩
  • Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, et al.. Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. Microelectronics Reliability, Elsevier, 2014, 54 (9-10), pp.2289-2294. ⟨10.1016/j.microrel.2014.07.151⟩. ⟨emse-01094805⟩
  • Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, et al.. Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. Microelectronics Reliability, Elsevier, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. ⟨10.1016/j.microrel.2013.07.069⟩. ⟨emse-01100723⟩
  • Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Feng Lu, Bruno Rouzeyre. A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic. Journal of Electronic Testing: : Theory and Applications, Springer Verlag, 2013, 29, pp.331-340. ⟨10.1007/s10836-013-5359-y⟩. ⟨lirmm-00838389⟩
  • F.S. Torres, Rodrigo Possamai Bastos. Detection of Transient Faults in Nanometer Technologies by using Modular Built-In Current Sensors. Journal of Integrated Circuits and Systems, Brazilian Microelectronics Society, 2013, 8 (2), pp.89-97. ⟨hal-00920428⟩
  • Rodrigo Possamai Bastos, Frank Sill Torres, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Novel Transient-Fault Detection Circuit Featuring Enhanced Bulk Built-in Current Sensor with Low-Power Sleep Mode. Microelectronics Reliability, Elsevier, 2012, 52 (9-10), pp.1781-1786. ⟨10.1016/j.microrel.2012.06.149⟩. ⟨lirmm-00715117⟩
  • Rodrigo Possamai Bastos, G. Sicard, F. Kastensmidt, Marc Renaudin, Ricardo Reis. Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies. Microelectronics Reliability, Elsevier, 2010, 50 (9-11), pp.1241-1246. ⟨10.1016/j.microrel.2010.07.014⟩. ⟨hal-00569838⟩
  • Rodrigo Possamai Bastos, F. Kastensmidt, Ricardo Reis. Design of a soft-error robust microprocessor. Microelectronics Journal, Elsevier, 2008, 40 (7), pp.1062-1068. ⟨10.1016/j.mejo.2008.10.001⟩. ⟨hal-00873149⟩

Book sections1 document

  • Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis. Designing Low-Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2005. Lecture Notes in Computer Science, vol 3728. Springer, Berlin, Heidelberg, pp.59-68, 2005, ⟨10.1007/11556930_7⟩. ⟨hal-03039091⟩

Conference papers67 documents

  • Alejandro Serrano-Cases, Antonio Martinez-Alvarez, Rodrigo Possamai Bastos, Sergio Cuenca-Asensi. Redundant Portable Multi-Threading for Soft Error Mitigation on Multicore Systems on Chip. Conference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy. ⟨hal-03688771⟩
  • Jonas Gava, Geancarlo Abich, Rafael Garibotti, Sergio Cuenca-Asensi, Rodrigo Possamai Bastos, et al.. A Lightweight Mitigation Technique for Resource-constrained Devices under Neutron Radiation. Conference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy. ⟨hal-03688765⟩
  • Fabio Benevenuti, Marcio Goncalves, Evaldo Carlos Pereira Jr, Rafael Vaz, O.L. Gonçalez, et al.. Investigating the Reliability Impacts of Neutron-induced Soft Errors in Aerial Image Classification CNNs Implemented in a Softcore SRAM-based FPGA GPU. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2022), Sep 2022, Berlin, Germany. ⟨hal-03688778⟩
  • Jonas Gava, Nicolas Moura, Vinicius da Rocha, Rafael Garibotti, Sergio Cuenca-Asensi, et al.. Assessment of Radiation-Induced Soft Error on Lightweight Cryptography Algorithms. Conference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy. ⟨hal-03688760⟩
  • Tarso Kraemer Sarzi Sartori, Hassen Fourati, Anuj Justus Rajappa, Philippe Reiter, Rodrigo Possamai Bastos. Effectiveness of Attitude Estimation Processing Approaches in Tolerating Radiation Soft Errors. RADECS 2022 - Conference on Radiation Effects on Components and Systems, Oct 2022, Venise, Italy. ⟨hal-03688756⟩
  • Rodrigo Possamai Bastos, Marti Gorchs Picas, Marcelo Correa Cueto, Raoul Velazco. MEO Spaceflight Results of Radiation Effects in COTS FPGA-implemented Triple Modular System. Conference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy. ⟨hal-03688775⟩
  • Rodrigo Possamai Bastos. Radiation effects in tiny machine learning systems and attitude estimation processing modules for autonomous things. 17th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA 2021), Nov 2021, Virtual event, Brazil. ⟨hal-03621516⟩
  • Fabrice Pancher, Vanessa Carolina Vargas Vallejo, Pablo Francisco Ramos Vargas, Rodrigo Possamai Bastos, David César Ardiles Saravia, et al.. Nanosatellite On-Board Computer including a Many-Core Processor. IEEE Latin-American Test Symposium (LATS 2021), Oct 2021, Virtual event, Uruguay. ⟨hal-03387930⟩
  • Vitor Bandeira, Jack Sampford, Rafael Garibotti, Matheus Garay Trindade, Rodrigo Possamai Bastos, et al.. Impact of radiation-induced soft error on embedded cryptography algorithms. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Oct 2021, Bordeaux, France. ⟨hal-03375885⟩
  • Tarso Kraemer Sarzi Sartori, Hassen Fourati, Matheus Garay Trindade, Rodrigo Possamai Bastos. Assessment of Attitude Estimation Processing System under Neutron Radiation Effects. RADECS 2021 - Conference on Radiation Effects on Components and Systems, Sep 2021, Vienna, Austria. ⟨hal-03375701⟩
  • Joao Paolo Sales Brum, Tarso Kraemer Sarzi Sartori, Jiaru Lin, Matheus Garay Trindade, Hassen Fourati, et al.. Evaluation of Attitude Estimation Algorithm under Soft Error Effects. LATS 2021 - IEEE Latin-American Test Symposium, Oct 2021, Punta del Este (Virtual event), Uruguay. ⟨10.1109/LATS53581.2021.9651794⟩. ⟨hal-03375744⟩
  • Matheus Garay Trindade, Joao Paolo Sales Brum, Liége Maldaner, Rafael Garibotti, Luciano Ost, et al.. Assessment of Machine Learning Models in Computing System under Neutron Radiation. RADECS 2021 - Conference on Radiation Effects on Components and Systems, Sep 2021, Vienna, Austria. ⟨hal-03375695⟩
  • Matheus Garay Trindade, Rafael Garibotti, Luciano Ost, M. Letiche, J. Beaucour, et al.. Assessment of Machine Learning Algorithms for Near-Sensor Computing Under Radiation Soft Errors. 16th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA 2020), Dec 2020, Porto Alegre (Virtual edition), Brazil. ⟨hal-03100531⟩
  • Laurent Fesquet, Yoan Decoudu, Rodrigo Iga Jadue, Thiago Ferreira de Paiva Leite, O. Rolloff, et al.. Body-Bias Micro-Generators for Activity-Driven Power Management. FDSOI workshop at DATE Conference 2020, Mar 2020, Grenoble, France. ⟨hal-02956260⟩
  • Matheus Garay Trindade, Rafael Garibotti, Luciano Ost, M. Letiche, J. Beaucour, et al.. Assessment of Machine Learning Algorithms for Near-Sensor Computing Under Radiation Soft Errors. IEEE International conference on electronics, circuits & systems (ICECS 2020), Nov 2020, Glasgow, SCOTLAND, United Kingdom. ⟨hal-02988115⟩
  • Rodrigo Possamai Bastos, Jean-Max Dutertre, Matheus Garay Trindade, Raphael Andreoni Camponogara-Viera, Olivier Potin, et al.. Assessment of Current Sensor on Chip for Detecting Neutron-Induced Transients via Body Terminals. Conference on Radiation Effects on Components and Systems (RADECS 2019), Sep 2019, Montpellier, France. ⟨hal-02299066⟩
  • Laurent Fesquet, Yoan Decoudu, Rodrigo Iga Jadue, Thiago Ferreira de Paiva Leite, O. Rolloff, et al.. A Distributed Body-Biasing Strategy for Asynchronous Circuits. 27th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC 2019), Oct 2019, Cuzco, Peru. ⟨hal-02170157⟩
  • Matheus Garay Trindade, Rodrigo Possamai Bastos. On the reliability of Support Vector Machines. 21èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Jun 2019, Montpellier, France. ⟨hal-03100549⟩
  • R. Aquino Guazzelli, Matheus Garay Trindade, Laurent Fesquet, Rodrigo Possamai Bastos. Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits. 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), Aug 2019, Toulouse, France. ⟨hal-02165113⟩
  • R. Aquino Guazzelli, Matheus Garay Trindade, Laurent Fesquet, Rodrigo Possamai Bastos. Exploring a Non-conventional Testing Technique for Asynchronous Circuits. 21èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Jun 2019, Montpellier, France. ⟨hal-03100560⟩
  • Rodrigo Iga Jadue, Rodrigo Possamai Bastos, Thiago Ferreira de Paiva Leite, Otto Rolloff, Mamadou Diallo, et al.. Level Shifter Architecture for Dynamically Biasing Ultra-Low Voltage Subcircuits of Integrated Systems. IEEE International Symposium on Circuits & Systems (ISCAS 2018), May 2018, Florence, Italy. ⟨hal-01726964⟩
  • Raphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Philippe Maurine, Rodrigo Possamai Bastos. Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits. ISPD 2018 - International Symposium on Physical Design, Mar 2018, Monterey, CA, United States. pp.160-167, ⟨10.1145/3177540.3178243⟩. ⟨lirmm-01743368⟩
  • Thiago Ferreira de Paiva Leite, Laurent Fesquet, Rodrigo Possamai Bastos. A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'2018), Oct 2018, Aalborg, Denmark. ⟨hal-01986346⟩
  • Leonel Acunha Guimarães, Rodrigo Possamai Bastos, Thiago Ferreira de Paiva Leite, Laurent Fesquet. A Non-Intrusive Testing Technique for Detection of Trojans in Asynchronous Circuits. Design, Automation and Test in Europe (DATE 2018), Mar 2018, Dresden, Germany. pp.1516-1519. ⟨hal-01726979⟩
  • Matheus Garay Trindade, A. Coelho, C. Valadares, Raphael Andreoni Camponogara-Viera, Solenne Rey, et al.. Assessment of Hardware-Implemented Support Vector Machine under Radiation Effects. Conference on Radiation Effects on Components and Systems (RADECS'2018), Sep 2018, Gothenburg, Sweden. ⟨hal-01996777⟩
  • Thiago Ferreira de Paiva Leite, Rodrigo Iga Jadue, Sylvain Engels, Rodrigo Possamai Bastos, Laurent Fesquet. Fine Grain Body-Biasing: A strategy for asynchronous circuits. Application, Design and Technology Conference (ADTC 2018), Jun 2018, Grenoble, France. ⟨hal-01828009⟩
  • Raphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Rodrigo Possamai Bastos, Philippe Maurine. Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation. DSD 2017 - Euromicro Symposium on Digital System Design, Aug 2017, Vienna, Austria. pp.252-259, ⟨10.1109/DSD.2017.43⟩. ⟨lirmm-01699776⟩
  • Rodrigo Iga Jadue, Thiago Ferreira de Paiva Leite, Rodrigo Possamai Bastos, O. Rolloff, Mamadou Diallo, et al.. Layout Strategies for Body Bias Islands in FD-SOI Systems. 20th International IP-SoC Conference and Exhibition (IP-SOC 2017), Dec 2017, Grenoble, France. ⟨hal-01721571⟩
  • Jean Simatic, Abdelkarim Cherkaoui, Bertrand François, Rodrigo Possamai Bastos, Laurent Fesquet. A practical framework for specification, verification and design of self-timed pipelines. 23rd IEEE International Symposium on Asynchronous Circuits and Systems (Async 2017), May 2017, San Diego, CA, United States. pp.65-72, ⟨10.1109/ASYNC.2017.16⟩. ⟨hal-01512247⟩
  • Raphael Andreoni Camponogara-Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos. Importance of IR Drops on the Modeling of Laser-Induced Transient Faults. SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jun 2017, Giardini Naxos, Italy. ⟨10.1109/SMACD.2017.7981593⟩. ⟨hal-01721087⟩
  • Leonel Acunha Guimarães, Rodrigo Possamai Bastos, Laurent Fesquet. Detection of Layout-Level Trojans by Monitoring Substrate with Preexisting Built-in Sensors. IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2017), Jul 2017, Bochum, Germany. pp.290-295, ⟨10.1109/ISVLSI.2017.58⟩. ⟨hal-01627346⟩
  • Otto Rolloff, Rodrigo Iga Jadue, Thiago Ferreira de Paiva Leite, Rodrigo Possamai Bastos, Laurent Fesquet. Body Bias Control Cells based on Negative- and Positive-Level Shifter Architectures in Technology FD-SOI 28 nm. Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2017), Nov 2017, Strasbourg, France. ⟨hal-01721072⟩
  • Rodrigo Iga Jadue, Thiago Ferreira de Paiva Leite, O. Rolloff, Rodrigo Possamai Bastos, Laurent Fesquet. Fine Body Biasing Island Strategy in FD-SOI. IP-SoC Conference, Dec 2017, Grenoble, France. ⟨hal-01827903⟩
  • Raphael Andreoni Camponogara-Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe Maurine. Method for evaluation of transient-fault detection techniques. ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France. ⟨hal-01721081⟩
  • O. Rolloff, T. Ferreira de Paiva Leite, Rodrigo Possamai Bastos, Laurent Fesquet. Analysis of granularity for automatic biasing control in FDSOI technology with low-voltage supply. Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique (JNRDM'16), May 2016, Toulouse, France. ⟨hal-01524090⟩
  • Jean Simatic, Abdelkarim Cherkaoui, Rodrigo Possamai Bastos, Laurent Fesquet. New asynchronous protocols for enhancing area and throughput in bundle-data pipelines. 29th Symposium on Integrated Circuits and Systems Design (SBCCI 2016), Aug 2016, Belo Horizonte, Brazil. pp.1-6, ⟨10.1109/SBCCI.2016.7724066⟩. ⟨hal-01345749⟩
  • Leonel Acunha Guimarães, Rodrigo Possamai Bastos, Thiago Ferreira de Paiva Leite, Laurent Fesquet. Simple Tri-State Logic Trojans Able to Upset Properties of Ring Oscillators. 11th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS'16), Apr 2016, Istanbul, Turkey. pp.1-6, ⟨10.1109/DTIS.2016.7483811⟩. ⟨hal-01431177⟩
  • T. Ferreira de Paiva Leite, Rodrigo Possamai Bastos, Laurent Fesquet. QDI asynchronous circuits for low power applications: a comparative study in technology FD-SOI 28 nm. Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique (JNRDM'16), May 2016, Toulouse, France. ⟨hal-01524092⟩
  • T. Ferreira de Paiva Leite, Rodrigo Possamai Bastos, Rodrigo Iga Jadue, Laurent Fesquet. Comparison of Low-Voltage Scaling in Synchronous and Asynchronous FD-SOI Circuits. 26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS'16), Sep 2016, Bremen, Germany. ⟨hal-01524087⟩
  • Jean Simatic, Rodrigo Possamai Bastos, Laurent Fesquet. AHLS_DESYNC: A Desynchronization Tool For High-Level Synthesis of Asynchronous Circuits. Design, Automation and Test in Europe (DATE 2016), Mar 2016, Dresden, Germany. ⟨hal-01293842⟩
  • Jean Simatic, Rodrigo Possamai Bastos, Laurent Fesquet. High-level synthesis for event-based systems. Second International Conference on Event-Based Control, Communications, and Signal Processing (EBCCSP 2016), Jun 2016, Krakow, Poland. pp.1-7, ⟨10.1109/EBCCSP.2016.7605252⟩. ⟨hal-01345745⟩
  • O. Rolloff, Rodrigo Possamai Bastos, Laurent Fesquet. Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology. 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'15), Oct 2015, Toulouse, France. ⟨hal-01393437⟩
  • L. Acunha Guimaraes, Rodrigo Possamai Bastos, Laurent Fesquet. A New Proposition on Hardware Trojan Activation. Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'15), May 2015, Bordeaux, France. ⟨hal-01524097⟩
  • Raphael Andreoni Camponogara-Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Olivier Potin, Marie-Lise Flottes, et al.. Validation Of Single BBICS Architecture In Detecting Multiple Faults. ATS: Asian Test Symposium, Nov 2015, Mumbai, India. ⟨lirmm-01234067⟩
  • J.G.M. Melo, F.S. Torres, Rodrigo Possamai Bastos. Exploration of Noise Robustness and Sensitivity of Bulk Current Sensors for Soft Error Detection. International Workshop on CMOS Variability (VARI'15), Sep 2015, Salvador Bahia, Brazil. pp.13-18. ⟨hal-01414765⟩
  • Jean Simatic, Rodrigo Possamai Bastos, Laurent Fesquet. Flot de conception pour l'ultra-faible consommation : échantillonage non-uniforme et électronique asynchrone. Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'15), May 2015, Bordeaux, France. ⟨hal-01524095⟩
  • Rodrigo Possamai Bastos, Jean-Max Dutertre, Frank Sill Torres. Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity. CMOS variability (VARI), Sep 2014, Palma de Mallorca, Spain. ⟨10.1109/VARI.2014.6957089⟩. ⟨emse-01099015⟩
  • Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, et al.. Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany. ⟨hal-03094235⟩
  • Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, et al.. Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2013, Arcachon, France. pp.B3c-2 #68. ⟨hal-00872705⟩
  • Rodrigo Possamai Bastos, Franck Sill Torres, Jean Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, et al.. A Bulk Built-in Sensor for Detection of Fault Attacks. HOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩. ⟨lirmm-01430800⟩
  • Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, et al.. A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults. PATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2013, Karlsruhe, Germany. pp.157-163, ⟨10.1109/PATMOS.2013.6662169⟩. ⟨lirmm-00968621⟩
  • Frank Sill Torres, Rodrigo Possamai Bastos. Robust Modular Bulk Built-In Current Sensors for Detection of Transient Faults. SBCCI'2012: 25th Symposium onIntegrated Circuits and Systems Design, Aug 2012, Brasilia, Brazil. pp.1-6, ⟨10.1109/SBCCI.2012.6344422⟩. ⟨lirmm-00715122⟩
  • Rodrigo Possamai Bastos, Frank Sill Torres, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode. ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2012, Cagliari, Italy. ⟨hal-00867864⟩
  • Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies. DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.302-308, ⟨10.1109/DFT.2011.15⟩. ⟨lirmm-00701789⟩
  • Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Timing Issues for an Efficient Use of Concurrent Error Detection Codes. LATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6, ⟨10.1109/LATW.2011.5985933⟩. ⟨lirmm-00627427⟩
  • Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios?. RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Sevilla, Spain. pp.635-642, ⟨10.1109/RADECS.2011.6131361⟩. ⟨lirmm-00701776⟩
  • Rodrigo Possamai Bastos, G. Sicard, F. Kastensmidt, Marc Renaudin, Ricardo Reis. Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies. 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2010, Monte Cassino Abbey and Gaeta, Italy. A.p.4. ⟨hal-00867836⟩
  • Rodrigo Possamai Bastos, G. Sicard, F. Kastensmidt, Marc Renaudin, Ricardo Reis. Evaluating transient-fault effects on traditional C-element's implementations. 16th IEEE International On-Line Testing Symposium (IOLTS'10), Jul 2010, Corfu island, Greece. pp.35 - 40, ⟨10.1109/IOLTS.2010.5560237⟩. ⟨hal-00569056⟩
  • Rodrigo Possamai Bastos, G. Sicard, F. Kastensmidt, Marc Renaudin, Ricardo Reis. Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies. Digest of Papers, 15th IEEE European Test Symposium (ETS'10), May 2010, Prague, Czech Republic. ⟨hal-00568749⟩
  • Rodrigo Possamai Bastos, Y. Monnet, G. Sicard, F. Kastensmidt, Marc Renaudin, et al.. Comparing Transient-Fault Effects on Synchronous and on Asynchronous Circuits. 15th IEEE International On-Line Testing Symposium (IOLTS'09), Jun 2009, Sesimbra-Lisbon, Portugal. pp.29-34, ⟨10.1109/IOLTS.2009.5195979⟩. ⟨hal-00419061⟩
  • Rodrigo Possamai Bastos, Y. Monnet, G. Sicard, F. Kastensmidt, Marc Renaudin, et al.. A Methodology to Evaluate Transient-Fault Effects on Asynchronous and Synchronous Circuits. Digest of Papers, 14th IEEE European Test Symposium (ETS'09), May 2009, Sevilla, Spain. ⟨hal-00417840⟩
  • Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo A. L. Reis. Design of a Robust 8-Bit Microprocessor to Soft Single Event Effects. SOUTH SYMPOSIUM ON MICROELECTRONICS, SIM, 21., May 2006, Porto Alegre, Brazil. ⟨hal-03402758⟩
  • Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis. Design of a Robust 8-Bit Microprocessor to Soft Single Event Effects. Digest of Papers, IEEE Latin American Test Workshop, LATW, Mar 2006, Buenos Aires, Argentina. ⟨hal-03039148⟩
  • Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis. Design of a Robust 8-Bit Microprocessor to Soft Errors. 12th IEEE International On-Line Testing Symposium (IOLTS'06), Jul 2006, Como, Italy. pp.195-196, ⟨10.1109/IOLTS.2006.21⟩. ⟨hal-03039298⟩
  • Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis. Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates. ACM Symposium on Integrated Circuits and Systems Design (SBCCI'06), Aug 2006, Ouro Preto, France. pp.196-201, ⟨10.1145/1150343.1150394⟩. ⟨hal-03039303⟩
  • Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis. Designing Low-Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory. International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS'05), Sep 2005, Leuven, Belgium. ⟨hal-03039110⟩
  • Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo A. L. Reis. Designing Low Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory. SOUTH SYMPOSIUM ON MICROELECTRONICS, SIM, 20., May 2005, Santa Cruz do Sul, Brazil. ⟨hal-03402756⟩

Poster communications4 documents

  • Leonel Acunha Guimarães, Rodrigo Possamai Bastos, Laurent Fesquet. Detection of Layout-Level Trojans by Injecting Current Into Substrate and Digitally Monitoring Built-In Sensors. Design Automation Conference, Jun 2017, Austin, TX, United States. ⟨hal-01627374⟩
  • Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Giorgio Di Natale, et al.. Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts. Joint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands. 2014. ⟨emse-01099040⟩
  • Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Calibrating Bulk Built-in Current Sensors for Detecting Transient Faults. Colloque GDR SoC-SiP, 2012, Lyon, France. 2012, Colloque National du Groupement de Recherche System-On-Chip et System-In-Package. ⟨lirmm-00715126⟩
  • Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Timing Issues of Transient Faults in Concurrent Error Detection Schemes. GdR SoC-SiP'2011: Colloque national du Groupement de Recherche System-On-Chip et System-In-Package, Jun 2011, Lyon, France. http://www2.lirmm.fr/~w3mic/SOCSIP/, 2011. ⟨lirmm-00701798⟩