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Rosine COQ GERMANICUS

9

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Identifiants chercheurs

rosine-coq-germanicus
0000-0002-6698-4853
Google Scholar : https://scholar.google.fr/citations?user=eduS62kAAAAJ&hl=fr
IdRef : 072309881

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Publications

"antoinetouboul"

	Failure Analysis of Atmospheric Neutron-Induced Single Event Burnout of a Commercial SiC MOSFET Rosine Coq Germanicus , Kimmo Niskanen , Alain Michez , Niemat Moultif , Wadia Jouha Materials Science Forum, 2022, 1062, pp.544-548. ⟨10.4028/p-973n9u⟩ Article dans une revue hal-03702520v1
	Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation Andrea Coronetti , Ruben Garcia Alia , Jan Budroweit , Tomasz Rajkowski , Israel Da Costa Lopes IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.958-969. ⟨10.1109/TNS.2021.3061197⟩ Article dans une revue hal-03341566v1
	Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment K. Niskanen , Rosine Coq Germanicus , A. Michez , Frédéric Wrobel , Jérôme Boch IEEE Transactions on Nuclear Science, 2021, 68 (8), pp.1623-1632. ⟨10.1109/tns.2021.3077733⟩ Article dans une revue hal-03341565v1
	Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET K. Niskanen , A. Touboul , Rosine Coq Germanicus , A. Michez , A. Javanainen IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1365-1373. ⟨10.1109/TNS.2020.2983599⟩ Article dans une revue hal-03511987v1
	On the effects of a pressure induced amorphous silicon layer on consecutive spreading resistance microscopy scans of doped silicon Rosine Coq Germanicus , Ph. Leclère , Y. Guhel , B. Boudart , Antoine Touboul Journal of Applied Physics, 2015, 117 (24), pp.244306. ⟨10.1063/1.4923052⟩ Article dans une revue hal-01647658v1

	Silicon carbide power MOSFETs under neutron irradiation: Failure In Time demonstration and long term reliability degradation evaluation K. Niskanen , Antoine Touboul , Rosine Coq Germanicus , A. Michez , Frédéric Wrobel 55th IEEE Nuclear Space and Radiation Effects Conference, Jul 2019, San Antonio, United States Communication dans un congrès hal-02446823v1
	Impact of electrical stress and neutron irradiation on reliability of silicon carbide power MOSFET K. Niskanen , Antoine Touboul , Rosine Coq Germanicus , A. Michez , A. Javanainen IEEE RADECS 2019, Sep 2019, Montpellier, France. pp.1365 - 1373, ⟨10.1109/TNS.2020.2983599⟩ Communication dans un congrès hal-02446882v1
	Aging and Gate Bias Effects on TID Sensitivity of Wide Bandgap Power Devices Kimmo Niskanen , Antoine Touboul , Rosine Coq Germanicus , Frédéric Wrobel , F. Saigné IEEE RADECS2018, Sep 2018, Goteborg, Sweden Communication dans un congrès hal-02086450v1
	Identification of stable irradiation-induced defects using low frequency noise spectroscopy Rosine Coq Germanicus , B Cretu , A.D. D Touboul , C. Grygiel , Francoise Bezerra 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2018, Göteborg, Sweden. pp.1-4, ⟨10.1109/RADECS45761.2018.9328657⟩ Communication dans un congrès hal-02475434v1