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SiC Doping Impact during Conducting AFM under Ambient Atmosphere
Christina Villeneuve-Faure
,
Abdelhaq Boumaarouf
,
Vishal Shah
,
Peter Gammon
,
Ulrike Lüders
Article dans une revue
hal-04187713v1
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Selective Oxidation during AFM Electrical Characterization of Doped SiC Layers
Rosine Coq Germanicus
,
Abdelhaq Boumaarouf
,
Christina Villeneuve-Faure
,
Vish Al Shah
,
Peter Gammon
Article dans une revue
hal-04124446v1
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Parametric nano-electrical analysis for SiC junctions of a packaged device
Rosine Coq Germanicus
,
Wadia Jouha
,
Niemat Moultif
,
Peter de Wolf
,
Vishal Shah
Article dans une revue
hal-04124443v1
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Failure of a brittle layer on a ductile substrate: Nanoindentation experiments and FEM simulations
M. Rusinowicz
,
G. Parry
,
F. Volpi
,
D. Mercier
,
S. Eve
Article dans une revue
hal-03708224v1
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Study of the beneficial effects of sodium doping Cu2ZnSnS4 material
M. Marzougui
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H. Hammami
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H. Oueslati
,
R. Coq Germanicus
,
C. Leroux
Article dans une revue
hal-03777821v1
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Electrical Characterizations Based on AFM: SCM and SSRM Measurements with a Multidimensional Approach
Rosine Coq Germanicus
,
U. Lüders
Article dans une revue
hal-03781868v1
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Failure Analysis of Atmospheric Neutron-Induced Single Event Burnout of a Commercial SiC MOSFET
Rosine Coq Germanicus
,
Kimmo Niskanen
,
Alain Michez
,
Niemat Moultif
,
Wadia Jouha
Article dans une revue
hal-03702520v1
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Morphology control of self-organised Sr3V2O8 nanostructures on SrVO3 grown onto single and poly-crystalline subjacent SrTiO3 substrates
B. Bérini
,
M. Dallocchio
,
A. David
,
U. Luders
,
Bourlier Yoan
Article dans une revue
hal-03335293v1
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Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation
Andrea Coronetti
,
Ruben Garcia Alia
,
Jan Budroweit
,
Tomasz Rajkowski
,
Israel Da Costa Lopes
Article dans une revue
hal-03341566v1
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Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment
K. Niskanen
,
Rosine Coq Germanicus
,
A. Michez
,
Frédéric Wrobel
,
Jérôme Boch
Article dans une revue
hal-03341565v1
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Dopant activity for highly in-situ doped polycrystalline silicon: hall, XRD, scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy (SSRM)
Rosine Coq Germanicus
,
Florent Lallemand
,
Daniel Chateigner
,
Frédéric Richardeau
,
Niemat Moultif
Article dans une revue
hal-03341563v1
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Thickness dependence of dielectric properties in sub-nanometric Al2O3/ZnO laminates
M. Upadhyay
,
M. Ben Elbahri
,
M. Mezhoud
,
Rosine Coq Germanicus
,
U. Lüders
Solid-State Electronics, 2021, 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), 186, pp.108070. ⟨10.1016/j.sse.2021.108070⟩
Article dans une revue
hal-03341562v1
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Development of a multifunctional nanoindenter integrated in-situ Scanning Electron Microscope - application to the monitoring of piezoresponse and electro-mechanical failures
F. Volpi
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C. Boujrouf
,
M. Rusinowicz
,
S. Comby-Dassonneville
,
F. Mercier
Article dans une revue
hal-03428537v1
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Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy
Rosine Coq Germanicus
,
Peter de Wolf
,
Florent Lallemand
,
Catherine Bunel
,
Serge Bardy
Article dans une revue
hal-03053497v1
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Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrix
Rosine Coq Germanicus
,
Yoan Bourlier
,
Vincent Notot
,
Bruno Bérini
,
Valérie Demange
Article dans une revue
hal-02531301v1
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Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET
K. Niskanen
,
A. Touboul
,
Rosine Coq Germanicus
,
A. Michez
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A. Javanainen
Article dans une revue
hal-03511987v1
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Quantitative mapping of high modulus materials at the nanoscale: comparative study between atomic force microscopy and nanoindentation
Rosine Coq Germanicus
,
D. Mercier
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F. Agrebi
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M. Fèbvre
,
D. Mariolle
Article dans une revue
hal-03343212v1
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Reliability analysis of BiCMOS SiGe:C technology under aggressive conditions for emerging RF and mm-wave applications: proposal of reliability-aware circuit design methodology
Insaf Lahbib
,
Sidina Wane
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Aziz Doukkali
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Dominique Lesénéchal
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Thanh Vinh Dinh
International Journal of Microwave and Wireless Technologies, 2018, Volume 10 (Special Issue 5-6), pp. 690-699. ⟨10.1017/S1759078718000624⟩
Article dans une revue
hal-02190712v1
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Caractérisation par nanoindentation du GaN irradié par des ions uranium de grande énergie
Sophie Eve
,
Florent Moisy
,
Rosine Coq Germanicus
,
Clara Grygiel
,
Eric Hug
Article dans une revue
hal-02175450v1
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On the effects of a pressure induced amorphous silicon layer on consecutive spreading resistance microscopy scans of doped silicon
Rosine Coq Germanicus
,
Ph. Leclère
,
Y. Guhel
,
B. Boudart
,
Antoine Touboul
Article dans une revue
hal-01647658v1
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Nanoindentation du Si3N4 pour la microelectronique : influence de la sous-couche
Rosine Coq Germanicus
,
S. Eve
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F. Lallemand
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E. Hug
Article dans une revue
hal-02184114v1
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Rapid thermal annealing of cerium dioxide thin films sputtered onto silicon (111) substrates: Influence of heating rate on microstructure and electrical properties
Y. Guhel
,
T. Toloshniak
,
J. Bernard
,
A. Besq
,
Rosine Coq Germanicus
Article dans une revue
hal-01646795v1
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New Approach for the Prediction of CCD Dark Current Distribution in a Space Radiation Environment
Olivier Gilard
,
Mathieu Boutillier
,
Gianandrea Quadri
,
Guy Rolland
,
Rosine Coq Germanicus
Article dans une revue
hal-03515229v1
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Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains
Rosine Coq Germanicus
,
E. Picard
,
B. Domenges
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K. Danilo
,
R. Rogel
Article dans une revue
hal-02533135v1
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Analytic description of scanning capacitance microscopy
Hugues Murray
,
Rosine Coq Germanicus
,
Aziz Doukkali
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Patrick Martin
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Bernadette Domengès
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, 2007, 25 (4), pp.1340. ⟨10.1116/1.2759218⟩
Article dans une revue
hal-02533128v1
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Hardening of a radiation sensor based on optically stimulated luminescence
J.-R. Vaillé
,
S. Ducret
,
K. Idri
,
Frédéric Saigné
,
S. Matias
Article dans une revue
hal-00327358v1
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Proton damage effects on GaAs/GaAlAs vertical cavity surface emitting lasers
P. Le Métayer
,
O. Gilard
,
Rosine Coq Germanicus
,
D. Campillo
,
F. Ledu
Article dans une revue
hal-02533145v1
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Analysis of the proton-induced permanent degradation in an optocoupler
Rosine Coq Germanicus
,
L. Dusseau
,
Frédéric Saigné
,
S. Barde
,
R. Ecoffet
Article dans une revue
hal-01802189v1
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Evaluation and prediction of the degradation of a COTS CCD induced by displacement damage
Rosine Coq Germanicus
,
S. Barde
,
L. Dusseau
,
G. Rolland
,
Christian Barillot
Article dans une revue
hal-00327069v1
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High-energy particle irradiation of optically stimulated luminescent films at CERN
L. Dusseau
,
G. Polge
,
S. Mathias
,
J.-R. Vaillé
,
Rosine Coq Germanicus
Article dans une revue
hal-01801752v1
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