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Diodes Schottky diamant fonctionnant à 200°C

 Richard Monflier , Karine Isoird , Alain Cazarré , Josiane Tasselli , Alexandra Servel , et al.
Symposium de Génie Electrique, G2Elab, Jun 2016, Grenoble, France
Communication dans un congrès hal-01245628v2
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Defect investigation of excimer laser annealed silicon

 Richard Monflier , Toshiyuki Tabata , Fuccio Cristiano , Inès Toque-Tresonne , Fulvio Mazzamuto , et al.
IEEE Nanotechnology Materials and Devices Conference, Oct 2016, Toulouse, France
Communication dans un congrès hal-01343978v3

Etude des défauts induits par recuit laser excimer sur silicium

 Richard Monflier , Amin Benyoucef , Mégane Turpin , Fuccio Cristiano , Eléna Bedel-Pereira
20èmes Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2017), Nov 2017, Strasbourg, France. 1p
Communication dans un congrès hal-01690886v1
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Prediction of the evolution of defects induced by the heated implantation process: Contribution of kinetic Monte Carlo in a multi-scale modeling framework

 P.L. Julliard , A. Johnsson , N. Zographos , R. Demoulin , Richard Monflier , et al.
Solid-State Electronics, 2023, 200, pp.108521. ⟨10.1016/j.sse.2022.108521⟩
Article dans une revue hal-03867418v1
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Etude des défauts induits par recuit laser excimère dans le silicium

 Richard Monflier
Micro et nanotechnologies/Microélectronique. Université Paul Sabatier - Toulouse III, 2019. Français. ⟨NNT : 2019TOU30067⟩
Thèse tel-02162058v2
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Diamond Schottky diodes operating at 473 K

 Richard Monflier , Karine Isoird , Alain Cazarré , Josiane Tasselli , Alexandra Servel , et al.
EPE Journal - European Power Electronics and Drives, 2017, 27 (3), pp.118-124. ⟨10.1080/09398368.2017.1388625⟩
Article dans une revue hal-01618095v1
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Structural and Electrical Characterizations of BiSb Topological Insulator Layers Epitaxially Integrated on GaAs

 Dima Sadek , Richard Daubriac , Corentin Durand , Richard Monflier , Quentin Gravelier , et al.
Crystal Growth & Design, 2022, 22 (8), pp.5081-5091. ⟨10.1021/acs.cgd.2c00585⟩
Article dans une revue hal-03775836v1
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Backside Fault Localization and Defect Physical Analysis of Degraded Power HEMT p-GaN Transistors Stressed in DC and AC Switching Modes

 L. Ghizzo , G. Guibaud , C. de Nardi , F. Jamin , V. Chazal , et al.
49th International Symposium for Testing and Failure Analysis ISTFA 2023), Nov 2023, Phoenix, United States. pp.491-499, ⟨10.31399/asm.cp.istfa2023p0491⟩
Communication dans un congrès hal-04307540v1

Magnetic Field Effects in X-Ray Damaged NPB and MADN OLEDs

 Eléna Bedel-Pereira , Richard Monflier , Mathieu Thene , Bernard Franc , Ludovic Salvagnac , et al.
IEEE Transactions on Magnetics, 2019, 55 (2), pp.1-4. ⟨10.1109/TMAG.2018.2856590⟩
Article dans une revue hal-02051962v1
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Degradation study of InGaAsN PIN solar cell under 1 MeV electrons irradiation

 Maxime Levillayer , Sophie Duzellier , I. Massiot , Thierry Nuns , Christophe Inguimbert , et al.
IEEE Transactions on Nuclear Science, 2021, 68 (8), pp.1694 - 1700. ⟨10.1109/TNS.2021.3068044⟩
Article dans une revue hal-03012605v1
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Study of recrystallization and activation processes in thin and highly doped silicon-on-insulator layers by nanosecond laser thermal annealing

 Nicolas Chery , Meiling Zhang , Nicolas Mallet , Grégory Seine , Vincent Paillard , et al.
Journal of Applied Physics, 2022, 131 (6), pp.014008. ⟨10.1063/5.0073827⟩
Article dans une revue hal-04236606v1
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Investigation of BV dss instability in trench power MOSFET through DLTS, electrical characterization and TCAD simulations

 Marina Ruggeri , Patrick Calenzo , Frédéric Morancho , Lia Masoero , Rosalia Germana , et al.
35th International Symposium on Power Semiconductor Devices and ICs (ISPSD 2023), May 2023, Hong Kong, China. pp.36-39, ⟨10.1109/ISPSD57135.2023.10147489⟩
Communication dans un congrès hal-04141241v1
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A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si 1− x Ge x and Si layers

 Richard Daubriac , Emmanuel Scheid , Hiba Rizk , Richard Monflier , Sylvain Joblot , et al.
Beilstein Journal of Nanotechnology, 2018, 9, pp.1926 - 1939. ⟨10.3762/bjnano.9.184⟩
Article dans une revue hal-01921179v1
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Defects Investigation in Nanosecond laser Annealed Crystalline Silicon: Identification and Localization

 Richard Monflier , Hiba Rizk , Toshiyuki Tabata , Julien Roul , Simona Boninelli , et al.
22nd International Conference on Ion Implantation Technology, Sep 2018, Würzburg, Germany. pp.4, ⟨10.1109/IIT.2018.8807933⟩
Communication dans un congrès hal-01803955v2
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Investigation of Oxygen penetration during UV Nanosecond Laser Annealing of Silicon at high energy densities

 Richard Monflier , Toshiyuki Tabata , Hiba Rizk , Julien Roul , Karim Huet , et al.
Applied Surface Science, 2021, 536, pp.149071. ⟨10.1016/j.apsusc.2021.149071⟩
Article dans une revue hal-03098053v1

Stress relaxation and dopant activation in nsec laser annealed SiGe

 Fuccio Cristiano , Richard Monflier , Richard Daubriac , Rémi Demoulin , Emmanuel Scheid , et al.
IWJT - International Workshop on Junction Technology, Jun 2021, Kyoto (on line), Japan. ⟨10.23919/IWJT52818.2021.9609361⟩
Communication dans un congrès hal-03449341v1

Evaluating depth distribution of excimer laser induced defects in silicon using micro-photoluminescence spectroscopy

 Richard Monflier , Toshiyuki Tabata , Mégane Turpin , Amin Benyoucef , Fuccio Cristiano , et al.
MRS Fall Meeting , MRS, Nov 2017, Boston, United States
Communication dans un congrès hal-01555348v1

Self-Propagating Reaction Mechanisms in TiB2 Integrated Al/CuO Nanothermites

 Vidushi Singh , Richard Monflier , Nicolas Mauran , Alain Estève , Carole Rossi
2023 MRS Fall Meeting & Exhibit, Materials Research Society, Nov 2023, Boston (MA), United States
Communication dans un congrès hal-04493934v1
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Benzohexacene guide in accurate determination of field effect carrier mobilities in long acenes

 Eléna Bedel-Pereira , Julien Bassaler , Hugo Laval , J Holec , Richard Monflier , et al.
RSC Advances, 2022, 12 (2), pp.671 - 680. ⟨10.1039/d1ra07808a⟩
Article dans une revue hal-03529654v1
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Hyper-doped silicon nanoantennas and metasurfaces for tunable infrared plasmonics

 Jean-Marie Poumirol , Clément Majorel , Nicolas Chery , Christian Girard , Peter Wiecha , et al.
ACS photonics, 2021, 8 (5), pp.1393-1399. ⟨10.1021/acsphotonics.1c00019⟩
Article dans une revue hal-03040170v1

Influence of in-situ x-ray exposure on the magnetotransport properties of NPB and MADN based blue OLED structures

 Jean-François Bobo , Richard Monflier , Ludovic Salvagnac , Eléna Bedel-Pereira , Isabelle Séguy
14th International Conference on Organic Electronics (ICOE 2018), Jun 2018, Bordeaux, France
Communication dans un congrès hal-02140836v1
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