Resonant-Contact Atomic Force Microscopy
Richard Arinero
AFM School, “AFM characterization of wood mechanical properties” , Sep 2014, Zvolen, Slovakia
Communication dans un congrès
hal-01814142v1
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Heavy ion-induced latent defects dependence on oxide thickness: The reason why Post Gate Stress are especially dedicated to Power MOSFETs
A.M.J.F. Carvalho
,
Antoine Touboul
,
M. Marinoni
,
R. Arinero
,
Frédéric Saigné
,
et al.
7th Symposium SIO2 Advanced Dielectrics an Related Devices , 2008, Saint-Etienne, France
Communication dans un congrès
hal-01822739v1
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New Insights into Dielectric Nanocomposites by EFM Imaging and Spectroscopy
R. Arinero
,
D. El Khoury
,
J. Castellon
IEEE Nanotechnology Materials and Devices Conference NMDC 2018, on-line proceedings , 2018, Portland, United States
Communication dans un congrès
hal-02007254v1
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Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip–sample distance and dielectric constant dependence
C. Riedel
,
A. Alegria
,
R. Arinero
,
J. Colmenero
,
J J Sáenz
Article dans une revue
istex
hal-01632610v1
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Mise en évidence des propriétés élastiques de la paroi cellulaire du bois par microscopie à force atomique
Richard Arinero
,
Gérard Leveque
,
Bruno Clair
,
Michel Ramonda
Forum des microscopies à sondes locales , Mar 2001, La Baume-les-Aix, France
Communication dans un congrès
hal-01815449v1
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Pedestal formation of all-semiconductor gratings through GaSb oxidation for mid-IR plasmonics
Mario Bomers
,
Franziska Barho
,
Maria Jose Milla-Rodrigo
,
Laurent Cerutti
,
Richard Arinero
,
et al.
Article dans une revue
hal-01754720v1
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Mid-IR plasmonic compound with gallium oxide toplayer formed by GaSb oxidation in water
Mario Bomers
,
Davide Maria Di Paola
,
Laurent Cerutti
,
Thierry Michel
,
Richard Arinero
,
et al.
Article dans une revue
hal-02045509v1
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Vibration of the cantilever in Force Modulation Microscopy analysis by a finite element model
R. Arinero
,
Gaëtan Lévêque
Article dans une revue
hal-00327957v1
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Imaging the Temperature-frequency Dependence of the Local Dielectric Response of Phase Separated Polymer Films by Means of EFM
Clément Riedel
,
R. Sweeney
,
N. E. Israeloff
,
Richard Arinero
,
Gustavo Ariel Schwartz
,
et al.
The 12th International Scanning Probe Microscopy (ISPM) Conference , May 2010, Sapporo, Japan
Communication dans un congrès
hal-01813953v1
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Determination of the Nanoscale dielectric permittivity by means of a double pass method using EFM
Clément Riedel
,
Richard Arinero
,
Philippe Tordjeman
,
Michel Ramonda
,
Gérard Leveque
,
et al.
inanoGUNE ETORTEK 1st Workshop , May 2009, San Sebastian, Spain
Communication dans un congrès
hal-01814138v1
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High ionizing dose effects on ultra thin SiO2 /Si structures revealed by Conductive Atomic Force Microscopy
R. Arinero
,
Antoine Touboul
,
M. Ramonda
,
C. Guasch
,
Y. Gonzalez-Velo
,
et al.
2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) , Sep 2011, Sevilla, France.
⟨10.1109/RADECS.2011.6131383⟩
Communication dans un congrès
hal-01791166v1
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Using scanning probe microscopy in contact mode to evaluate the local rigidity of cell- wall layer : application to gelatinous fibres of oak tension wood
Bruno Clair
,
Richard Arinero
,
Joseph Gril
Workshop of COST Action E20 (Wood Fibre Cell Wall Structure) "Methods to localise and characterise cell wall components", K. Ruel and P. Ander (Eds) , Oct 2001, grenoble, France
Communication dans un congrès
hal-01827077v1
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Caractérisation mécanique du bois à l'échelle submicrométrique : une étude préliminaire
Karl Bytebier
,
Olivier Arnould
,
Richard Arinero
Matériaux 2006 , 2006, Dijon, France
Communication dans un congrès
hal-00546447v1
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Interests of High Flexure Modes for Vacuum AFM
Portes Licia
,
Richard Arinero
,
Michel Ramonda
,
Paul Girard
Conference on Nanoscience and Technology ICN&T 2006 , Jul 2006, Bâle, Switzerland
Communication dans un congrès
hal-01814059v1
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Temperature and damping effects on the frequency dependence of electrostatic force microscopy force gradients
R. Arinero
,
J. Trasobares
,
Pascal Girard
,
M. Ramonda
,
N. Clément
Article dans une revue
hal-00916277v1
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Recent advances in Amplitude-Controlled AFM under vacuum
Richard Arinero
,
Michel Ramonda
,
Paul Girard
1st Multifrequency AFM Conference , Sep 2008, Madrid, Spain
Communication dans un congrès
hal-01814048v1
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Nanoscale surface charge detection in epoxy resin materials using electrostatic force spectroscopy
D. El Khoury
,
R. Arinero
,
J. Laurentie
,
J. Castellon
Article dans une revue
hal-01629503v1
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HIGHER HARMONICS ATOMIC FORCE MICROSCOPE
Pascal Girard
,
M. Ramonda
,
R. Arinero
France, N° de brevet: WO/2006/136705. 2006
Brevet
hal-00327860v1
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Sensitivity and resolution in noncontact electrostatic force microscopy in the case of a constant potential
Gaëtan Lévêque
,
P. Cadet
,
R. Arinero
Article dans une revue
hal-01786008v1
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Image processing for resonance frequency mapping in atomic force modulation microscopy
R. Arinero
,
Gaëtan Lévêque
,
Pascal Girard
,
J.-Y. Ferrandis
Article dans une revue
hal-00327141v1
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Study of the Nanoscale Dielectric Relaxation of Polymers by Means of Atomic Force Microscopy
Gustavo Ariel Schwartz
,
Richard Arinero
,
Clément Riedel
,
Philippe Tordjeman
,
Angel Alegría
,
et al.
Archipol’09 (Argentine-Chilean Polymer Symposium) , Oct 2009, Los Cocos, Argentina
Communication dans un congrès
hal-01813983v1
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Impact of the interphase dielectric properties on the electric field distribution in LDPE/BN nanocomposites
C. Villeneuve-Faure
,
N Lahoud Dignat
,
Benoît Lantin
,
R Arinero
,
M Ramonda
,
et al.
IEEE 2022 International Conference on Dielectrics , Jul 2022, Palermo, Italy
Communication dans un congrès
hal-03765822v1
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Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation
A. Privat
,
Antoine Touboul
,
R. Arinero
,
Frédéric Wrobel
,
F. Saigné
,
et al.
Nuclear and Space Radiation Effects (NSREC) , 2013, San Francisco, United States
Communication dans un congrès
hal-01824642v1
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Etude électrique et physique à l’échelle nanométrique des couches minces de SiO2 thermique sous différentes atmosphères
Wael Hourani
,
Brice Gautier
,
Liviu Militaru
,
David Albertini
,
Armel Descamps-Mandine
,
et al.
Forum des microscopies à sondes locales , Mar 2011, Ecully, France
Communication dans un congrès
hal-01814134v1
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Fundamentals of Atomic Force Microscopy
Richard Arinero
AFM School, “AFM characterization of wood mechanical properties” , Sep 2014, Zvolen, Slovakia
Communication dans un congrès
hal-01814141v1
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AFM characterization of the mechanical properties of wood at the cell wall level ; a prospective study
Karl Bytebier
,
Olivier Arnould
,
Richard Arinero
,
Joseph Gril
Workshop of COST action E50 , 2006, Warsaw, Poland
Communication dans un congrès
hal-00546591v1
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STRUCTURAL PROPERTIES OF PbTiO 3 FILMS GROWN BY MIXED REACTIVE THERMAL CO-EVAPORATION
B. Sorli
,
Jean Podlecki
,
P. Combette
,
R. Arinero
,
Grégory Simon
,
et al.
Article dans une revue
hal-01737898v1
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nanoDielectric Spectroscopy in polymers and soft matter by electrostatic force microscopy (EFM): current status and future developments
Gustavo Ariel Schwartz
,
Richard Arinero
,
Clément Riedel
,
Philippe Tordjeman
,
Angel Alegría
,
et al.
New trends in polymer rheology: complex architectures and complex environments , Apr 2010, San Sebastian, Spain
Communication dans un congrès
hal-01813974v1
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Quantitative Dielectric Mapping of Nano-structured Systems by Means of Electrostatic Force Microscopy
Gustavo Ariel Schwartz
,
Richard Arinero
,
Clément Riedel
,
Philippe Tordjeman
,
Angel Alegría
,
et al.
The 12th International Scanning Probe Microscopy (ISPM) Conference , May 2010, Sapporo, Japan
Communication dans un congrès
hal-01813969v1
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PbTiO3 thin films grown by mixed reactive thermal co-evaporation
B. Sorli
,
J. Podlecki
,
P. Combette
,
R. Arinero
,
F. Pascal-Delannoy
,
et al.
Article dans une revue
istex
hal-00327663v1
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