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Resonant-Contact Atomic Force Microscopy

 Richard Arinero
AFM School, “AFM characterization of wood mechanical properties”, Sep 2014, Zvolen, Slovakia
Communication dans un congrès hal-01814142v1

Heavy ion-induced latent defects dependence on oxide thickness: The reason why Post Gate Stress are especially dedicated to Power MOSFETs

 A.M.J.F. Carvalho , Antoine Touboul , M. Marinoni , R. Arinero , Frédéric Saigné , et al.
7th Symposium SIO2 Advanced Dielectrics an Related Devices, 2008, Saint-Etienne, France
Communication dans un congrès hal-01822739v1

New Insights into Dielectric Nanocomposites by EFM Imaging and Spectroscopy

 R. Arinero , D. El Khoury , J. Castellon
IEEE Nanotechnology Materials and Devices Conference NMDC 2018, on-line proceedings, 2018, Portland, United States
Communication dans un congrès hal-02007254v1

Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip–sample distance and dielectric constant dependence

 C. Riedel , A. Alegria , R. Arinero , J. Colmenero , J J Sáenz
Nanotechnology, 2011, 22 (34), ⟨10.1088/0957-4484/22/34/345702⟩
Article dans une revue istex hal-01632610v1

Mise en évidence des propriétés élastiques de la paroi cellulaire du bois par microscopie à force atomique

 Richard Arinero , Gérard Leveque , Bruno Clair , Michel Ramonda
Forum des microscopies à sondes locales, Mar 2001, La Baume-les-Aix, France
Communication dans un congrès hal-01815449v1
Image document

Pedestal formation of all-semiconductor gratings through GaSb oxidation for mid-IR plasmonics

 Mario Bomers , Franziska Barho , Maria Jose Milla-Rodrigo , Laurent Cerutti , Richard Arinero , et al.
Journal of Physics D: Applied Physics, 2018, 51 (1), pp.015104. ⟨10.1088/1361-6463/aa98af⟩
Article dans une revue hal-01754720v1
Image document

Mid-IR plasmonic compound with gallium oxide toplayer formed by GaSb oxidation in water

 Mario Bomers , Davide Maria Di Paola , Laurent Cerutti , Thierry Michel , Richard Arinero , et al.
Semiconductor Science and Technology, 2018, 33 (9), pp.095009. ⟨10.1088/1361-6641/aad4bf⟩
Article dans une revue hal-02045509v1

Vibration of the cantilever in Force Modulation Microscopy analysis by a finite element model

 R. Arinero , Gaëtan Lévêque
Review of Scientific Instruments, 2003, 74 (1), pp.104-111. ⟨10.1063/1.1525874⟩
Article dans une revue hal-00327957v1

Imaging the Temperature-frequency Dependence of the Local Dielectric Response of Phase Separated Polymer Films by Means of EFM

 Clément Riedel , R. Sweeney , N. E. Israeloff , Richard Arinero , Gustavo Ariel Schwartz , et al.
The 12th International Scanning Probe Microscopy (ISPM) Conference, May 2010, Sapporo, Japan
Communication dans un congrès hal-01813953v1

Determination of the Nanoscale dielectric permittivity by means of a double pass method using EFM

 Clément Riedel , Richard Arinero , Philippe Tordjeman , Michel Ramonda , Gérard Leveque , et al.
inanoGUNE ETORTEK 1st Workshop, May 2009, San Sebastian, Spain
Communication dans un congrès hal-01814138v1

High ionizing dose effects on ultra thin SiO2/Si structures revealed by Conductive Atomic Force Microscopy

 R. Arinero , Antoine Touboul , M. Ramonda , C. Guasch , Y. Gonzalez-Velo , et al.
2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2011, Sevilla, France. ⟨10.1109/RADECS.2011.6131383⟩
Communication dans un congrès hal-01791166v1

Using scanning probe microscopy in contact mode to evaluate the local rigidity of cell- wall layer : application to gelatinous fibres of oak tension wood

 Bruno Clair , Richard Arinero , Joseph Gril
Workshop of COST Action E20 (Wood Fibre Cell Wall Structure) "Methods to localise and characterise cell wall components", K. Ruel and P. Ander (Eds), Oct 2001, grenoble, France
Communication dans un congrès hal-01827077v1

Caractérisation mécanique du bois à l'échelle submicrométrique : une étude préliminaire

 Karl Bytebier , Olivier Arnould , Richard Arinero
Matériaux 2006, 2006, Dijon, France
Communication dans un congrès hal-00546447v1

Interests of High Flexure Modes for Vacuum AFM

 Portes Licia , Richard Arinero , Michel Ramonda , Paul Girard
Conference on Nanoscience and Technology ICN&T 2006, Jul 2006, Bâle, Switzerland
Communication dans un congrès hal-01814059v1
Image document

Temperature and damping effects on the frequency dependence of electrostatic force microscopy force gradients

 R. Arinero , J. Trasobares , Pascal Girard , M. Ramonda , N. Clément
Journal of Applied Physics, 2013, 114 (21), pp.214315. ⟨10.1063/1.4843835⟩
Article dans une revue hal-00916277v1

Recent advances in Amplitude-Controlled AFM under vacuum

 Richard Arinero , Michel Ramonda , Paul Girard
1st Multifrequency AFM Conference, Sep 2008, Madrid, Spain
Communication dans un congrès hal-01814048v1
Image document

Nanoscale surface charge detection in epoxy resin materials using electrostatic force spectroscopy

 D. El Khoury , R. Arinero , J. Laurentie , J. Castellon
AIP Advances, 2016, 6 (3), ⟨10.1063/1.4944953⟩
Article dans une revue hal-01629503v1

HIGHER HARMONICS ATOMIC FORCE MICROSCOPE

 Pascal Girard , M. Ramonda , R. Arinero
France, N° de brevet: WO/2006/136705. 2006
Brevet hal-00327860v1

Sensitivity and resolution in noncontact electrostatic force microscopy in the case of a constant potential

 Gaëtan Lévêque , P. Cadet , R. Arinero
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2005, 71 (20), ⟨10.1103/PhysRevB.71.205419⟩
Article dans une revue hal-01786008v1
Image document

Image processing for resonance frequency mapping in atomic force modulation microscopy

 R. Arinero , Gaëtan Lévêque , Pascal Girard , J.-Y. Ferrandis
Review of Scientific Instruments, 2007, 78 (2), pp.023703.1-023703.6. ⟨10.1063/1.2432264⟩
Article dans une revue hal-00327141v1

Study of the Nanoscale Dielectric Relaxation of Polymers by Means of Atomic Force Microscopy

 Gustavo Ariel Schwartz , Richard Arinero , Clément Riedel , Philippe Tordjeman , Angel Alegría , et al.
Archipol’09 (Argentine-Chilean Polymer Symposium), Oct 2009, Los Cocos, Argentina
Communication dans un congrès hal-01813983v1
Image document

Impact of the interphase dielectric properties on the electric field distribution in LDPE/BN nanocomposites

 C. Villeneuve-Faure , N Lahoud Dignat , Benoît Lantin , R Arinero , M Ramonda , et al.
IEEE 2022 International Conference on Dielectrics, Jul 2022, Palermo, Italy
Communication dans un congrès hal-03765822v1

Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation

 A. Privat , Antoine Touboul , R. Arinero , Frédéric Wrobel , F. Saigné , et al.
Nuclear and Space Radiation Effects (NSREC), 2013, San Francisco, United States
Communication dans un congrès hal-01824642v1

Etude électrique et physique à l’échelle nanométrique des couches minces de SiO2 thermique sous différentes atmosphères

 Wael Hourani , Brice Gautier , Liviu Militaru , David Albertini , Armel Descamps-Mandine , et al.
Forum des microscopies à sondes locales, Mar 2011, Ecully, France
Communication dans un congrès hal-01814134v1

Fundamentals of Atomic Force Microscopy

 Richard Arinero
AFM School, “AFM characterization of wood mechanical properties”, Sep 2014, Zvolen, Slovakia
Communication dans un congrès hal-01814141v1

AFM characterization of the mechanical properties of wood at the cell wall level ; a prospective study

 Karl Bytebier , Olivier Arnould , Richard Arinero , Joseph Gril
Workshop of COST action E50, 2006, Warsaw, Poland
Communication dans un congrès hal-00546591v1

STRUCTURAL PROPERTIES OF PbTiO 3 FILMS GROWN BY MIXED REACTIVE THERMAL CO-EVAPORATION

 B. Sorli , Jean Podlecki , P. Combette , R. Arinero , Grégory Simon , et al.
Integrated Ferroelectrics, 2008, 98 (1), pp.161 - 170. ⟨10.1080/10584580802093496⟩
Article dans une revue hal-01737898v1

nanoDielectric Spectroscopy in polymers and soft matter by electrostatic force microscopy (EFM): current status and future developments

 Gustavo Ariel Schwartz , Richard Arinero , Clément Riedel , Philippe Tordjeman , Angel Alegría , et al.
New trends in polymer rheology: complex architectures and complex environments, Apr 2010, San Sebastian, Spain
Communication dans un congrès hal-01813974v1

Quantitative Dielectric Mapping of Nano-structured Systems by Means of Electrostatic Force Microscopy

 Gustavo Ariel Schwartz , Richard Arinero , Clément Riedel , Philippe Tordjeman , Angel Alegría , et al.
The 12th International Scanning Probe Microscopy (ISPM) Conference, May 2010, Sapporo, Japan
Communication dans un congrès hal-01813969v1

PbTiO3 thin films grown by mixed reactive thermal co-evaporation

 B. Sorli , J. Podlecki , P. Combette , R. Arinero , F. Pascal-Delannoy , et al.
Journal of Crystal Growth, 2007, 304 (2), pp.383-387. ⟨10.1016/j.jcrysgro.2007.03.017⟩
Article dans une revue istex hal-00327663v1
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