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271 résultats
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Harmonic Response of Ring Oscillators under Single ElectroMagnetic Pulsed Fault Injection25th IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio (Brazil), Brazil
Communication dans un congrès
hal-04513585v1
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HLS Design of a Hardware Accelerator for Homomorphic EncryptionIEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), Apr 2017, Dresden, Germany
Communication dans un congrès
hal-01710778v1
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Reliability of computing systems: From flip flops to variablesIOLTS: International On-Line Testing Symposium, Jul 2017, Thessaloniki, Greece. pp.196-198, ⟨10.1109/IOLTS.2017.8046242⟩
Communication dans un congrès
lirmm-01700744v1
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Reconfiguration in a microprocessor: practical resultsRevue-Technique-Thomson-CSF, 1990, Sept.; 22(3), pp.361-75
Article dans une revue
hal-00015263v1
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Improved duplex fault tolerant architecture based on integrated information compaction devices7th-International-Conference-on-Reliability-and-Maintainability.-Proceedings, 1990, Brest, France. pp.514-19
Communication dans un congrès
hal-00015264v1
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A new approach to control flow checking without program modificationDigest-of-Papers.-Fault-Tolerant-Computing:-Twenty-First-International-Symposium-Cat.-No.91CH2985-0., 1991, Montreal, Que., Canada. pp.334-41, ⟨10.1109/FTCS.1991.146682⟩
Communication dans un congrès
hal-00015242v1
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Test des circuits intégrés numériques - Conception orientée testabilitéLes Techniques de l'Ingenieur, 2022, ⟨10.51257/a-v2-e2461⟩
Article dans une revue
hal-04056729v1
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How SGX security claims meet real life scenariosIEEE European Test Conference, PhD Forum (ETS 2021), May 2021, Virtual event, Belgium
Communication dans un congrès
hal-03639927v1
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Approximate computing design exploration through data lifetime metrics24th IEEE European Test Symposium (ETS 2019), May 2019, Baden Baden, Germany
Communication dans un congrès
hal-02110003v1
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Test des circuits intégrés numériques - Notions de base. Génération de vecteursTechniques de l'Ingénieur, pp.article E 2460, 2002
Chapitre d'ouvrage
hal-01467470v1
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Practical evaluation of fault countermeasures on an asynchronous DES cryptoprocessor2006, pp.125-130, ⟨10.1109/IOLTS.2006.50⟩
Communication dans un congrès
hal-00143413v1
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Tools and methodology development for pulsed laser fault injection in SRAM-based FPGAs8th Latin-American Test Workshop (LATW'07), 2007, Cuzco, Peru. pp.Session 8
Communication dans un congrès
hal-00156318v1
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CNTFET-based logic gates and simulationIEEE International Design and Test Workshop (IDT'06, Nov 2006, Dubai, United Arab Emirates. 6 p
Communication dans un congrès
hal-00156737v1
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Datapath implementation: bit-slice structure versus standard cellsProceedings.-Euro-ASIC-'92-Cat.-No.92TH0442-4., 1992, Paris, France. pp.83-8, ⟨10.1109/EUASIC.1992.228054⟩
Communication dans un congrès
hal-00015233v1
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Environnement d'analyse de sûreté sur SoPC9èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM'06), May 2006, Rennes, France
Communication dans un congrès
hal-00592104v1
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Asynchronous circuits sensitivity to fault injectionProceedings.-10th-IEEE-International-On-Line-Testing-Symposium. 2004:, 2004, Madeira Island, Portugal. pp.121-6
Communication dans un congrès
hal-00009580v1
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Comprehensive CAD support for boundary scan implementation in ASICsEuro-ASIC-'91-Cat.-No.91TH0367-3., 1991, Paris, France. pp.278-83, ⟨10.1109/EUASIC.1991.212852⟩
Communication dans un congrès
hal-00015236v1
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Clocking scheme selection for circuits made up of a controller and a datapathIFIP-Transactions-A-Computer-Science-and-Technology, 1993, A-22, pp.293-308
Article dans une revue
hal-00015223v1
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Evaluation of SET and SEU effects at multiple abstraction levels11th-IEEE-International-On-Line-Testing-Symposium., 2005, French Riviera, France. pp.309-12, ⟨10.1109/IOLTS.2005.28⟩
Communication dans un congrès
hal-00015000v1
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Alternative approaches to fault detection in FSMs1994-Proceedings.-The-IEEE-International-Workshop-on-Defect-and-Fault-Tolerance-in-VLSI-Systems-Cat.-No.94TH78009, 1994, Montreal, Que, Canada. pp.271-9, ⟨10.1109/DFTVS.1994.630040⟩
Communication dans un congrès
hal-00015112v1
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Using run-time reconfiguration for fault injection applications18th IEEE Instrumentation and Measurement Technology Conference (IMTC'01). Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188), May 2001, Budapest, Hungary. pp.1773-1777
Communication dans un congrès
hal-00015055v1
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Multi-level fault injection experiments based on VHDL descriptions: a case studyEighth IEEE International On Line Testing Workshop (IOLTW'02), Jul 2002, Isle of Bendor, France. pp.107-11
Communication dans un congrès
hal-00015043v1
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Evaluation of register-level protection techniques for the Advanced Encryption Standard by multi-level fault injectionsInternational Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'07), Sep 2007, Rome, Italy. pp.499-507
Communication dans un congrès
hal-00185903v1
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Efficiency of probabilistic testability analysis for soft error effect analysis: a case study4th IEEE International conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS'09), Apr 2009, Cairo, Egypt. pp.236-240
Communication dans un congrès
hal-00386115v1
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Built-in concurrent checking of ASICsEuro-ASIC-89, 1989, Grenoble, France. pp.481-501
Communication dans un congrès
hal-00015357v1
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On the use of error correcting and detecting codes in secured circuitsPH.D Research in Microelectronics and Electronics conference nics (PRIME'07), Jul 2007, Bordeaux, France. pp.245-248
Communication dans un congrès
hal-00178948v1
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Nouvelle méthode de vérification de flot de contrôle avec signatures disjointes13èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM), Jun 2010, Montpellier, France
Communication dans un congrès
hal-00544624v1
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Validation of RTL laser fault injection model with respect to layout informationIEEE International Symposium on Hardware Oriented Security and Trust (HOST'15), May 2015, McLean, VA, United States. pp.78-81
Communication dans un congrès
hal-01393414v1
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On Fault Injections for Early Security Evaluation vs. Laser-based Attacks1st IEEE International Verification and Security Workshop, Jul 2016, St Feliu de Guixols, Spain. pp.33-38
Communication dans un congrès
hal-01444970v1
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On improving at no cost the quality of products built with SRAM-based FPGAs5th Asia Symposium on Quality Electronic Design (ASQED 2013), Aug 2013, Penang, Malaysia. pp.295-301
Communication dans un congrès
hal-00862792v1
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