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270 résultats
NETFI-2: An Automatic Method for Fault Injection on HDL-Based DesignsDesign, Automation & Test in Europe (DATE 2017), Mar 2017, Lausanne, Switzerland. IEEE Circuits and Systems society
Poster de conférence
hal-01730869v1
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Error-rate prediction for applications implemented in Multi-core and Many-core processorsConference on Radiation Effects on Components and Systems (RADECS 2017), Oct 2017, Geneva, Switzerland. , 2017
Poster de conférence
in2p3-01735643v1
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SEU Impact in Processor's Control-Unit: Preliminary Results Obtained for LEON3 Soft-Core18th IEEE Latin American Test Symposium (LATS’17), Mar 2017, Bogota, Colombia. pp.1-4
Communication dans un congrès
hal-01523901v1
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Single event upsets simulations on neural networks2nd LAAS International Conference on Computer Simulation, Sep 1997, Beyrouth, Liban
Communication dans un congrès
hal-01384968v1
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An Automated SEU Fault-Injection Method and Tool for HDL-Based DesignsIEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2728 - 2733. ⟨10.1109/TNS.2013.2267097⟩
Article dans une revue
hal-01137310v1
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Error-Rate Estimation Combining SEE Static Cross-Section Predictions and Fault-Injections Performed on HDL-Based DesignsIEEE Transactions on Nuclear Science, 2013, 60, December (6), pp.4238-4242
Article dans une revue
hal-01137311v1
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Continuous High-Altitude Measurements of Cosmic Ray Neutrons and SEU/MCU at Various Locations: Correlation and Analyses Based-On MUSCA SEPIEEE Transactions on Nuclear Science, 2013, 60, August (4), pp.2418-2426. ⟨10.1109/TNS.2013.2240697⟩
Article dans une revue
hal-01137327v1
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Characterization of the Neutron Environment and SEE Investigations at the CERN-EU High Energy Reference Field and at the Pic du MidiIEEE Transactions on Nuclear Science, 2013, 60, August (4), pp.2411-2417. ⟨10.1109/TNS.2012.2231699⟩
Article dans une revue
hal-01137836v1
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Proceedings of the 20th Latin-American Test Symposium (LATS 2019)ieee, 2019, 9781728117577
Ouvrages
hal-02650720v1
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Evaluation of the Sensitive of a COTS 90-nm Memory at Low Bias VoltageRadiation and its Effects on Components and Systems (RADECS'16)), Sep 2016, Bremen, Germany. 4 p., ⟨10.1109/RADECS.2016.8093183⟩
Communication dans un congrès
hal-01524118v1
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Elaboration of a new pulsed laser system for SEE testingIEEE International On-Line Testing Workshop (IOLTW'98), Jul 1998, Capri, Italy
Communication dans un congrès
hal-01384704v1
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SEU-Hardened Storage Cell Validation using a Pulsed Laser33rd International Nuclear and Space Radiation Effects Conference (NSREC'96), Jul 1996, Indian Wells, CA, United States
Communication dans un congrès
hal-01412462v1
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Automatic verification of RT-level microprocessor cores using behavioral specifications: a case studyXIX Conference on Design of Circuits and Integrated Systems (DCIS'04), Nov 2004, Bordeaux, France
Communication dans un congrès
hal-01393259v1
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Hardening the software with respect to transient errors: a method and experimental results1st IEEE Latin-American Test Workshop (LATW'00), Mar 2000, Rio de Janeiro, Brésil
Communication dans un congrès
hal-01384224v1
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Performance impact of various SEE mechanisms in classical analog-to-digital converter architecturesIEEE Nuclear and Space Radiation Effects Conference (NSREC'03), Jul 2003, Monterey, CA, United States
Communication dans un congrès
hal-01376266v1
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Towards an efficient SEU effects emulation on SRAM-based FPGAsMicroelectronics Reliability, 2016, 66, pp.173-182
Article dans une revue
hal-01528652v1
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Estudio de la robustez frente a SEUs de algoritmos auto-convergentesConferencias de Investigación para Posgrado, Facultad de Informatics, Universidad Complutense, Mar 2015, Madrid, Spain
Communication dans un congrès
hal-01414628v1
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Coping with SEUs/SETs in microprocessors by means of low-cost solutions: a comparative study and experimental results6th European Conference on Radiation and its Effects on Components and Systems (RADECS'01), Sep 2001, Grenoble, France
Communication dans un congrès
hal-01388756v1
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Characterization of the neutron environment at the CERN-EU High Energy Reference Field and at the Pic du MidiRadiation Effects on Components and Systems (RADECS'12), Sep 2012, Biarritz, France
Communication dans un congrès
hal-00747152v1
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Effects of natural radiation on integrated circuits: origins, mitigation techniques and experiments in the natural environmentCONEIMERA (Congreso Nacional de Estudiantes de Ingenieria Mecanica, Electronica Electrica, y Ramas Afines), Sep 2010, Trujillo, Peru
Communication dans un congrès
hal-00560589v1
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Design of SEU-hardened CMOS memory cells: the HIT cellEuropean Conference on Radiation and its Effects on Components and Systems (RADECS'93), Sep 1993, Saint-Malo, France. pp.563-570
Communication dans un congrès
hal-00008260v1
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SEU testing of 32-bit microprocessors [for space application]1992, pp.16-20, ⟨10.1109/REDW.1992.24733010.1109/REDW.1992.247330⟩
Communication dans un congrès
hal-00008261v1
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Test and diagnosis problems in VLSI; experiences on microprocessor test and diagnosisMicrocomputer '86 - Design, Practice, Education, 1986, Bierutowice, Poland. pp.195-205
Communication dans un congrès
hal-00013339v1
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A Methodology for Test Replacement Solutions of Obsolete Processors9th IEEE International On-Line Testing Symposium, 2003, Kos International Convention Center, Kos Island, Greece. pp.209, ⟨10.1109/OLT.2003.1214400⟩
Communication dans un congrès
hal-00005832v1
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Artificial neural network robustness for on-board satellite image processing: results of upset simulations and ground testsIEEE Transactions on Nuclear Science, 1997, Dec. 1997; 44(6) pt. 1, pp.2337-44. ⟨10.1109/23.659057⟩
Article dans une revue
hal-00008248v1
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Evaluating the effectiveness of a software fault-tolerance technique on RISC- and CISC-based architectures2000, pp.17-21, ⟨10.1109/OLT.2000.856606⟩
Communication dans un congrès
hal-00008226v1
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Analysis of experimental results on functional testing and diagnosis of complex circuitsInternational-Test-Conference-1988-Proceedings-New-Frontiers-in-Testing-Cat.-No.88CH2610-4, 1988, Washington, DC, United States. pp.64-72, ⟨10.1109/TEST.1988.207781⟩
Communication dans un congrès
hal-00013338v1
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TANDAR as a digital circuits test radiation facilityLatin American Test Workshop (LATW'06), Mar 2006, Buenos Aires, Argentina. pp.179-183
Communication dans un congrès
hal-00156251v1
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Tools and methodology development for pulsed laser fault injection in SRAM-based FPGAs8th Latin-American Test Workshop (LATW'07), 2007, Cuzco, Peru. pp.Session 8
Communication dans un congrès
hal-00156318v1
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SEU experiments on an Artificial Neural Network implemented by means of digital processorsIEEE Transactions on Nuclear Science, 1996, Dec. 1996; 43(6) pt. 1, pp.2889-96. ⟨10.1109/23.556882⟩
Article dans une revue
hal-00008250v1
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