Nombre de documents

23

CV


Article dans une revue4 documents

  • Bruno Robisson, Michel Agoyan, Patrick Soquet, Sébastien Le-Henaff, Franck Wajsbürt, et al.. Smart security management in secure devices. Journal of Cryptographic Engineering, Springer, 2016, 〈http://link.springer.com/article/10.1007%2Fs13389-016-0143-4〉. 〈10.1007/s13389-016-0143-4〉. 〈emse-01447976〉
  • Daisuke Fujimoto, Noriyuki Miura, Makoto Nagata, Yuichi Hayashi, Naofumi Homma, et al.. Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage. IEICE Transactions on Electronics, Institute of Electronics, Information and Communication Engineers, 2014, E97.C (4), pp. 272-279. 〈hal-01540373〉
  • Boukary Ouattara, Lise Doyen, David Ney, Habib Mehrez, Pirouz Bazargan-Sabet. Power grid redundant path contribution in system on chip (SoC) robustness against electromigration. Microelectronics Reliability, Elsevier, 2014, 54 (9-10), pp.1702--1706. 〈10.1016/j.microrel.2014.07.016〉. 〈hal-01372616〉
  • Patricia Renault, Pirouz Bazargan Sabet. A Simplified Circuit to Model RC Interconnect. WSEAS Transactions on Circuits and Systems, World Scientific and Engineering Academy and Society, 2004, 3 (3), pp.431-436. 〈hal-01195964〉

Communication dans un congrès19 documents

  • Bruno Robisson, Michel Agoyan, Patrick Soquet, Sébastien Le Henaff, Franck Wajsbürt, et al.. SMART SECURITY MANAGEMENT IN SECURE DEVICES. PROOFS: Security Proofs for Embedded Systems, Sep 2015, Saint-Malo, France. 〈emse-01232670〉
  • Boukary Ouattara, Lise Doyen, David Ney, Habib Mehrez, Pirouz Bazargan-Sabet, et al.. Redundancy Method to assess Electromigration Lifetime in power grid design. IEEE International Interconnect Technology Conference (IITC),, Jun 2013, Kyoto, Japan. IEEE, pp.81-83, 2013, 〈10.1109/IITC.2013.6615570〉. 〈hal-00915971〉
  • Pirouz Bazargan Sabet, Dominique Le Dû. Identifying Signal Correlations Using Discrete Event Simulation. IEEE International New Circuits and Systems Conference, Jun 2013, Paris, France. IEEE International New Circuits and Systems Conference, pp.349-352, 2013, 〈10.1109/NEWCAS.2013.6573646〉. 〈hal-01202845〉
  • Daisuke Fujimoto, Noriyuki Miura, Makoto Nagata, Yuichi Hayashi, Naofumi Homma, et al.. On-Chip Power Noise Measurements of Cryptographic VLSI Circuits and Interpretation for Side-Channel Analysis. International Symposium on Electromagnetic Compatibility (EMC Europe), Sep 2013, Brugge, Belgium. IEEE, pp.405-410. 〈hal-01215214〉
  • Endo Sho, Yuichi Hayashi, Naofumi Homma, Takafumi Aoki, Toshihiro Katashita, et al.. Measurement of side-channel information from cryptographic devices on security evaluation platform: Demonstration of SPACES project. SICE Annual Conference, Aug 2012, Akita, Japan. 2012. 〈hal-01540506〉
  • Bruno Robisson, Michel Agoyan, Sylvain Bouquet, Minh Huu Nguyen, Sébastien Le Henaff, et al.. Management of the security in smart secure devices. SSI 2010 - Smart Systems Integration, Mar 2011, Dresden, Germany. pp.1-9, 2011. 〈emse-00620741〉
  • Bruno Robisson, Michel Agoyan, Sébastien Le Henaff, Patrick Soquet, Guillaume Phan, et al.. Implementation of complex strategies of security in secure embedded systems. NTMS 2011 - 4th IFIP International Conference on New Technologies, Mobility and Security, Feb 2011, Paris, France. IEEE, pp.1-5, 2011, 〈10.1109/NTMS.2011.5721145〉. 〈emse-00575870〉
  • Bita Darvish, Pirouz Bazargan Sabet, Patricia Renault. A methodology for Analysis of Voltage Drop in VLSI Digital Circuits. International Conference on Modeling, Simulation and Control (ICMSC'2010), Nov 2010, Cairo, Egypt. International Conference on Modeling, Simulation and Control (ICMSC'2010). 〈hal-01292483〉
  • Michel Agoyan, Bruno Robisson, Minh Huu Nguyen, Pirouz Bazargan-Sabet, Guillaume Phan, et al.. SOS An innovative secure system architecture. Cryptarchi, Jun 2010, Paris, France. 〈cea-01097117〉
  • Michel Agoyan, Pirouz Bazargan Sabet, Karl Bekkou, Bouquet Sylvain, Sébastien Le Henaff, et al.. Smart On Smart. Colloque « Systèmes embarqués, sécurité et sûreté de fonctionnement », Dec 2010, Toulouse, France. 〈cea-01097115〉
  • Patrick Soquet, Bruno Robisson, Michel Agoyan, Guillaume Phan, Pirouz Bazargan Sabet, et al.. Strategy Of Security on Smart On Smart. PACA Security Trends In embedded Security, Jun 2010, Gardanne, France. 〈cea-01097124〉
  • Abdelrezzak Bara, Pirouz Bazargan Sabet, Rémy Chevallier, Emmanuelle Encrenaz, Dominique Le Dû, et al.. Formal Verification of Timed VHDL Programs. Forum on Specification & Design Languages, FDL 2010, Sep 2010, Southampton, United Kingdom. IET, Forum on Specification & Design Languages, FDL 2010, pp.80-85, 〈10.1049/ic.2010.0133〉. 〈hal-01290704〉
  • Patricia Renault, Pirouz Bazargan Sabet. A Novel Method to Determine the RC Interconnect Circuit Outputs. DCIS International Conference on Design of Circuits and Integrated Systems, Nov 2008, Grenoble, France. DCIS International Conference on Design of Circuits and Integrated Systems. 〈hal-01301533〉
  • Nizar Abdallah, Pirouz Bazargan Sabet. Modeling the Effects of Input Slew Rate and Temporal Proximity of Input Transitions in Event-Driven Simulation. SSST IEEE Southeastern Symposium on System Theory, Mar 2006, Cookeville, Tenessess, United States. IEEE, SSST IEEE Southeastern Symposium on System Theory, pp.185-189, 〈10.1109/SSST.2006.1619069〉. 〈hal-01338486〉
  • Patricia Renault, Pirouz Bazargan Sabet. Capturing RC-Interconnect Effect in Crosstalk Analysis. MIXDES 2005 - 12th International conference on Mixed Design of Integrated Circuits and Systems, Jun 2005, Krakow, Poland. MIXDES 2005 - 12th International conference on Mixed Design of Integrated Circuits and Systems, pp.309-314. 〈hal-01419651〉
  • Patricia Renault, Pirouz Bazargan Sabet. Splitting of RC-Network for Accurate Model Reduction. ICM 2004 - 16th International Conference on Microelectronics, Dec 2004, Tunis, Tunisia. IEEE, ICM 2004 - 16th International Conference on Microelectronics, pp.734-737, 〈10.1109/ICM.2004.1434771〉. 〈hal-01498584〉
  • Patricia Renault, Pirouz Bazargan Sabet. Determining The Analytic Waveform of an RC-Circuit Output. MIXDES Mixed Design of Integrated Circuits and Systems, Jun 2004, Szczecin, Poland. MIXDES Mixed Design of Integrated Circuits and Systems, pp.363-368. 〈hal-01521118〉
  • Pirouz Bazargan Sabet, Patricia Renault. Using Symbolic Simulation to Exhibit Worst Case Crosstalk. 4th IEEE Latin-American Test Workshop (LATW'03), Feb 2003, Natal, Brazil. 4th IEEE Latin-American Test Workshop (LATW'03), pp.264-268. 〈hal-01534545〉
  • Pirouz Bazargan Sabet, Patricia Renault. An Event-Driven Approach to Crosstalk Noise Analysis. 36th Annual Simulation Symposium (ANSS'36), Mar 2003, Orlando, FL, United States. IEEE, 36th Annual Simulation Symposium (ANSS'36), pp.319-326, 〈10.1109/SIMSYM.2003.1192829〉. 〈hal-01529859〉