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Influence of thermal and impact ionization stresses on AlGaAs/InGaAs HEMT DC performances
Benoit Lambert
,
Nathalie Malbert
,
Nathalie Labat
,
Andre Touboul
,
Pierre Huguet
International Symposium on Physical and Failure Analysis of Integrated Circuits, 2001, Singapour. pp.1
Communication dans un congrès
hal-00183514v1
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Evolution of LF noise in power PHEMTs submitted to RF and DC step Stresses
Benoit Lambert
,
Nathalie Malbert
,
Nathalie Labat
,
Frédéric Verdier
,
Andre Touboul
,
et al.
Microelectronics Reliability, 2001, 39, pp.1
Article dans une revue
hal-00183495v1
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Analysis of LF noise evolution in power HEMT after DC step lifetests
Benoit Lambert
,
Nathalie Malbert
,
Nathalie Labat
,
Andre Touboul
,
Pierre Huguet
,
et al.
16th International Conference on Noise in Physical Systems and 1/f Fluctuations, 2001, États-Unis. pp.1
Communication dans un congrès
hal-00183513v1
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Breakdown voltage of AlGaAs/InGaAs HEMT submitted to life-tests in impact ionization regime
Benoit Lambert
,
Nathalie Malbert
,
Nathalie Labat
,
Andre Touboul
,
Pierre Huguet
IEEE GaAs Reliability Workshop, 2000, États-Unis. pp.1
Communication dans un congrès
hal-00183517v1
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Investigation on GaAs power MESFETs submitted to RF life-test by LF noise and drain current transient analysis
Nathalie Malbert
,
Benoit Lambert
,
Cristell Maneux
,
Nathalie Labat
,
Andre Touboul
,
et al.
IEEE GaAs Reliability Workshop, 1999, États-Unis. pp.1
Communication dans un congrès
hal-00183476v1
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Comparison of RF and DC life-test effects on GaAs power MESFETs
Benoit Lambert
,
Nathalie Malbert
,
Nathalie Labat
,
Frédéric Verdier
,
Andre Touboul
,
et al.
Microelectronics Reliability, 2000, 40, pp.1
Article dans une revue
hal-00183497v1
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Effects of RF life-test on LF electrical parameters of GaAs power MESFETs
Nathalie Malbert
,
Benoit Lambert
,
Cristell Maneux
,
Nathalie Labat
,
Andre Touboul
,
et al.
Microelectronics Reliability, 1999, 39, pp.1
Article dans une revue
hal-00183094v1
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Outbreak of acute hemorrhagic conjunctivitis in French Guiana and West Indies caused by coxsackievirus A24 variant: phylogenetic analysis reveals Asian import.
Philippe Dussart
,
Gaëlle Cartet
,
Pierre Huguet
,
Nicolas Lévêque
,
Christian Hajjar
,
et al.
Article dans une revue
istex
pasteur-00584126v1
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