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	Pour les 17 documents Envoyer sur ORCID RSS ATOM Exporter BibTeX XML-TEI CSV RTF EndNote PDF HTML Export avancé	Page :	triés par Pertinence Auteur A→Z Auteur Z→A Titre A→Z Titre Z→A Date de publication croissante Date de publication décroissante Date de dépôt croissante Date de dépôt décroissante

		Impact of Resistive Paths on NVM Array Reliability: Application to Flash & ReRAM Memories P. Canet , J. Postel-Pellerin , Hassen Aziza 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2016), Sep 2016, Halle, Germany Communication dans un congrès hal-01463140v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		La mesure en électronique basse fréquence Pierre Canet éditions-ellipses. éditions-ellipses, 2022, 9782340066267 Ouvrages hal-03941060v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Programming optimization for low energy NOR Flash memories V. Della Marca , J. Postel-Pellerin , G. Just , P. Canet , J.-L. Ogier Non-Volatile Memory Workshop, Mar 2015, San Diego, United States Poster de conférence hal-01760653v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Optimization of the ATW Non-Volatile Memory for Connected Smart Objects Jonathan Bartoli , V. Della Marca , Jérémy Postel-Pellerin , Julien Delalleau , Arnaud Regnier , et al. 2015 IEEE International Memory Workshop (IMW), May 2015, Monterey, France. ⟨10.1109/IMW.2015.7150299⟩ Communication dans un congrès hal-01760536v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Impact of endurance degradation on the programming efficiency and the energy consumption of NOR flash memories V. Della Marca , J. Postel-Pellerin , G. Just , P. Canet , J.-L. Ogier Microelectronics Reliability, 2014, 54 (9-10), pp.2262 - 2265. ⟨10.1016/j.microrel.2014.07.063⟩ Article dans une revue hal-01760459v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Électronique - Électronique analogique basse fréquence - Composants, circuits, amplification, filtrage - Cours et exercices corrigés corrigés Editions Ellipses, Collection Technosup, 320 p., Février 2018. ISBN 9782340023376. Pierre Canet 2018 Ouvrages hal-01759139v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		An Augmented OxRAM Synapse for Spiking Neural Network (SNN) Circuits Hassen Aziza , H. Bazzi , J. Postel-Pellerin , P. Canet , M. Moreau , et al. 2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), Apr 2019, Mykonos, France. ⟨10.1109/DTIS.2019.8735057⟩ Communication dans un congrès hal-02306907v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Phenomenological modelling of non-volatile memory threshold voltage shift induced by nonlinear ionization with a femtosecond laser Philippe Chiquet , Maxime Chambonneau , V. Della Marca , Jérémy Postel-Pellerin , Pierre Canet , et al. Scientific Reports, 2019, 9 (7392), ⟨10.1038/s41598-019-43344-x⟩ Article dans une revue hal-02137915v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Impact of Line Resistance Combined with Device Variability on Resistive RAM Memories Hassen Aziza , Pierre Canet , Jérémy Postel-Pellerin Advances in Science, Technology and Engineering Systems Journal, 2018, 3 (1), pp.11-17. ⟨10.25046/aj030102⟩ Article dans une revue hal-02335339v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		ReRAM ON/OFF resistance ratio degradation due to line resistance combined with device variability in 28nm FDSOI technology Hassen Aziza , P. Canet , J. Postel-Pellerin , Mathieu Moreau , Jean-Michel Portal , et al. 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. ⟨10.1109/ULIS.2017.7962594⟩ Communication dans un congrès hal-01745666v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Correlation between 1064 nm laser attack and thermal behavior in STT-MRAM Nicole Yazigy , J. Postel-Pellerin , G. Di Pendina , R.C. Sousa , V. Della Marca , et al. Microelectronics Reliability, 2023, 150, pp.115167. ⟨10.1016/j.microrel.2023.115167⟩ Article dans une revue hal-04524638v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Advanced experimental setup for reliability and current consumption measurements of Flash non-volatile memories V. Della Marca , T. Wakrim , J. Postel-Pellerin , P. Canet IMEKO TC4, Sep 2014, Benevento, Italy Communication dans un congrès hal-01760548v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		NVM cell degradation induced by femtosecond laser backside irradiation for reliability tests V. Della Marca , M. Chambonneau , S. Souiki-Figuigui , J. Postel-Pellerin , P. Canet , et al. 2016 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2016, Pasadena, United States. ⟨10.1109/IRPS.2016.7574580⟩ Communication dans un congrès hal-01418479v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Suppressing the memory state of floating gate transistors with repeated femtosecond laser backside irradiations Maxime Chambonneau , Sarra Souiki Souiki-Figuigui , Philippe Chiquet , Vincenzo Della Marca , Jérémy Postel-Pellerin , et al. Applied Physics Letters, 2017, 110, pp.161112 - 161112 Article dans une revue hal-01655116v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		A new method for test chip and single 40nm NOR Flash cell electrical parameters correlation using a CAST structure T. Kempf , V. Della Marca , P. Canet , A. Regnier , P. Masson , et al. 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), Apr 2018, Hsinchu, Taiwan. ⟨10.1109/VLSI-TSA.2018.8403859⟩ Communication dans un congrès hal-01900783v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Electromagnetic Analysis Perturbation using Chaos Generator Thomas Sarno , Romain Wacquez , Edith Kussener , Philippe Maurine , Khalil Jradi , et al. Truedevice 2016, Nov 2016, Barcelona, Spain Communication dans un congrès hal-01455446v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories P. Canet , J. Postel-Pellerin , Hassen Aziza Microelectronics Reliability, 2016, 64 (SI), pp.36-41. ⟨10.1016/j.microrel.2016.07.096⟩ Article dans une revue hal-01434941v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More