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Philippe Maurine
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Documents
Identifiants chercheurs
- philippe-maurine
- Google Scholar : https://scholar.google.fr/citations?hl=fr&user=VduRIsgAAAAJ&view_op=list_works&sortby=pubdate
- IdRef : 144880717
- 0000-0002-9706-5710
- Google Scholar : https://scholar.google.fr/citations?user=VduRIsgAAAAJ&hl=fr
Présentation
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Evidence of a larger EM-induced fault modelCARDIS: Smart Card Research and Advanced Applications, Nov 2014, Paris, France. pp.245-259, ⟨10.1007/978-3-319-16763-3_15⟩
Communication dans un congrès
emse-01099037v1
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Efficiency of a glitch detector against electromagnetic fault injectionDATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE.2014.216⟩
Communication dans un congrès
lirmm-01096047v1
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Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.1-6, ⟨10.1109/VLSI-SoC.2014.7004189⟩
Communication dans un congrès
lirmm-01434592v1
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Voltage Spikes on the Substrate to Obtain Timing FaultsDSD: Digital System Design, Sep 2013, Santander, Spain. pp.483-486, ⟨10.1109/DSD.2013.146⟩
Communication dans un congrès
lirmm-01096076v1
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Yet Another Fault Injection Technique : by Forward Body Biasing InjectionYACC'2012: Yet Another Conference on Cryptography, Sep 2012, Porquerolles Island, France
Communication dans un congrès
lirmm-00762035v1
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Local EM perturbations into CMOS ring oscillator5th International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC), Nov 2011, Rouen, France
Communication dans un congrès
hal-01904164v1
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Local and Direct Power Injection on CMOS Integrated CircuitsFDTC'2011: Fault Diagnosis and Tolerance in Cryptography, Sep 2011, Nara, Japan. pp.100-104, ⟨10.1109/FDTC.2011.18⟩
Communication dans un congrès
lirmm-00607868v1
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