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Philippe Maurine
20
Documents
Identifiants chercheurs
- philippe-maurine
- Google Scholar : https://scholar.google.fr/citations?hl=fr&user=VduRIsgAAAAJ&view_op=list_works&sortby=pubdate
- IdRef : 144880717
- 0000-0002-9706-5710
- Google Scholar : https://scholar.google.fr/citations?user=VduRIsgAAAAJ&hl=fr
Présentation
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Delay-correlation-aware SSTA based on conditional momentsMicroelectronics Journal, 2012, 43 (4), pp.263-273. ⟨10.1016/j.mejo.2012.01.003⟩
Article dans une revue
lirmm-00761821v1
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Statistical Cells Timing Metrics CharacterizationFTFC: Faible Tension - Faible Consommation, Jun 2012, Paris, France
Communication dans un congrès
lirmm-00762131v1
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Statistical Timing Characterization of Standard Cells with Semi-Monte-Carlo MethodVARI: Workshop on CMOS Variaility, May 2011, Grenoble, France
Communication dans un congrès
lirmm-00617593v1
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Characterizing Statistical Cells Timing Metrics with Semi-Monte-Carlo MethodVLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2011, Hong-Kong, China
Communication dans un congrès
lirmm-00617606v1
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Computing Delay Correlations in SSTAICICDT: International Conference on Integrated Circuit Design & Technology, Jun 2010, Grenoble, France. pp.130-133, ⟨10.1109/ICICDT.2010.5510277⟩
Communication dans un congrès
lirmm-00546301v1
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SSTA with Cell-to-Cell Delay CorrelationsVARI: Workshop on CMOS Variability, May 2010, Montpellier, France
Communication dans un congrès
lirmm-00546322v1
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SSTA with Delay CorrelationsNEWCAS: New Circuits and Systems, Jun 2010, Montreal, QC, Canada. pp.261-266, ⟨10.1109/NEWCAS.2010.5603930⟩
Communication dans un congrès
lirmm-00504882v1
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Interpretation of SSTA ResultsFTFC: Faible Tension - Faible Consommation, Jun 2009, Neuchâtel, Switzerland
Communication dans un congrès
lirmm-00374060v1
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Interpreting SSTA Results with CorrelationPATMOS: Power And Timing Modeling, Optimization and Simulation, Sep 2009, Delft, Netherlands. pp.16-25, ⟨10.1007/978-3-642-11802-9_6⟩
Communication dans un congrès
lirmm-00433505v1
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Étude des violations de temps d'établissement et de maintien dues aux variations du processus de fabrication dans un opérateur arithmétiqueJNRDM 2008 - 11e Journées Nationales du Réseau Doctoral de Microélectronique, May 2008, Bordeaux, France
Communication dans un congrès
lirmm-00281175v2
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SSTA with Correlations Considering input Slope and Output Load VariationsVLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2008, Rhodes Island, Greece. pp.164-167
Communication dans un congrès
lirmm-00332757v1
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Conditional Moments based SSTA Considering Switching Process Induced CorrelationsDCIS: Design of Circuits and Integrated Systems, Nov 2008, Grenoble, France. pp.70-77
Communication dans un congrès
lirmm-00340221v1
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SSTA Considering Effects of Structure Correlations, Input Slope and Output Load VariationsFTFC: Faible Tension - Faible Consommation, May 2008, Louvain-la-Neuve, Belgium. pp.39-43
Communication dans un congrès
lirmm-00288537v1
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Impact de la variabilité des caractéristiques temporelles des cellules combinatoires et séquentielles sur un opérateur numériqueFTFC: Faible Tension - Faible Consommation, May 2008, Louvain-La-Neuve, Belgique
Communication dans un congrès
lirmm-00283731v1
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Setup and Hold Timing Violations Induced by Process Variations, in a Digital MultiplierISVLSI: International Symposium on Very Large Scale Integration, Apr 2008, Montpellier, France. pp.316-321, ⟨10.1109/ISVLSI.2008.70⟩
Communication dans un congrès
lirmm-00280809v1
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SSTA with Structure Correlations Considering input Slope and Output Load VariationsGDR SOC-SIP, Jun 2008, Paris, France. pp.3
Communication dans un congrès
lirmm-00340231v1
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SSTA Considering Switching Process Induced CorrelationsAPCCAS: Asia Pacific Conference on Circuits and System, Nov 2008, Macao, China. pp.562-565, ⟨10.1109/APCCAS.2008.4746085⟩
Communication dans un congrès
lirmm-00340564v1
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A Simple Statistical Timing Analysis Flow and Its Application to Timing Margin EvaluationFTFC: Faible Tension - Faible Consommation, May 2007, Paris, France. pp.19-25
Communication dans un congrès
lirmm-00178454v1
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A Simple Statistical Timing Analysis Flow and its Application to Timing Margin EvaluationPATMOS: Power And Timing Modeling, Optimization and Simulation, Sep 2007, Gothenburg, Sweden. pp.138-147, ⟨10.1007/978-3-540-74442-9_14⟩
Communication dans un congrès
lirmm-00175076v1
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Statistical Timing CharacterizationSoC: System on Chip, Oct 2012, Tampere, Finland. International Symposium on System on Chip, 2012, ⟨10.1109/ISSoC.2012.6376360⟩
Poster de conférence
lirmm-00762107v1
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