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Improving Flash memory endurance and consumption with ultra-short channel-hot-electron programming pulses
J. Postel-Pellerin
,
P. Chiquet
,
V. Della Marca
,
T. Wakrim
,
G. Just
,
et al.
Communication dans un congrès
hal-01760566v1
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Toward an innovative stochastic modeling of electric charges losses trough dielectrics
G. Micolau
,
J. Postel-Pellerin
,
P. Chiquet
,
M. Joelson
,
C. Abbas
,
et al.
Communication dans un congrès
hal-01451874v1
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Determination of physical properties of semiconductor-oxide-semiconductor structures using a new fast gate current measurement protocol.
P. Chiquet
,
P. Masson
,
Gilles Micolau
,
R. Laffont
,
F. Lalande
,
et al.
11th IEEE International Conference on Solid Dielectrics , Jul 2013, Bologne, Italy
Communication dans un congrès
hal-01315415v1
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A global modeling approach of the leakage phenomena in dielectrics
Jérémy Postel-Pellerin
,
Gilles Micolau
,
Philippe Chiquet
,
Maminirina Joelson
,
Jean-Baptiste Decitre
Article dans une revue
hal-02618292v1
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Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices
P. Chiquet
,
J. Postel-Pellerin
,
C. Tuninetti
,
S. Souiki-Figuigui
,
P. Masson
Workshop on New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety, Jun 2016, Milan, Italy
Communication dans un congrès
hal-01437034v1
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Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
V. Della Marca
,
J. Postel-Pellerin
,
T. Kempf
,
A. Regnier
,
P. Chiquet
,
et al.
Article dans une revue
hal-01900789v1
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Ferroelectric HfO2 for Memory Applications: Impact of Si Doping Technique and Bias Pulse Engineering on Switching Performance
T. Francois
,
J. Coignus
,
L. Grenouillet
,
J.P. P Barnes
,
N. Vaxelaire
,
et al.
Communication dans un congrès
hal-02399691v1
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Indirect measurement of low tunneling currents through dielectrics using floating gate structures
J. Postel-Pellerin
,
P. Chiquet
,
Gilles Micolau
,
D. Boyer
IEEE International Conference on Dielectrics (ICD), Jul 2016, Montpellier, France. pp.1065-1068
Communication dans un congrès
hal-01594071v1
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Experimental setup for non-destructive measurement of tunneling currents in semiconductor devices
Philippe Chiquet
,
Pascal Masson
,
Jérémy Postel-Pellerin
,
Romain Laffont
,
Gilles Micolau
,
et al.
Article dans une revue
hal-01315418v1
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Enhancement of flash memory endurance using short pulsed program/erase signals
P. Chiquet
,
J. Postel-Pellerin
,
C. Tuninetti
,
S. Souiki-Figuigui
,
P. Masson
Article dans une revue
hal-01451431v1
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Phenomenological modelling of non-volatile memory threshold voltage shift induced by nonlinear ionization with a femtosecond laser
Philippe Chiquet
,
Maxime Chambonneau
,
V. Della Marca
,
Jérémy Postel-Pellerin
,
Pierre Canet
,
et al.
Article dans une revue
hal-02137915v1
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NVM cell degradation induced by femtosecond laser backside irradiation for reliability tests
V. Della Marca
,
M. Chambonneau
,
S. Souiki-Figuigui
,
J. Postel-Pellerin
,
P. Canet
,
et al.
Communication dans un congrès
hal-01418479v1
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Simulation of the programming efficiency and the energy consumption of Flash memories during endurance degradation
J. Postel-Pellerin
,
P. Chiquet
,
V. Della Marca
Communication dans un congrès
hal-01436469v1
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Suppressing the memory state of floating gate transistors with repeated femtosecond laser backside irradiations
Maxime Chambonneau
,
Sarra Souiki Souiki-Figuigui
,
Philippe Chiquet
,
Vincenzo Della Marca
,
Jérémy Postel-Pellerin
,
et al.
Applied Physics Letters, 2017, 110, pp.161112 - 161112
Article dans une revue
hal-01655116v1
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