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Toward an innovative stochastic modeling of electric charges losses trough dielectrics

 G. Micolau , J. Postel-Pellerin , P. Chiquet , M. Joelson , C. Abbas , et al.
Inter-Disciplinary Underground Science and Technology (i-DUST) Conference, Jun 2016, Avignon, France. pp.9, ⟨10.1051/e3sconf/20161204004⟩
Communication dans un congrès hal-01451874v1

Improving Flash memory endurance and consumption with ultra-short channel-hot-electron programming pulses

 J. Postel-Pellerin , P. Chiquet , V. Della Marca , T. Wakrim , G. Just , et al.
2014 International Semiconductor Conference (CAS), Oct 2014, Sinaia, France. ⟨10.1109/SMICND.2014.6966433⟩
Communication dans un congrès hal-01760566v1

Determination of physical properties of semiconductor-oxide-semiconductor structures using a new fast gate current measurement protocol.

 P. Chiquet , P. Masson , Gilles Micolau , R. Laffont , F. Lalande , et al.
11th IEEE International Conference on Solid Dielectrics , Jul 2013, Bologne, Italy
Communication dans un congrès hal-01315415v1
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A global modeling approach of the leakage phenomena in dielectrics

 Jérémy Postel-Pellerin , Gilles Micolau , Philippe Chiquet , Maminirina Joelson , Jean-Baptiste Decitre
E3S Web of Conferences, 2019, 88, pp.05002. ⟨10.1051/e3sconf/20198805002⟩
Article dans une revue hal-02618292v1

Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices

 P. Chiquet , J. Postel-Pellerin , C. Tuninetti , S. Souiki-Figuigui , P. Masson
Workshop on New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety, Jun 2016, Milan, Italy
Communication dans un congrès hal-01437034v1
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Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction

 V. Della Marca , J. Postel-Pellerin , T. Kempf , A. Regnier , P. Chiquet , et al.
Microelectronics Reliability, 2018, 88-90, pp.159 - 163. ⟨10.1016/j.microrel.2018.06.116⟩
Article dans une revue hal-01900789v1
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Ferroelectric HfO2 for Memory Applications: Impact of Si Doping Technique and Bias Pulse Engineering on Switching Performance

 T. Francois , J. Coignus , L. Grenouillet , J.P. P Barnes , N. Vaxelaire , et al.
2019 IEEE 11th International Memory Workshop (IMW), May 2019, Monterey, United States. pp.1-4, ⟨10.1109/IMW.2019.8739664⟩
Communication dans un congrès hal-02399691v1
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NVM cell degradation induced by femtosecond laser backside irradiation for reliability tests

 V. Della Marca , M. Chambonneau , S. Souiki-Figuigui , J. Postel-Pellerin , P. Canet , et al.
2016 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2016, Pasadena, United States. ⟨10.1109/IRPS.2016.7574580⟩
Communication dans un congrès hal-01418479v1

Simulation of the programming efficiency and the energy consumption of Flash memories during endurance degradation

 J. Postel-Pellerin , P. Chiquet , V. Della Marca
International Semiconductor Conference (CAS), 2016, Oct 2016, Sinaia, Romania. ⟨10.1109/SMICND.2016.7783052⟩
Communication dans un congrès hal-01436469v1
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Suppressing the memory state of floating gate transistors with repeated femtosecond laser backside irradiations

 Maxime Chambonneau , Sarra Souiki Souiki-Figuigui , Philippe Chiquet , Vincenzo Della Marca , Jérémy Postel-Pellerin , et al.
Applied Physics Letters, 2017, 110, pp.161112 - 161112
Article dans une revue hal-01655116v1

Indirect measurement of low tunneling currents through dielectrics using floating gate structures

 J. Postel-Pellerin , P. Chiquet , Gilles Micolau , D. Boyer
IEEE International Conference on Dielectrics (ICD), Jul 2016, Montpellier, France. pp.1065-1068
Communication dans un congrès hal-01594071v1

Experimental setup for non-destructive measurement of tunneling currents in semiconductor devices

 Philippe Chiquet , Pascal Masson , Jérémy Postel-Pellerin , Romain Laffont , Gilles Micolau , et al.
Measurement - Journal of the International Measurement Confederation (IMEKO), 2014, 54, pp.234-240. ⟨10.1016/j.measurement.2014.02.015⟩
Article dans une revue hal-01315418v1

Enhancement of flash memory endurance using short pulsed program/erase signals

 P. Chiquet , J. Postel-Pellerin , C. Tuninetti , S. Souiki-Figuigui , P. Masson
ACTA IMEKO, 2016, 5 (4), pp.29-36. ⟨10.21014/acta_imeko.v5i4.422⟩
Article dans une revue hal-01451431v1
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Phenomenological modelling of non-volatile memory threshold voltage shift induced by nonlinear ionization with a femtosecond laser

 Philippe Chiquet , Maxime Chambonneau , V. Della Marca , Jérémy Postel-Pellerin , Pierre Canet , et al.
Scientific Reports, 2019, 9 (7392), ⟨10.1038/s41598-019-43344-x⟩
Article dans une revue hal-02137915v1
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