A NEW METHODOLOGY FOR EXTRACTION OF DYNAMIC COMPACT THERMAL MODELS
Wasim Habra
,
Patrick Tounsi
,
F. Madrid
,
P. Dupuy
,
Clément Barbot
,
et al.
THERMINIC 2007 , Sep 2007, Budapest, Hungary. pp.141-144
Communication dans un congrès
hal-00202550v1
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New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs
Nabil El-Belghiti
,
Patrick Tounsi
,
Alexandre Boyer
,
Arnaud Viard
Communication dans un congrès
hal-01997428v1
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Detecting PCB Assembly defects using infrared thermal signatures
Nabil El Belghiti Alaoui
,
Patrick Tounsi
,
Alexandre Boyer
,
Arnaud Viard
Communication dans un congrès
hal-02319460v1
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Implementation of Thermoelectric Generators in Airliners for Powering,Battery-free Wireless Sensor Networks
Jean-Marie Dilhac
,
Romain Monthéard
,
Marise Bafleur
,
Vincent Boitier
,
Nicolas Nolhier
,
et al.
Journal of Electronic Materials , 2014, 43 (6), pp.2444-2451
Article dans une revue
hal-00998857v1
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Degradation indicators of power-GaN-HEMT under switching power-cycling
M A González-Sentís
,
Patrick Tounsi
,
A. Bensoussan
,
A. Dufour
Communication dans un congrès
hal-02613682v1
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Drift effects and trap analysis of power-GaN-HEMT under switching power cycling
Manuel A González-Sentís
,
Patrick Tounsi
,
Alain Bensoussan
,
Arnaud Dufour
Science of Electronics, Technologies of Information and Telecommunication, SETIT’18 , Dec 2018, Hammamet, Tunisia
Communication dans un congrès
hal-02131990v1
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Electrothermal Characterization of Double-Sided Cooling Si Power Module
Sébastien Sanchez
,
Cong Tu Nguyen
,
Claudia Cadile
,
Jean-Pierre Fradin
,
Patrick Tounsi
,
et al.
Communication dans un congrès
hal-02613793v1
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Using Compact Thermal Modelling for the investigation of a cooling system dysfunction applied to a power module with double sided cooling
Anais Cassou
,
Patrick Tounsi
,
Jean-Pierre Fradin
Communication dans un congrès
hal-02613604v1
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Modélisation avancée de module de puissance
Patrick Austin
,
Rodolphe de Maglie
,
Jean-Louis Sanchez
,
Jean-Luc Schanen
,
Patrick Tounsi
,
et al.
Journées GdR , Oct 2005, Lyon, France
Communication dans un congrès
hal-00187678v1
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New defect detection approach using near electromagnetic field probing of high density PCBAs
Nabil El Belghiti Alaoui
,
Alexandre Boyer
,
Patrick Tounsi
,
A. Viard
Article dans une revue
hal-01885517v1
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Development of SiC MOSFET electrical model and experimental validation: improvement and reduction of parameter number
Quang Nguyen
,
Patrick Tounsi
,
Jean-Pierre Fradin
,
Jean-Michel Reynes
26th International Conference "Mixed Design of Integrated Circuits and Systems MIXDES 2019 , Lodz University of Technology Department of Microelectronics and Computer Science, Jun 2019, Rzeszów, Poland
Communication dans un congrès
hal-03655841v1
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Advanced Compact Thermal Modeling by using VHDL-AMS
Wasim Habra
,
Patrick Tounsi
,
Jean-Marie Dorkel
THERMINIC 2006 , Sep 2006, Nice, France. pp.225-228
Communication dans un congrès
hal-00171380v1
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Study of CVD diamond films for thermal management in power electronics
Henri Schneider
,
Marie-Laure Locatelli
,
J. Achard
,
Emmanuel Scheid
,
Patrick Tounsi
,
et al.
EPE 2007: 12th European Conference on Power Electronics and Applications, Aalborg, Denmark , 2007, Aalborg, Denmark. pp.1-8
Communication dans un congrès
hal-03877112v1
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Investigation of SiC MOSFET channel reverse conduction
Quang Nguyen
,
Patrick Tounsi
,
Jean-Pierre Fradin
,
Jean-Michel Reynes
Communication dans un congrès
hal-02613785v1
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Compact thermal modelling for fast simulating consequences of pump defect: application to power module with double efficient cooling
Anais Cassou
,
Patrick Tounsi
,
Jean-Pierre Fradin
Communication dans un congrès
hal-02613655v1
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Investigation on the use of the MOSFET SiC body diode for junction temperature measurement
Quang Chuc Nguyen
,
Patrick Tounsi
,
Jean-Pierre Fradin
,
Jean-Michel Reynes
IEEE THERMINIC 2020 , Fraunhofer Berlin, Sep 2020, Berlin, Germany
Communication dans un congrès
hal-03655865v1
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New defect detection approach using near electromagnetic field probing for high density PCBAs New defect detection approach using near electromagnetic field probing of high density PCBAs
Nabil El Belghiti Alaoui
,
Patrick Tounsi
,
Alexandre Boyer
,
Arnaud Viard
29 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018) , Oct 2018, Aalborg, Denmark.
⟨10.1016/j.microrel.2018.07.090⟩
Communication dans un congrès
hal-02319457v1
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In situ characterisation of non linear capacitors
Lionel Laudebat
,
Vincent Bley
,
Thierry Lebey
,
Henri Schneider
,
Patrick Tounsi
Article dans une revue
istex
hal-02536621v1
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Development of SiC MOSFET Electrical Model and Experimental Validation: Improvement and Reduction of Parameter Number
Nguyen Quang
,
Patrick Tounsi
,
Jean-Pierre Fradin
,
Jean-Michel Reynes
26th International Conference "Mixed Design of Integrated Circuits and Systems" (MIXDES 2019) , Jun 2019, Rzeszów, Poland. pp.298 - 301,
⟨10.23919/MIXDES.2019.8787050⟩
Communication dans un congrès
hal-02613777v1
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Upgrading In-Circuit Test of high density PCBAs using electromagnetic measurement and Principal Component Analysis
Nabil El Belghiti Alaoui
,
Alexandre Boyer
,
Patrick Tounsi
,
Arnaud Viard
Article dans une revue
hal-01944924v1
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Using infrared thermal responses for PCBA production tests: Feasibility study
Nabil El Belghiti Alaoui
,
Anais Cassou
,
Patrick Tounsi
,
Alexandre Boyer
,
Arnaud Viard
30 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019) , Sep 2019, Toulouse, France
Communication dans un congrès
hal-02319468v1
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Extraction of compact transient thermal models for a global optimization of a power system based on SiC MOSFETs switches
Anaïs Cassou
,
Quang Chuc Nguyen
,
Patrick Tounsi
,
Jean-Pierre Fradin
,
Marc Budinger
,
et al.
26th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC 2020) , Sep 2020, Berlin, Germany
Communication dans un congrès
hal-03655834v1
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TRANSIENT COMPACT MODELING FOR MULTI CHIPS COMPONENTS
Wasim Habra
,
Patrick Tounsi
,
Jean-Marie Dorkel
THERMINIC 2005 , Sep 2005, Belgirate, Lago Maggiore, Italy. pp.129-134
Communication dans un congrès
hal-00189464v1
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