Patrick Girard

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95540

"alberto-bosio"

"elena-ioana-vatajelu"

	Analyzing resistive-open defects in SRAM core-cell under the effect of process variability Elena Ioana Vatajelu , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial ETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569373⟩ Communication dans un congrès lirmm-01921630v1