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Patrick Girard
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An Effective Power-Aware At-Speed Test Methodology for IP Qualification and CharacterizationJournal of Electronic Testing: : Theory and Applications, 2016, 32 (6), pp.721-733. ⟨10.1007/s10836-016-5621-1⟩
Article dans une revue
lirmm-01446887v1
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Design and performance parameters of an ultra-low voltage, single supply 32bit processor implemented in 28nm FDSOI technologyISQED 2015 - 16th International Symposium on Quality Electronic Design, Apr 2015, Santa Clara, United States. pp.366-370, ⟨10.1109/ISQED.2015.7085453⟩
Communication dans un congrès
lirmm-01272913v1
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