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Patrick Girard

28
Documents
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Publications

982206
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Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Aibin Yan , Litao Wang , Jie Cui , Zhengfeng Huang , Tianming Ni
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2024, 32 (1), pp.116-127. ⟨10.1109/TVLSI.2023.3323562⟩
Article dans une revue lirmm-04239391v1
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Designs of Array Multipliers with an Optimized Delay in Quantum-Dot Cellular Automata

Aibin Yan , Xuehua Li , Runqi Liu , Zhengfeng Huang , Patrick Girard
Electronics, 2023, 12 (14), pp.3189. ⟨10.3390/electronics12143189⟩
Article dans une revue lirmm-04239247v1
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Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications

Aibin Yan , Aoran Cao , Zhengfeng Huang , Jie Cui , Tianming Ni
IEEE Transactions on Emerging Topics in Computing, 2023, 11 (4), pp.1070-1081. ⟨10.1109/TETC.2023.3317070⟩
Article dans une revue lirmm-04239309v1
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A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications

Aibin Yan , Yuting He , Xiaoxiao Niu , Jie Cui , Tianming Ni
IEEE Design & Test, 2023, 40 (4), pp.34-41. ⟨10.1109/MDAT.2023.3267747⟩
Article dans une revue lirmm-04236363v1
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Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments

Aibin Yan , Zhixing Li , Jie Cui , Zhengfeng Huang , Tianming Ni
IEEE Transactions on Aerospace and Electronic Systems, 2023, 59 (3), pp.2885-2897. ⟨10.1109/TAES.2022.3219372⟩
Article dans une revue lirmm-04236216v1
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Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications

Aibin Yan , Jing Xiang , Yang Chang , Zhengfeng Huang , Jie Cui
Microelectronics Journal, 2023, 139, pp.105908. ⟨10.1016/j.mejo.2023.105908⟩
Article dans une revue lirmm-04239447v1
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LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments

Aibin Yan , Zhixing Li , Jie Cui , Zhengfeng Huang , Tianming Ni
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023, 42 (6), pp.2069-2073. ⟨10.1109/TCAD.2022.3213212⟩
Article dans une revue lirmm-03770056v1
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Cost-Effective and Highly Reliable Circuit Components Design for Safety-Critical Applications

Aibin Yan , Zhengzheng Fan , Liang Ding , Jie Cui , Zhengfeng Huang
IEEE Transactions on Aerospace and Electronic Systems, 2022, 58 (1), pp.517-529. ⟨10.1109/TAES.2021.3103586⟩
Article dans une revue lirmm-03380293v1
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Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications

Aibin Yan , Jing Xiang , Aoran Cao , Zhihui He , Jie Cui
IEEE Transactions on Device and Materials Reliability, 2022, 22 (2), pp.282-295. ⟨10.1109/TDMR.2022.3175324⟩
Article dans une revue lirmm-03769794v1
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Designs of Level-Sensitive T Flip-Flops and Polar Encoders Based on Two XOR/XNOR Gates

Aibin Yan , Runqi Liu , Zhengfeng Huang , Patrick Girard , Xiaoqing Wen
Electronics, 2022, 11 (10), pp.1658. ⟨10.3390/electronics11101658⟩
Article dans une revue lirmm-03769025v1
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Novel Quadruple-Node-Upset-Tolerant Latch Designs with Optimized Overhead for Reliable Computing in Harsh Radiation Environments

Aibin Yan , Zhelong Xu , Xiangfeng Feng , Jie Cui , Zhili Chen
IEEE Transactions on Emerging Topics in Computing, 2022, 10 (1), pp.404-413. ⟨10.1109/TETC.2020.3025584⟩
Article dans une revue lirmm-03031709v1
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Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications

Aibin Yan , Zhihui He , Jun Zhou , Jie Cui , Tianming Ni
Microelectronics Journal, 2021, 111, pp.#105034. ⟨10.1016/j.mejo.2021.105034⟩
Article dans une revue lirmm-03380265v1

Information Assurance through Redundant Design: A Novel TNU Error Resilient Latch for Harsh Radiation Environment

Aibin Yan , Yuanjie Hu , Jie Cui , Zhili Chen , Zhengfeng Huang
IEEE Transactions on Computers, 2020, 69 (6), pp.789-799. ⟨10.1109/TC.2020.2966200⟩
Article dans une revue lirmm-02395602v1

Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells based Multiple-Node-Upset-Tolerant Latch Designs

Aibin Yan , Yafei Ling , Jie Cui , Zhili Chen , Zhengfeng Huang
IEEE Transactions on Circuits and Systems Part 1 Fundamental Theory and Applications, 2020, 67 (3), pp.879-890. ⟨10.1109/TCSI.2019.2959007⟩
Article dans une revue lirmm-02399091v1
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Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches for Low Power and Low-Orbit Aerospace Applications

Aibin Yan , Yan Chen , Zhelong Xu , Zhili Chen , Jie Cui
IEEE Transactions on Aerospace and Electronic Systems, 2020, 56 (5), pp.3931-3940. ⟨10.1109/TAES.2020.2982341⟩
Article dans une revue lirmm-03031912v1
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Novel Quadruple Cross-Coupled Memory Cell Designs Protected against Single Event Upsets and Double-Node Upsets

Aibin Yan , Yuanjie Hu , Jun Zhou , Jie Cui , Zhengfeng Huang
IEEE Access, 2019, 7, pp.176188-176196. ⟨10.1109/ACCESS.2019.2958109⟩
Article dans une revue lirmm-02395589v1
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Design of Low-Cost Approximate CMOS Full Adders

Aibin Yan , Shaojie Wei , Zhixing Li , Jie Cui , Zhengfeng Huang
ISCAS 2023 - IEEE International Symposium on Circuits and Systems, May 2023, Monterey, CA, United States. ⟨10.1109/ISCAS46773.2023.10181531⟩
Communication dans un congrès lirmm-04241285v1
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MCTHSL: 4×4-Device-Matrix-Based Cost-Optimized TNU-Recovery HIS-Insensitive and SET-Filterable Latch for Aerospace Applications

Aibin Yan , Zhuoyuan Lin , Jie Cui , Zhengfeng Huang , Tianming Ni
DAC 2023 - ACM/EDAA Design Automation Conference, Jul 2023, San Francisco, United States
Communication dans un congrès lirmm-04240386v1
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A Low Overhead and Double-Node-Upset Self-Recoverable Latch

Aibin Yan , Fan Xia , Tianming Ni , Jie Cui , Zhengfeng Huang
ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan
Communication dans un congrès lirmm-04241214v1
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Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications

Aibin Yan , Jing Xiang , Zhengfeng Huang , Tianming Ni , Jie Cui
ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan
Communication dans un congrès lirmm-04241173v1
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High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology

Aibin Yan , Zhen Zhou , Liang Ding , Jie Cui , Zhengfeng Huang
DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition, Apr 2023, Antwerp, Belgium. ⟨10.23919/DATE56975.2023.10136927⟩
Communication dans un congrès lirmm-04240330v1
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Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness

Aibin Yan , Yu Chen , Shaojie Wei , Jie Cui , Zhengfeng Huang
ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan
Communication dans un congrès lirmm-04240494v1
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A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage

Aibin Yan , Liang Ding , Zhen Zhou , Zhengfeng Huang , Jie Cui
ATS 2022 - 31st IEEE Asian Test Symposium, Nov 2022, Taichung, Taiwan. ⟨10.1109/ATS56056.2022.00013⟩
Communication dans un congrès lirmm-03770951v1
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Two 0.8 V, Highly Reliable RHBD 10T and 12T SRAM Cells for Aerospace Applications

Aibin Yan , Zhihui He , Jing Xiang , Jie Cui , Yong Zhou
GLVLSI 2022 - 32nd ACM Great Lakes Symposium on VLSI, Jun 2022, Irvine, CA, United States. pp.261-266, ⟨10.1145/3526241.3530312⟩
Communication dans un congrès lirmm-03770855v1
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Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS

Aibin Yan , Shukai Song , Jixiang Zhang , Jie Cui , Zhengfeng Huang
ITC-Asia 2022 - IEEE International Test Conference in Asian, Aug 2022, Taipei, Taiwan. pp.73-78, ⟨10.1109/ITCAsia55616.2022.00023⟩
Communication dans un congrès lirmm-03770182v1
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Sextuple Cross-Coupled-DICE Based Double-Node-Upset Recoverable and Low-Delay Flip-Flop for Aerospace Applications

Aibin Yan , Yu Chen , Shukai Song , Zijie Zhai , Jie Cui
GLVLSI 2022 - 32nd ACM Great Lakes Symposium on VLSI, Jun 2022, Irvine, CA, United States. pp.333-338, ⟨10.1145/3526241.3530355⟩
Communication dans un congrès lirmm-03770880v1
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A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications

Aibin Yan , Kuikui Qian , Jie Cui , Ningning Cui , Zhengfeng Huang
VTS 2022 - IEEE 40th VLSI Test Symposium, Apr 2022, San Diego, CA, United States. pp.1-6, ⟨10.1109/VTS52500.2021.9794197⟩
Communication dans un congrès lirmm-03770473v1
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Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications

Aibin Yan , Zhelong Xu , Jie Cui , Zuobin Ying , Zhengfeng Huang
ISCAS 2020 - IEEE International Symposium on Circuits and Systems, Oct 2020, Sevilla (virtual), Spain. pp.1-5, ⟨10.1109/ISCAS45731.2020.9181135⟩
Communication dans un congrès lirmm-03035619v1