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Patrick Girard
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- patrick-girard-lirmm
- 0000-0003-0722-8772
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A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and CrosstalkJournal of Electronic Testing: : Theory and Applications, 2012, 28 (2), pp.201-214. ⟨10.1007/s10836-011-5268-x⟩
Article dans une revue
lirmm-00816589v1
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