Documentation
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Patrick Girard

13

Documents

Identifiants chercheurs

patrick-girard-lirmm
0000-0003-0722-8772

Présentation

Publications

938981

	Design for Test and Diagnosis of Power Switches Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel Journal of Circuits, Systems, and Computers, 2016, 25 (3), pp.1640013. ⟨10.1142/S0218126616400132⟩ Article dans une revue lirmm-01272986v1
	Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio Journal of Low Power Electronics, 2013, 9 (2), pp.253-263. ⟨10.1166/jolpe.2013.1259⟩ Article dans une revue lirmm-00934937v1

	Auto-adaptive ultra-low power IC Alberto Bosio , Philippe Debaud , Patrick Girard , Stéphane Guilhot , Miroslav Valka DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2016, Istanbaul, Turkey. ⟨10.1109/DTIS.2016.7483886⟩ Communication dans un congrès lirmm-01457361v1
	Design-for-Diagnosis Architecture for Power Switches Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.43-48, ⟨10.1109/DDECS.2015.18⟩ Communication dans un congrès lirmm-01272684v1
	iBoX — Jitter based Power Supply Noise sensor Miroslav Valka , Alberto Bosio , Luigi Dilillo , Aida Todri-Sanial , Arnaud Virazel ETS: European Test Symposium, May 2014, Paderborn, United States. ⟨10.1109/ETS.2014.6847830⟩ Communication dans un congrès lirmm-01248601v1
	Test and diagnosis of power switches Miroslav Valka , Alberto Bosio , Luigi Dilillo , Aida Todri-Sanial , Arnaud Virazel DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218, ⟨10.1109/DDECS.2014.6868792⟩ Communication dans un congrès lirmm-01248590v1
	Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial Colloque GDR SoC-SiP, 2012, Paris, France Communication dans un congrès lirmm-00806859v1
	Power Supply Noise Sensor Based on Timing Uncertainty Measurements Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.161-166, ⟨10.1109/ATS.2012.46⟩ Communication dans un congrès lirmm-00806890v1
	Peak Power Estimation: A Case Study on CPU Cores Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio IEEE Asian Test Symposium, Nov 2012, Niigata, Japan. pp.167-172, ⟨10.1109/ATS.2012.58⟩ Communication dans un congrès lirmm-00805389v1
	A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch ETS 2011 - 16th IEEE European Test Symposium, May 2011, Trondheim, Norway. pp.153-158, ⟨10.1109/ETS.2011.21⟩ Communication dans un congrès lirmm-00647822v1
	Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector Luigi Dilillo , Alberto Bosio , Miroslav Valka , Patrick Girard , Serge Pravossoudovitch DFT 2011 - International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.294-301, ⟨10.1109/DFT.2011.41⟩ Communication dans un congrès lirmm-00651226v1

	Efficient power supply noise measurement based on timing uncertainty Miroslav Valka , Alberto Bosio , Mickael Broutin , Philippe Debaud , Patrick Girard France, Patent n° : EP2883067B1. 2013 Brevet lirmm-02089880v1
	Adaptive Voltage Scaling Mechanism Based on Voltage Shoot Measurement Miroslav Valka , Alberto Bosio , Philippe Debaud , Patrick Girard , Stephane Guilhot France, Patent n° : WO2014023812A1. 2013 Brevet lirmm-02089887v1