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Patrick Girard

9
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Publications

938758

Dynamic-Stress Neutrons Test of Commercial SRAMs

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné
IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Communication dans un congrès lirmm-00805349v1

Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench

Luigi Dilillo , Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel
IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6
Communication dans un congrès lirmm-00805120v1

Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor

Luigi Dilillo , Alberto Bosio , Paolo Rech , Patrick Girard , Frédéric Wrobel
IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩
Communication dans un congrès lirmm-00805394v1

Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Frédéric Wrobel
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩
Communication dans un congrès lirmm-00805314v1

Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria
Communication dans un congrès lirmm-00566847v1

A Memory Fault Simulator for Radiation-Induced Effects in SRAMs

Paolo Rech , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel
ATS: Asian Test Symposium, 2010, Shanghai, China. pp.100-105
Communication dans un congrès lirmm-00545102v1

A Roaming Memory Test Bench for Detecting Particle Induced SEUs

Jean-Marc J.-M. Galliere , Paolo Rech , Patrick Girard , Luigi Dilillo
ITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩
Poster de conférence lirmm-00537879v1