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Patrick Girard
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Documents
Identifiants chercheurs
- patrick-girard-lirmm
- 0000-0003-0722-8772
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Dynamic Compact Model of Self-Referenced Magnetic Tunnel JunctionIEEE Transactions on Electron Devices, 2014, 61 (11), pp.3877-3882. ⟨10.1109/TED.2014.2355418⟩
Article dans une revue
lirmm-01272978v1
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A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMsIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (11), pp.2326-2335. ⟨10.1109/TVLSI.2013.2294080⟩
Article dans une revue
lirmm-01248578v1
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Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive DefectsVALID: Advances in System Testing and Validation Lifecycle, Oct 2013, Venice, Italy. pp.39-44
Communication dans un congrès
lirmm-01433308v1
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Impact of Resistive-Bridge Defects in TAS-MRAM ArchitecturesATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.125-130, ⟨10.1109/ATS.2012.37⟩
Communication dans un congrès
lirmm-00806809v1
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Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM ArchitecturesDATE 2012 - 15th Design, Automation and Test in Europe Conference and Exhibition, Mar 2012, Dresden, Germany. pp.532-537, ⟨10.1109/DATE.2012.6176526⟩
Communication dans un congrès
lirmm-00689024v1
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Coupling-Based Resistive-Open Defects in TAS-MRAM ArchitecturesETS: European Test Symposium, May 2012, Annecy, France. Test Symposium (ETS), 2012 17th IEEE European, 2012, ⟨10.1109/ETS.2012.6233034⟩
Poster de conférence
lirmm-00806793v1
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