Documentation
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Patrick Girard

12

Documents

Identifiants chercheurs

patrick-girard-lirmm
0000-0003-0722-8772

Présentation

Publications

845063

	Analysis of Resistive-Open Defects in SRAM Sense Amplifiers Alexandre Ney , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2009, 17 (10), pp.1556-1559. ⟨10.1109/TVLSI.2008.2005194⟩ Article dans une revue lirmm-00371367v1

	A New Design-for-Test Technique for SRAM Core-Cell Stability Faults Alexandre Ney , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel DATE: Design, Automation and Test in Europe, Apr 2009, Nice, France. pp.1344-1348, ⟨10.1109/DATE.2009.5090873⟩ Communication dans un congrès lirmm-00371374v1
	An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing Alexandre Ney , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan VTS'08: VLSI Test Symposium, May 2008, San Diego, CA, USA, pp.89-94 Communication dans un congrès lirmm-00281558v1
	A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs Alexandre Ney , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch ITC'2008: International Test Conference, Oct 2008, Santa Clara, CA, United States. pp.1-10, ⟨10.1109/TEST.2008.4700555⟩ Communication dans un congrès lirmm-00341798v1
	A Design-for-Diagnosis Technique for SRAM Write Drivers Alexandre Ney , Patrick Girard , Christian Landrault , Serge Pravossoudovitch , Arnaud Virazel DATE: Design, Automation and Test in Europe, Mar 2008, Munich, Germany. pp.1480-1485, ⟨10.1109/DATE.2008.4484883⟩ Communication dans un congrès lirmm-00341796v1
	A Signature-based Approach for Diagnosis of Dynamic Faults in SRAMs Alexandre Ney , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2008, Tunis, Tunisia. pp.001-006, ⟨10.1109/DTIS.2008.4540243⟩ Communication dans un congrès lirmm-00324143v1
	A History-Based Technique for Faults Diagnosis in SRAMs Alexandre Ney , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch Colloque GDR SoC-SiP, France Communication dans un congrès lirmm-00341821v1
	Dynamic Two-Cell Incorrect Read Fault due to Resistive-Open Defects in the Sense Amplifiers of SRAMs Alexandre Ney , Patrick Girard , Christian Landrault , Serge Pravossoudovitch , Arnaud Virazel ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.97-104, ⟨10.1109/ETS.2007.19⟩ Communication dans un congrès lirmm-00158116v1
	Slow Write Driver Faults in 65nm SRAM Technology: Analysis and March Test Solution Alexandre Ney , Patrick Girard , Christian Landrault , Serge Pravossoudovitch , Arnaud Virazel DATE: Design, Automation and Test in Europe, Apr 2007, Nice, France. pp.528-533, ⟨10.1109/DATE.2007.364647⟩ Communication dans un congrès lirmm-00187037v1
	Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior Magali Bastian Hage-Hassan , Vincent Gouin , Patrick Girard , Christian Landrault , Alexandre Ney ATS 2007 - 16th IEEE Asian Test Symposium, Oct 2007, Beijing, China. pp.501-504, ⟨10.1109/ATS.2007.121⟩ Communication dans un congrès lirmm-00179276v1
	Un-Restored Destructive Write Faults due to Resistive-Open Defects in the Write Driver of SRAMs Alexandre Ney , Patrick Girard , Christian Landrault , Serge Pravossoudovitch , Arnaud Virazel VTS 2007 - 25th IEEE VLSI Test Symposium, May 2007, Berkeley, CA, United States. pp.361-366, ⟨10.1109/VTS.2007.84⟩ Communication dans un congrès lirmm-00155979v1
	Resistive-Open Defect Influences in SRAM I/O Circuitry Alexandre Ney , Patrick Girard , Christian Landrault , Serge Pravossoudovitch , Arnaud Virazel Colloque du GDR SoC-SiP, Jun 2007, Paris, France Communication dans un congrès lirmm-00194282v1