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Patrick Girard
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Documents
Identifiants chercheurs
- patrick-girard-lirmm
- 0000-0003-0722-8772
Présentation
Publications
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A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlashJournal of Electronic Testing: : Theory and Applications, 2009, N/A, pp.127-144. ⟨10.1007/s10836-008-5096-9⟩
Article dans une revue
lirmm-00371370v1
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Test des Mémoires Flash Embarquées : Analyse de la perturbation entre cellules FloTOx voisines durant une phase de programmationJournées Nationales du Réseau Doctoral de Microélectronique, France
Communication dans un congrès
lirmm-00194274v1
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Embedded Flash TestingColloque du GDR SoC-SiP, Jun 2007, Paris, France
Communication dans un congrès
lirmm-00194277v1
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Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel WindowVTS'07: 25th IEEE VLSI Test Symposium, May 2007, Berkeley, CA (USA), pp.47-52
Communication dans un congrès
lirmm-00151034v1
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A Concurrent Approach for Testing Address Decoder Faults in eFlash MemoriesITC'07: International Test Conference, paper 3.2
Communication dans un congrès
lirmm-00194260v1
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Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash MemoriesETS: European Test Symposium, May 2007, Freiburg, Germany. pp.77-82, ⟨10.1109/ETS.2007.20⟩
Communication dans un congrès
lirmm-00158543v1
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Embedded Flash Testing: Overview and PerspectivesDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Sep 2006, Tunis, Tunisia. pp.210-215
Communication dans un congrès
lirmm-00093665v1
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An Overview of Failure Mechanisms in Embedded Flash MemoriesVTS'06: VLSI Test Symposium, Apr 2006, Berkeley, CA, United States. pp.108-113
Communication dans un congrès
lirmm-00102761v1
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