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Patrick Girard
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Documents
Identifiants chercheurs
patrick-girard-lirmm-
0000-0003-0722-8772
Présentation
Publications
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An effective fault-injection framework for memory reliability enhancement perspectivesDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2017, Palma de Mallorca, Spain. ⟨10.1109/DTIS.2017.7930172⟩
Communication dans un congrès
lirmm-01718579v1
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Improving the Functional Test Delay Fault Coverage: A Microprocessor Case StudyISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.731-736, ⟨10.1109/ISVLSI.2016.42⟩
Communication dans un congrès
lirmm-01446917v1
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An effective approach for functional test programs compactionDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2016, Kosice, Slovakia. ⟨10.1109/DDECS.2016.7482466⟩
Communication dans un congrès
lirmm-01457396v1
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