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Patrick Girard

3
Documents
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1161846
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Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications

Aibin Yan , Jing Xiang , Zhengfeng Huang , Tianming Ni , Jie Cui
ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan
Communication dans un congrès lirmm-04241173v1
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Two 0.8 V, Highly Reliable RHBD 10T and 12T SRAM Cells for Aerospace Applications

Aibin Yan , Zhihui He , Jing Xiang , Jie Cui , Yong Zhou
GLVLSI 2022 - 32nd ACM Great Lakes Symposium on VLSI, Jun 2022, Irvine, CA, United States. pp.261-266, ⟨10.1145/3526241.3530312⟩
Communication dans un congrès lirmm-03770855v1