Patrick Girard

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1113530

"oconnor-ian"

	Emerging Computing Devices: Challenges and Opportunities for Test and Reliability Alberto Bosio , Ian O'Connor , Marcello Traiola , Jorge Echavarria , Jürgen Teich ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-10, ⟨10.1109/ETS50041.2021.9465409⟩ Communication dans un congrès lirmm-03379074v1