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Patrick Girard
5
Documents
Identifiants chercheurs
- patrick-girard-lirmm
- 0000-0003-0722-8772
Présentation
Publications
- 3
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- 3
- 1
- 1
- 1
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Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image SensorsITC 2023 - IEEE International Test Conference, Oct 2023, Anaheim, United States
Communication dans un congrès
lirmm-04240449v1
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Configuring a Universal BIST Solution for CMOS Image Sensors16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
Communication dans un congrès
lirmm-03988569v1
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A Generic Fast and Low Cost BIST Solution for CMOS Image SensorsETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-2, ⟨10.1109/ETS54262.2022.9810458⟩
Communication dans un congrès
lirmm-03770756v1
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A Novel BIST Engine for CMOS Image Sensors15e Colloque National du GDR SoC², Jun 2021, Rennes, France
Communication dans un congrès
lirmm-03987828v1
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A Fast and Low Cost Embedded Test Solution for CMOS Image SensorsITC 2021 - IEEE International Test Conference, Oct 2021, Online, United States. pp.1-9, ⟨10.1109/ITC50571.2021.00007⟩
Communication dans un congrès
lirmm-03377562v1
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