Documentation
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Patrick Girard

9

Documents

Identifiants chercheurs

patrick-girard-lirmm
0000-0003-0722-8772

Présentation

Publications

1113381

"arnaud-virazel"

	A comprehensive framework for cell-aware diagnosis of customer returns Pierre D’hondt , Safa Mhamdi , Patrick Girard , Arnaud Virazel , Aymen Ladhar Microelectronics Reliability, 2022, 135, pp.114595. ⟨10.1016/j.microrel.2022.114595⟩ Article dans une revue lirmm-03768999v1

	On Using Cell-Aware Methodology for SRAM Bit Cell Testing Xhesila Xhafa , Aymen Ladhar , Eric Faehn , Lorena Anghel , Gregory Di Pendina ETS 2023 - 28th IEEE European Test Symposium, May 2023, Venezia, Italy. pp.1-4, ⟨10.1109/ETS56758.2023.10174118⟩ Communication dans un congrès hal-04164704v1
	On Using Cell-Aware Models for Representing SRAM Architecture Xhesila Xhafa , Aymen Ladhar , Eric Faehn , Lorena Anghel , Gregory Di Pendina 16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France Communication dans un congrès lirmm-03987914v1
	A Comprehensive Learning-Based Flow for Cell-Aware Model Generation Pierre D’hondt , Aymen Ladhar , Patrick Girard , Arnaud Virazel ITC 2022 - IEEE International Test Conference, Sep 2022, Anaheim, United States. pp.484-488, ⟨10.1109/ITC50671.2022.00057⟩ Communication dans un congrès lirmm-03770147v1
	Accelerating Cell-Aware Model Generation Through Machine Learning Pierre D’hondt , Aymen Ladhar , Patrick Girard , Arnaud Virazel 15e Colloque National du GDR SoC², Jun 2021, Rennes, France Communication dans un congrès lirmm-03987805v1
	A Learning-Based Methodology for Accelerating Cell-Aware Model Generation Pierre D’hondt , Aymen Ladhar , Patrick Girard , Arnaud Virazel DATE 2021 - 24th Design, Automation and Test in Europe Conference and Exhibition, Feb 2021, Grenoble, France. pp.1580-1585, ⟨10.23919/DATE51398.2021.9474227⟩ Communication dans un congrès lirmm-03377383v1
	Cell-Aware Diagnosis of Customer Returns Using Bayesian Inference Safa Mhamdi , Patrick Girard , Arnaud Virazel , Alberto Bosio , Aymen Ladhar ISQED 2021 - 22nd International Symposium on Quality Electronic Design, Apr 2021, Santa Clara (virtual), United States. pp.48-53, ⟨10.1109/ISQED51717.2021.9424337⟩ Communication dans un congrès hal-03266815v1

	Cell-Aware Model Generation Using Machine Learning Pierre D’hondt , Aymen Ladhar , Patrick Girard , Arnaud Virazel Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.227-257, 2023, 978-3-031-16344-9. ⟨10.1007/978-3-031-16344-9_6⟩ Chapitre d'ouvrage lirmm-03986553v1
	Defect Diagnosis Techniques for Silicon Customer Returns Patrick Girard , Alberto Bosio , Aymen Ladhar , Arnaud Virazel Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023, 978-3-031-16344-9. ⟨10.1007/978-3-031-16344-9_17⟩ Chapitre d'ouvrage lirmm-03986615v1