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Patrick Girard

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A comprehensive framework for cell-aware diagnosis of customer returns

 Pierre D’hondt , Safa Mhamdi , Patrick Girard , Arnaud Virazel , Aymen Ladhar
Microelectronics Reliability, 2022, 135, pp.114595. ⟨10.1016/j.microrel.2022.114595⟩
Article dans une revue lirmm-03768999v1
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Cell-Aware Diagnosis of Customer Returns Using Bayesian Inference

 Safa Mhamdi , Patrick Girard , Arnaud Virazel , Alberto Bosio , Aymen Ladhar
ISQED 2021 - 22nd International Symposium on Quality Electronic Design, Apr 2021, Santa Clara (virtual), United States. pp.48-53, ⟨10.1109/ISQED51717.2021.9424337⟩
Communication dans un congrès hal-03266815v1
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Defect Diagnosis Techniques for Silicon Customer Returns

 Patrick Girard , Alberto Bosio , Aymen Ladhar , Arnaud Virazel
Frontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023, 978-3-031-16344-9. ⟨10.1007/978-3-031-16344-9_17⟩
Chapitre d'ouvrage lirmm-03986615v1