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Patrick Girard
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Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace ApplicationsJournal of Electronic Testing: : Theory and Applications, 2021, 37, pp.489-502. ⟨10.1007/s10836-021-05962-0⟩
Article dans une revue
lirmm-03377194v1
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