Documentation
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Patrick Girard

7

Documents

Identifiants chercheurs

patrick-girard-lirmm
0000-0003-0722-8772

Présentation

Publications

1083541

	A comprehensive framework for cell-aware diagnosis of customer returns Pierre D’hondt , Safa Mhamdi , Patrick Girard , Arnaud Virazel , Aymen Ladhar Microelectronics Reliability, 2022, 135, pp.114595. ⟨10.1016/j.microrel.2022.114595⟩ Article dans une revue lirmm-03768999v1
	Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning Safa Mhamdi , Patrick Girard , Arnaud Virazel , Alberto Bosio , Eric Faehn IEEE Transactions on Device and Materials Reliability, 2020, 20 (2), pp.329-340. ⟨10.1109/TDMR.2020.2992482⟩ Article dans une revue lirmm-03031823v1

	Cell-Aware Diagnosis of Customer Returns Using Bayesian Inference Safa Mhamdi , Patrick Girard , Arnaud Virazel , Alberto Bosio , Aymen Ladhar ISQED 2021 - 22nd International Symposium on Quality Electronic Design, Apr 2021, Santa Clara (virtual), United States. pp.48-53, ⟨10.1109/ISQED51717.2021.9424337⟩ Communication dans un congrès hal-03266815v1
	A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns Safa Mhamdi , Patrick Girard , Arnaud Virazel , Alberto Bosio , Aymen Ladhar ITC 2020 - IEEE International Test Conference, Nov 2020, Washington DC, United States. pp.1-10, ⟨10.1109/ITC44778.2020.9325246⟩ Communication dans un congrès lirmm-03034264v1
	Learning-Based Cell-Aware Defect Diagnosis of Customer Returns Safa Mhamdi , Patrick Girard , Arnaud Virazel , Alberto Bosio , Aymen Ladhar ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-2, ⟨10.1109/ETS48528.2020.9131601⟩ Communication dans un congrès lirmm-03035669v1
	Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip Safa Mhamdi , Arnaud Virazel , Patrick Girard , Alberto Bosio , Etienne Auvray IOLTS 2019 - 25th International Symposium on On-Line Testing And Robust System Design, Jul 2019, Rhodes, Greece. pp.21-26, ⟨10.1109/IOLTS.2019.8854388⟩ Communication dans un congrès lirmm-02395493v1
	Cell-Aware Diagnosis of Automotive Customer Returns Based on Supervised Learning Safa Mhamdi , Patrick Girard , Arnaud Virazel , Alberto Bosio , Aymen Ladhar ART 2019 - 4th IEEE Automotive Reliability and Test Workshop, Nov 2019, Washington, United States Communication dans un congrès lirmm-02395653v1