Documentation
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Anglais (EN)

Patrick Girard

22

Documents

Identifiants chercheurs

patrick-girard-lirmm
0000-0003-0722-8772

Présentation

Publications

1083522

	Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS Aibin Yan , Litao Wang , Jie Cui , Zhengfeng Huang , Tianming Ni IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2024, 32 (1), pp.116-127. ⟨10.1109/TVLSI.2023.3323562⟩ Article dans une revue lirmm-04239391v1
	Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments Aibin Yan , Zhixing Li , Jie Cui , Zhengfeng Huang , Tianming Ni IEEE Transactions on Aerospace and Electronic Systems, 2023, 59 (3), pp.2885-2897. ⟨10.1109/TAES.2022.3219372⟩ Article dans une revue lirmm-04236216v1
	Designs of BCD Adder Based on Excess-3 Code in Quantum-Dot Cellular Automata Aibin Yan , Runqi Liu , Jie Cui , Tianming Ni , Patrick Girard IEEE Transactions on Circuits and Systems II: Express Briefs, 2023, 70 (6), pp.2256-2260. ⟨10.1109/TCSII.2023.3237695⟩ Article dans une revue lirmm-04236366v1
	A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications Aibin Yan , Yuting He , Xiaoxiao Niu , Jie Cui , Tianming Ni IEEE Design & Test, 2023, 40 (4), pp.34-41. ⟨10.1109/MDAT.2023.3267747⟩ Article dans une revue lirmm-04236363v1
	LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments Aibin Yan , Zhixing Li , Jie Cui , Zhengfeng Huang , Tianming Ni IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023, 42 (6), pp.2069-2073. ⟨10.1109/TCAD.2022.3213212⟩ Article dans une revue lirmm-03770056v1
	Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications Aibin Yan , Aoran Cao , Zhengfeng Huang , Jie Cui , Tianming Ni IEEE Transactions on Emerging Topics in Computing, 2023, 11 (4), pp.1070-1081. ⟨10.1109/TETC.2023.3317070⟩ Article dans une revue lirmm-04239309v1
	Novel Quadruple-Node-Upset-Tolerant Latch Designs with Optimized Overhead for Reliable Computing in Harsh Radiation Environments Aibin Yan , Zhelong Xu , Xiangfeng Feng , Jie Cui , Zhili Chen IEEE Transactions on Emerging Topics in Computing, 2022, 10 (1), pp.404-413. ⟨10.1109/TETC.2020.3025584⟩ Article dans une revue lirmm-03031709v1
	Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications Aibin Yan , Jing Xiang , Aoran Cao , Zhihui He , Jie Cui IEEE Transactions on Device and Materials Reliability, 2022, 22 (2), pp.282-295. ⟨10.1109/TDMR.2022.3175324⟩ Article dans une revue lirmm-03769794v1
	Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications Aibin Yan , Zhihui He , Jun Zhou , Jie Cui , Tianming Ni Microelectronics Journal, 2021, 111, pp.#105034. ⟨10.1016/j.mejo.2021.105034⟩ Article dans une revue lirmm-03380265v1
	Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications Aibin Yan , Aoran Cao , Zhelong Xu , Jie Cui , Tianming Ni Journal of Electronic Testing: : Theory and Applications, 2021, 37, pp.489-502. ⟨10.1007/s10836-021-05962-0⟩ Article dans une revue lirmm-03377194v1
	Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets Aibin Yan , Yang Cheng , Yuanjie Hu , Jun Zhou , Tianming Ni IEEE Transactions on Circuits and Systems I: Regular Papers, 2020, 67 (12), pp.4684-4695. ⟨10.1109/TCSI.2020.3018328⟩ Article dans une revue lirmm-03031784v1
	Information Assurance through Redundant Design: A Novel TNU Error Resilient Latch for Harsh Radiation Environment Aibin Yan , Yuanjie Hu , Jie Cui , Zhili Chen , Zhengfeng Huang IEEE Transactions on Computers, 2020, 69 (6), pp.789-799. ⟨10.1109/TC.2020.2966200⟩ Article dans une revue lirmm-02395602v1

	A Low Overhead and Double-Node-Upset Self-Recoverable Latch Aibin Yan , Fan Xia , Tianming Ni , Jie Cui , Zhengfeng Huang ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan Communication dans un congrès lirmm-04241214v1
	A Low Area and Low Delay Latch Design with Complete Double-Node-Upset-Recovery for Aerospace Applications Aibin Yan , Shaojie Wei , Jinjun Zhang , Tianming Ni , Jie Song GLSVLSI 2023 - Proceedings of the Great Lakes Symposium on VLSI, Jun 2023, Knoxville, TN, United States. pp.167-171, ⟨10.1145/3583781.3590281⟩ Communication dans un congrès lirmm-04241408v1
	Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications Aibin Yan , Jing Xiang , Zhengfeng Huang , Tianming Ni , Jie Cui ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan Communication dans un congrès lirmm-04241173v1
	MCTHSL: 4×4-Device-Matrix-Based Cost-Optimized TNU-Recovery HIS-Insensitive and SET-Filterable Latch for Aerospace Applications Aibin Yan , Zhuoyuan Lin , Jie Cui , Zhengfeng Huang , Tianming Ni DAC 2023 - ACM/EDAA Design Automation Conference, Jul 2023, San Francisco, United States Communication dans un congrès lirmm-04240386v1
	Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS Aibin Yan , Shukai Song , Jixiang Zhang , Jie Cui , Zhengfeng Huang ITC-Asia 2022 - IEEE International Test Conference in Asian, Aug 2022, Taipei, Taiwan. pp.73-78, ⟨10.1109/ITCAsia55616.2022.00023⟩ Communication dans un congrès lirmm-03770182v1
	SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments Aibin Yan , Zhixing Li , Shiwei Huang , Zijie Zhai , Xiangyu Cheng DATE 2022 - 25th Design, Automation and Test in Europe Conference and Exhibition, Mar 2022, Virtual, France. pp.1257-1262, ⟨10.23919/DATE54114.2022.9774665⟩ Communication dans un congrès lirmm-03769070v1
	A Highly Robust, Low Delay and DNU-Recovery Latch Design for Nanoscale CMOS Technology Aibin Yan , Zhen Zhou , Shaojie Wei , Jie Cui , Yong Zhou GLVLSI 2022 - 32nd ACM Great Lakes Symposium on VLSI, Jun 2022, Irvine, CA, United States. pp.255-260, ⟨10.1145/3526241.3530321⟩ Communication dans un congrès lirmm-03770815v1
	A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments Aibin Yan , Aoran Cao , Zhengzheng Fan , Zhelong Xu , Tianming Ni GLVLSI 2021 - 31st ACM Great Lakes Symposium on VLSI, Jun 2021, Virtual, United States. pp.301-306, ⟨10.1145/3453688.3461493⟩ Communication dans un congrès lirmm-03380011v1
	Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors Zhengda Dou , Aibin Yan , Jun Zhou , Yuanjie Hu , Yan Chen ITC-Asia 2020 - 4th International Test Conference in Asia, Sep 2020, Taipei, Taiwan. pp.35-40, ⟨10.1109/ITC-Asia51099.2020.00018⟩ Communication dans un congrès lirmm-03033821v1
	A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets Aibin Yan , Yan Chen , Jun Zhou , Tianming Ni , Xiaoqing Wen ATS 2020 - 28th IEEE Asian Test Symposium, Nov 2020, Penang, Malaysia. pp.1-5, ⟨10.1109/ATS49688.2020.9301569⟩ Communication dans un congrès lirmm-03035825v1