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Patrick Girard
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- 0000-0003-0722-8772
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Novel Quadruple-Node-Upset-Tolerant Latch Designs with Optimized Overhead for Reliable Computing in Harsh Radiation EnvironmentsIEEE Transactions on Emerging Topics in Computing, 2022, 10 (1), pp.404-413. ⟨10.1109/TETC.2020.3025584⟩
Article dans une revue
lirmm-03031709v1
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HITTSFL: Design of a Cost-Effective HIS-Insensitive TNU-Tolerant and SET-Filterable Latch for Safety-Critical ApplicationsDAC 2020 - 57th ACM/IEEE Design Automation Conference, Jul 2020, San Francisco, CA, United States. pp.1-6, ⟨10.1109/DAC18072.2020.9218704⟩
Communication dans un congrès
lirmm-03033258v1
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