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Patrick Girard
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Documents
Identifiants chercheurs
- patrick-girard-lirmm
- 0000-0003-0722-8772
Présentation
Publications
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Test Application Time Reduction with a Dynamically Reconfigurable Scan Tree Architecture8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Apr 2005, Sopron, Hungary. pp.19-26
Communication dans un congrès
lirmm-00105987v1
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