- 17
- 5
- 1
Patrick Girard
23
Documents
Identifiants chercheurs
- patrick-girard-lirmm
- 0000-0003-0722-8772
Présentation
Publications
- 5
- 5
- 5
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 23
- 18
- 18
- 17
- 17
- 14
- 9
- 9
- 7
- 5
- 5
- 4
- 3
- 3
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 17
- 6
- 1
- 2
- 1
- 2
- 1
- 2
- 2
- 1
- 2
- 2
- 3
- 2
- 2
- 1
|
Analysis of resistive defects on a foundry 8T SRAM-based IMC architectureMicroelectronics Reliability, 2023, 147, pp.115029. ⟨10.1016/j.microrel.2023.115029⟩
Article dans une revue
hal-04129470v1
|
|
Intra-cell Resistive-Open Defect Analysis on a Foundry 8T SRAM-based IMC ArchitectureETS 2023 - 28th IEEE European Test Symposium, May 2023, Venise, Italy. ⟨10.1109/ETS56758.2023.10174107⟩
Communication dans un congrès
hal-04164663v1
|
|
Analysis of Read Port Short Defects in an 8T SRAM-based IMC Architecture16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
Communication dans un congrès
lirmm-03990078v1
|
|
Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing ArchitecturesDTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505101⟩
Communication dans un congrès
lirmm-03377433v1
|
|
Preliminary Defect Analysis of 8T SRAM Cells Used for In-Memory Computing15e Colloque National du GDR SoC², Jun 2021, Rennes, France
Communication dans un congrès
lirmm-03994467v1
|
|
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICsIOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩
Communication dans un congrès
lirmm-02993384v1
|
Test de Circuits et de Systèmes IntégrésCollection EGEM, Ed.Hermès, 2004, 2-7462-0864-4
Ouvrages
lirmm-00109158v1
|