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Patrick Girard
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patrick-girard-lirmm-
0000-0003-0722-8772
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Analyzing resistive-open defects in SRAM core-cell under the effect of process variabilityETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569373⟩
Communication dans un congrès
lirmm-01921630v1
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