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	SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations Georgios Tsiligiannis , Elena Ioana Vatajelu , Luigi Dilillo , Alberto Bosio , Patrick Girard IOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩ Communication dans un congrès lirmm-00818955v1
	On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell Elena Ioana Vatajelu , Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩ Communication dans un congrès lirmm-01238413v1

Patrick Girard